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GB/T 32262-2015: Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
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Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
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GB/T 32262-2015
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Basic data | Standard ID | GB/T 32262-2015 (GB/T32262-2015) | | Description (Translated English) | Preparation of deoxyribonucleic acid sample for atomic force microscope measurement | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | A40 | | Classification of International Standard | 07.030 | | Word Count Estimation | 11,125 | | Date of Issue | 2015-12-10 | | Date of Implementation | 2017-01-01 | | Regulation (derived from) | National Standard Announcement 2015 No.38 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | GB/T 32262-2015: Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
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Preparation of deoxyribonucleic acid sample for atomic force microscope measurement
ICS 07.030
A40
National Standards of People's Republic of China
The atomic force microscope is used to detect DNA
Preparation of samples
Issued on. 2015-12-10
2017-01-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Table of Contents
Preface Ⅰ
Introduction Ⅱ
1 Scope 1
2 Normative references 1
3 Terms and definitions, abbreviations 1
3.1 Terms and definitions
3.2 Abbreviations 1
4 Summary of Method 1
5 experimental materials and equipment 2
2 6 environmental conditions
7 DNA sample preparation procedures 2
7.1 Modified mica substrate 2
2 7.2 DNA solution was treated
7.3 DNA immobilized on the substrate 2
Save 7.4 DNA samples 3
Detection and Evaluation 8 DNA samples 3
8.1 Detection 3
8.2 Evaluation 3
Detection Annex A (informative) sample of Example 4
A.1 atomic force microscopy (AFM) 4
A.2 Environmental Requirements 4
A.3 AFM probes 4
AFM A.4 typical DNA samples detected 4
Reference 7
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
This standard was proposed by the Chinese Academy of Sciences.
This standard by the National Standardization Technical Committee of nano technology (SAC/TC279) centralized.
Drafting of this standard. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai Jiaotong University, nano-technology and application National Engineering
Research center.
The main drafters of this standard. Huang Yibo, Hu Jun, Zhang Yi, Sun Jielin, Li Bin, Li Min dry, Dannong.
Introduction
Deoxyribonucleic acid (DNA) is the genetic material is important, and atomic force microscopy (AFM) is the weight of the high-resolution detection and analysis of DNA
To tool. DNA molecules are chain-like structure whose diameter of approximately 2nm. Because between the DNA molecule itself and adhesion molecules easily and Mission
Poly, under normal circumstances, DNA molecules for AFM experiments need to diversify fixed on a flat substrate and between the DNA molecule and the substrate
You need to have a good combination of cleaning liquid can withstand erosion and impact. Therefore, the standard method of DNA sample preparation, in order to facilitate
AFM observation and analysis. This provides a standard for AFM detection and analysis of DNA sample preparation method.
When issuing authority of the document drew attention to the statement of compliance with this document may involve modification of the mica substrate [7.1] with the specific content
Patent No. [manufacturing method for DNA manipulation mica substrate] ZL00116715.4 content related to the use of patents.
The issuing authority for the patent document authenticity, validity and scope without any position.
The patent holder has to ensure that the issuing authority of the document, he was willing to reasonable and non-discriminatory terms and conditions with any applicant,
Patent licensing negotiations. The patent holder's statement has been filed in the release mechanism of the present document. Related information is available through the following
Contact at.
Patent Holder Name. Hu Jun, Huang Yibo, Zhang Yi, Ouyang Zhen dry, dry Li Min
Address. Jiading District of Shanghai Jia Luo Road 2019
Please note that in addition to the above patents, some of the contents of this document may still involve patents. The issuing authority of this document does not undertake to recognize these special
Lee responsibility.
The atomic force microscope is used to detect DNA
Preparation of samples
1 Scope
This standard specifies a method for preparing for AFM detection and analysis of DNA samples, including. Summary of methods, experimental materials and devices
Wood preservation, environmental conditions, modified mica substrate, a solution of DNA processing, fixed on the substrate DNA, DNA samples, DNA samples
The evaluation.
This standard applies to the preparation of a single DNA molecule by AFM high resolution imaging and nano-manipulation experiments in atomic adsorption stage
Various DNA samples on flat mica substrate, and to study the physical and chemical properties and biological functions. Similar to the molecular structure of DNA
Fixed biological material can also refer to this standard.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
Laboratory use specifications and test methods GB/T 6682-2008 Analysis
3 Terms and definitions, abbreviations
The following terms and definitions, abbreviations apply to this document.
3.1 Terms and Definitions
3.1.1
Atomically flat atomicalyflat
Are micro-level atomic structure, surface flatness reach the atomic level.
3.2 Acronyms
AFM. atomic force microscope (AtomicForceMicroscope)
DNA. deoxyribonucleic acid (DeoxyribonucleicAcid)
TE. Tris - disodium edetate (TRIS-Ethylenediaminetetraaceticacid, disodiumSalt)
APTES. (3- aminopropyl) - triethoxysilane siloxane [(3-aminopropyl) triethoxysilane]
4. Summary
4.1 According to AFM works. During sample observation should be first to be detected substance is placed in a substrate surface.
4.2 As the DNA molecule is very small, it is required to be placed on the atomically flat and there is no contamination of the substrate.
4.3 Standard utilization characteristics of DNA molecules in an aqueous solution with negatively charged surfaces of new mica substrate cleavage may be modified to bring it
Positively charged, so that the DNA interaction firmly attached to the surface of the substrate by electrostatic mica, to be suitable for subsequent detection of AFM
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