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GB/T 30859-2014 English PDF

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GB/T 30859-2014: Test method for warp and waviness of silicon wafers for solar cells
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GB/T 30859-2014English299 Add to Cart 3 days [Need to translate] Test method for warp and waviness of silicon wafers for solar cells Valid GB/T 30859-2014

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Basic data

Standard ID GB/T 30859-2014 (GB/T30859-2014)
Description (Translated English) Test method for warp and waviness of silicon wafers for solar cells
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard H21
Classification of International Standard 77.040
Word Count Estimation 13,171
Date of Issue 7/24/2014
Date of Implementation 4/1/2015
Quoted Standard GB/T 3505-2009; GB/T 6620; GB/T 14264; GB/T 16747-2009; GB/T 18777; GB/Z 26958.1; GB/Z 26958.20; GB/Z 26958.22; GB/Z 26958.29; GB/Z 26958.31; GB/Z 26958.32; GB/Z 26958.40; GB/Z 26958.41; GB/Z 26958.49
Regulation (derived from) National Standards Bulletin No. 19, 2014
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies a solar cell wafers (hereinafter referred to as wafers) Test Method warpage and waviness. This standard applies to the test wafer warpage and waviness.

GB/T 30859-2014: Test method for warp and waviness of silicon wafers for solar cells

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Test method for warp and waviness of silicon wafers for solar cells ICS 77.040 H21 National Standards of People's Republic of China Solar wafers and warpage Waviness testing methods Issued on. 2014-07-24 2015-04-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. The standard equipment by the National Standardization Technical Committee and the semiconductor material (SAC/TC203) and materials Technical Committee (SAC/TC 203/SC2) jointly proposed and managed. This standard was drafted. Jiangsu GCL Silicon Technology Development Co., Semi Leber Trading (Shanghai) Co., Ltd., has a semiconductor research Material Co., Ltd. The main drafters of this standard. Xue against the United States, Xiagen Ping, Sun Yan, Lin fragrance, Xuzi Liang, Huang Li. Solar wafers and warpage Waviness testing methods

1 Scope

This standard specifies a solar cell wafers (hereinafter referred to as wafers) Test Method warpage and waviness. This standard applies to the test wafer warpage and waviness.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 3505-2009 Geometrical product specifications (GPS) Surface texture Profile method - Terms, definitions and surface texture parameters GB/T 6620 wafer warpage non-contact test method GB/T 14264 semiconductor material terms GB/T 16747-2009 Geometrical product specifications (GPS) Surface texture Profile method surface waviness vocabulary GB/T 18777 Geometrical product specifications (GPS) Surface texture Profile method - Metrological characteristics of phase correct filters GB/Z26958 (all parts) Geometrical product specifications (GPS) filter

3 Terms and Definitions

GB/T 3505-2009, terminology and GB/T 14264, GB/T 16747-2009, GB/T 18777 and GB/Z26958 defined Definitions apply to this document. For ease of use, repeat the following list of GB/T 3505-2009 and GB/T 16747-2009 of a These terms and definitions. 3.1 Contour filter profilefilter The outline is divided into short-wave and long-wave filter components. There are three filtering in measuring roughness, waviness and primary profile of the instrument , See Figure 1. They all have the same transmission characteristics GB/T 18777 stipulated, but different cutoff wavelengths. [GB/T 3505-2009, the definition 3.1.1] 3.2 λs contour filter λsprofilefilter Intersects the boundaries between the filter and the roughness of the waves shorter than its components determined to exist on the surface, shown in Figure 1. [GB/T 3505-2009, the definition 3.1.1.1] 3.3 λc contour filter λcprofilefilter Determine the boundaries of the intersection between roughness and waviness components of the filter shown in Figure 1. [GB/T 3505-2009, the definition 3.1.1.2] 3.4 λf contour filter λfprofilefilter Determining the presence of the filter intersects the boundaries between the waviness on the surface of the component than its longer waves, shown in Figure 1.

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