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GB/T 32643-2016 English PDF

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GB/T 32643-2016: Flat panel displays glass substrates surface waviness measurement method
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PDF similar to GB/T 32643-2016


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Basic data

Standard ID GB/T 32643-2016 (GB/T32643-2016)
Description (Translated English) Flat panel displays glass substrates surface waviness measurement method
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L90
Classification of International Standard 31.030
Word Count Estimation 6,667
Date of Issue 2016-04-25
Date of Implementation 2016-11-01
Quoted Standard GB/T 32642-2016
Regulation (derived from) National Standard Announcement No
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies a method of measuring the waviness of a glass surface of a flat panel display substrate using a stylus type surface roughness measuring apparatus. This standard is applicable to the measurement of the surface waviness of the substrate glass for a flat panel display.

GB/T 32643-2016: Flat panel displays glass substrates surface waviness measurement method

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Flat panel displays glass substrates furface waviness measurement method ICS 31-030 L90 National Standards of People's Republic of China Flat panel display substrate glass surface waviness Measurement methods 2016-04-25 released 2016-11-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents. This standard by the National Semiconductor Equipment and Materials Standardization Technical Committee (SAC/TC203) and the national industrial glass and special glass standard (SAC/TC447). The main drafting unit of this standard. Rainbow Group, China Electronic Technology Standardization Research Institute. The main drafters of this standard. Huang Ning song, Pei Huichuan, Wang Xiang, Li Shuang, Yang Wanlai. Flat panel display substrate glass surface waviness Measurement methods

1 Scope

This standard specifies the measurement method for measuring the waviness of the glass surface of a flat panel display substrate using a stylus surface roughness meter. This standard is suitable for measuring the surface waviness of substrate glass for flat panel displays.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. GB/T 32642-2016 flat panel display substrate glass surface roughness measurement method

3 terms and definitions

GB/T 32642-2016 The definitions and the following terms and definitions apply to this document. 3.1 2CR filter 2CRfilter Time constants equal to the two groups of RC circuit connected in series filter. The standard transfer rate at cut-off wavelength is 75%. 3.2 Gaussian filter The Gaussian distribution is used as the weight function, and the curve of the integral curve in the section curve is defined as the phase compensation filtering curve. The long transfer rate is 50%. 3.3 Pre-travel (and post-trip) pre-travel (andpost-travel) Lp In order to avoid distortion due to the transient response of the cutoff filter, the part of the section is subtracted from the tracer length. Note. It is recommended that the pre-stroke of the 2CR filter be 2 times the cut-off wavelength λL at the beginning of the tracer length and without the posterior stroke; When using the phase correction filter, both the pre-stroke and the rear stroke should be the same as the cut-off wavelength λL. 3.4 Measuring length evaluationlength Le A trace length after deduction of pre-stroke and post-itinerary. The length of the measurement sample shall include the length of the profile curve of the waviness. 3.5 Cut long wavelength longwavelengthcut-off λL Excluding natural factors, when the tracing contour curve is removed by the ripple factor of the high-pass wavelength filter, the amplitude decay rate becomes 75% of the wavelength.

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