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GB/T 32466-2015: Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated stress screen
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 32466-2015 | English | 279 |
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Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated stress screen
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GB/T 32466-2015
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Basic data | Standard ID | GB/T 32466-2015 (GB/T32466-2015) | | Description (Translated English) | Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated stress screen | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | K04 | | Classification of International Standard | 03.120.10 | | Word Count Estimation | 13,181 | | Date of Issue | 2015-12-31 | | Date of Implementation | 2016-07-01 | | Regulation (derived from) | State Standard Announcement 2015 No.43 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | GB/T 32466-2015: Accelerated stress testing procedures for electric and electronic products -- Guidance for highly accelerated stress screen
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Accelerated stress testing procedures for electric and electronic products - Guidance for highly accelerated stress screen
ICS 19.040
K04
National Standards of People's Republic of China
Code for Accelerated Stress Test of Electrical and Electronic Products
Guidelines for High Accelerated Stress Screening
2015-12-31 released
2016-07-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Management Committee released
Directory
Preface I
Introduction II
1 Scope 1
2 normative reference document 1
3 Terms and definitions 1
4 General requirements 2
5 Test plan 4
6 Test method 4
7 Related information should be given 5
8 Information to be given in the test report 6
Appendix A (informative) High acceleration stress screening process 7
Appendix B (informative) Screening Confirmation 8
Appendix C (informative) screening validation 9
Appendix D (informative) Determination of high and low temperature values 11
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
This standard is proposed by the National Standardization Technical Committee for Quality Assurance (SCA/TC374).
The drafting of this standard. Shenzhen Institute of Measurement and Quality Inspection, in the inspection Warner (Beijing) Quality Technology Center Co., Ltd.,
(Beijing) Quality Inspection Technology Research Institute Co., Ltd., Huawei Technologies Co., Ltd., Qin Da Technology Group Co., Ltd., Shenzhen You Bo-technology limited
the company.
The main drafters of this standard. Zhu Jianhua, Zhang Hua, Wang Jianjun, Feng Zhisheng, Li Lin, Zhao Haoru, Luo Yuan, Li Xiaoqian, Zhang Canwen, Ding Yong,
Chen Xiangu, Liu Yongzhi, Shu Wang.
Introduction
Highly accelerated stress screening, can quickly find the early defects in the product, remove the early defective products.
High acceleration stress screening using the integrated stress on the product to test, test the high and low temperature temperature, vibration level and other parameters to determine,
Reference to the model of the product's high and low temperature limit, the vibration of the limits of the corresponding calculation and adjustment. GB/T 29309-2012 "Electrician
Electronic product accelerated stress test procedures High accelerated life test guidelines "provides for how to determine the product of high and low temperature limit, vibration work
limit. This standard should be used in conjunction with GB/T 29309-2012.
The test method specified in this standard is used for full screening of the products on the production line.
Code for Accelerated Stress Test of Electrical and Electronic Products
Guidelines for High Accelerated Stress Screening
1 Scope
This standard specifies the general requirements and test methods for high acceleration stress screening.
This standard applies to electrical and electronic products and their electronic components, printed circuit board components. For large machines, should give priority to its front
End of the assembly level (such as printed circuit board components, submodules) to test.
This standard applies to the trial production stage or mass production stage of the product.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
GB/T 2421.1-2008 Environmental test overview and guidance for electrical and electronic products (IEC 60068-1. 1988, IDT)
GB/T 2423.22-2012 Environmental tests - Part 2. Test methods - Test N. Temperature change (IEC 60068-2-14.
1984, IDT)
GB/T 2423.56-2006 Environmental testing for electric and electronic products - Part 2. Test methods - Test Fh. Broadband random vibration (number
Word control) and guidelines (IEC 60068-2-64..1993, IDT)
GB/T 2424.5-2006 Environmental testing of electrical and electronic products - Performance verification of temperature chamber (IEC 60068-3-5..2001, IDT)
GB/T 29309-2012 Accelerated stress test for electrical and electronic products - Guidelines for high accelerated life test
3 terms and definitions
The following terms and definitions apply to this document.
3.1
High Accelerated Life Test highlyacceleratedlifetest; HALT
By increasing the test stress (such as temperature, vibration, rapid temperature change and vibration comprehensive stress, etc.) applied to the test sample,
Test of the stress tolerance of the product.
[GB/T 29309-2012, definition 3.1]
3.2
High Accelerated Stress Screening highlyacceleratedstressscreen; HASS
Determine the test procedure and apply to the product with an accelerated stress based on the working limits and failure limits determined by the high accelerated life test
test.
Note. The purpose of high acceleration stress screening is to effectively monitor the consistency of the product process, remove defective products, reduce product repair rate.
3.3
Square root acceleration Grms
The square root of the integral of the acceleration spectrum density function Sx (f) in a given frequency range. (1) said.
Grms = ∫
f2
f1
Sx (f) df (1)
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