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GB/T 32872-2016: Screening specifications for illumination LEDs in space sciences
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 32872-2016 | English | 219 |
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Screening specifications for illumination LEDs in space sciences
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GB/T 32872-2016
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Basic data | Standard ID | GB/T 32872-2016 (GB/T32872-2016) | | Description (Translated English) | Screening specifications for illumination LEDs in space sciences | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L53 | | Classification of International Standard | 31.080 | | Word Count Estimation | 11,155 | | Date of Issue | 2016-08-29 | | Date of Implementation | 2016-11-01 | | Regulation (derived from) | National Standard Announcement 2016 No.14 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | GB/T 32872-2016: Screening specifications for illumination LEDs in space sciences---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Screening specifications for ink LEDs in space sciences
ICS 31.080
L53
National Standards of People's Republic of China
Specification for LED screening for space science lighting
2016-08-29 released
2016-11-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Management Committee released
Directory
Preface I
1 Scope 1
2 normative reference document 1
General 1
4 Screening items and procedures 1
5 screening method 2
5.1 appearance inspection 2
5.2 Parameter measurement 2
5.3 constant acceleration 2
5.4 Particle collision noise detection 2
5.5 Sealability check 3
5.6 high temperature storage 3
5.7 Temperature impact 3
5.8 low temperature start 3
5.9 Temperature cycle 4
5.10 old refining 4
5.11 Final test 4
6 Parameter measurement and conformity judgment 4
6.1 Measurement conditions 4
6.2 Test parameters 5
6.3 Test Method 5
6.4 Qualified judgment 6
Appendix A (informative appendix) statistics for LED sciences for space science lighting
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
This standard is under the jurisdiction of the National Committee on Standardization of Space Science and Its Application (SAC/TC312).
The drafting of this standard. Shanghai Institute of Technical Physics, Chinese Academy of Sciences.
The main drafters of this standard. Zhang Tao, Zhang Meimin, Liu Shishen, Gu Jianzhong, Yuan Shidong, Wang Chenfei.
Specification for LED screening for space science lighting
1 Scope
This standard specifies the space science lighting LED (LightEmittingDiode) screening projects and procedures, screening methods, parameter measurement
And qualified to determine.
This standard applies to space science lighting with a rated power of 1W and 1W above the package of single-core LED screening, other power levels
The LED can also refer to the implementation.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
Test methods for LED modules for general lighting applications GB/T 24824-2009
Standard Test Method for Semiconductor Discrete Devices - GJB128A -.1997
Non - destructive physical analysis of military electronic components GJB4027
3 General
3.1 Screened devices should be based on product specifications or technical requirements of the parameters of the initial measurement, qualified devices can participate in screening. Screening according to regulations
Of the items and procedures to complete each item after the removal of substandard products.
3.2 The filtered devices shall be numbered consecutively and the test data shall be recorded at each test. After screening, you should write a filter table, format parameters
See Appendix A, Device Parameter Test Data can be used as an attachment to the screening report.
3.3 If the test is abnormal, the time of occurrence of the exception and the device number should be recorded.
3.4 When the screening rejection rate exceeds 20%, the batch should be rejected. When the function fails, should be in accordance with the GJB4027 failure points
Analysis, such as non-accidental failure of material or process factors shall be subject to batch failure.
4 Screening items and procedures
Screening according to the items and procedures specified in Table 1, after the completion of each project, remove the substandard products.
Table 1 Screening items and procedures
Filtering item filtering method
1 See Chapter 5.1 for visual inspection
2 Parameter measurement See 5.2
3 constant acceleration See 5.3
4 Particle Collision Noise Detection (PIND) See 5.4
5 See Chapter 5.5 for sealing performance
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