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GB/T 25186-2010 English PDF

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GB/T 25186-2010: Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
Status: Valid
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GB/T 25186-2010English134 Add to Cart 3 days [Need to translate] Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials Valid GB/T 25186-2010

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Basic data

Standard ID GB/T 25186-2010 (GB/T25186-2010)
Description (Translated English) Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard G04
Classification of International Standard 71.040.40
Word Count Estimation 7,725
Date of Issue 2010-09-26
Date of Implementation 2011-08-01
Quoted Standard GB/T 22461-2008
Adopted Standard ISO 18114-2003, IDT
Regulation (derived from) National Standard Approval Announcement 2010 No.6 (Total No.161)
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies a reference material injected is determined by the ion secondary ion mass spectrometry relative sensitivity factor approach. This standard applies to the chemical composition of the substrate single sample, which injected substance peak atomic concentration does not exceed 1%.

GB/T 25186-2010: Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials ICS 71.040.40 G04 National Standards of People's Republic of China Surface chemical analysis - Secondary ion mass spectrometry Reference material is determined by the ion implantation Relative sensitivity factor (ISO 18114.2003, IDT) Issued on. 2010-09-26 2011-08-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard is identical with ISO 18114.2003 "Surface chemical analysis - Secondary ion mass from the ion implantation to determine the relative reference materials Sensitivity factors. " For ease of use, this standard made the following editorial changes. --- Use the "standard" instead of "this International Standard." This standard by the National Standardization Technical Committee microbeam analysis and focal points. This standard was drafted. Ministry of Information Industry materials for Quality Supervision and Inspection Center. The main drafters of this standard. Manong agriculture, Heyou Qin, He Xiukun.

Introduction

In secondary ion mass spectrometry, often using ion implantation substances calibrate the instrument. This standard will provide a unified approach. to determine the relative sensitivity of an element in a specific matrix reference materials by ion implantation Factor, and explains how to determine the concentration of different samples with the same base material of the element. Surface chemical analysis - Secondary ion mass spectrometry Reference material is determined by the ion implantation Relative sensitivity factor

1 Scope

This standard specifies a reference substance injected by the ion secondary ion mass spectrometry to determine the relative sensitivity factor method. This standard applies to the chemical composition of the matrix of a single sample, wherein the injection substance peak atomic concentration does not exceed 1%.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 22461-2008 Surface chemical analysis - Vocabulary (ISO 18115.2001, IDT)

3 Terms and Definitions

Terms and definitions GB/T 22461-2008 defined apply to this document.

4 Symbols and Abbreviations

CiA, when M-depth analysis of the i-th cycle, the concentration of the analyte element A atoms in the matrix M, with the number of atoms per unit volume Representation; d depth analysis of integrating with the depth, expressed in units of length; IiAj at the i th cycle test, Aj isotopes detected analyte ion count rate in counts/s representation; IiMk when i first test cycle, the reference isotope Mk detection count rate in counts/s representation; IBG Aj analyte ion average background count rate, with the count/s representation; NAj unknown samples are analyzed isotopic abundances of Aj; N the number of cycles by integrating in-depth analysis of the depth included; Implantation dose φ Aj isotope, expressed by the area number of atomic units; RSF relative sensitivity factor, expressed in number of atoms per unit volume; SIMS secondary ion mass spectrometry. Principle 5 Foreign substance can be injected from a standard ion SIMS depth profiling, and draw specific elements - matrix composition in a relative isotope Sensitivity factor (RSF). The RSF can be used to quantitatively give the same matrix materials in different samples of the same concentration of specific elements with depth Changes in the following formula. CiA, M = RSF Aj, Mk × IiAj IiMk × NAj (1)

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