|
US$379.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 20130-2025: Self-shielding electron beam facility for radiation processing
Status: Valid GB/T 20130: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 20130-2025 | English | 379 |
Add to Cart
|
4 days [Need to translate]
|
Self-shielding electron beam facility for radiation processing
| Valid |
GB/T 20130-2025
|
| GB/T 20130-2006 | English | 419 |
Add to Cart
|
3 days [Need to translate]
|
Self-shielding electron beam sterilizing facility
| Valid |
GB/T 20130-2006
|
PDF similar to GB/T 20130-2025
Standard similar to GB/T 20130-2025 GB 15213 GB/T 41985 GB/T 34127 Basic data | Standard ID | GB/T 20130-2025 (GB/T20130-2025) | | Description (Translated English) | Self-shielding electron beam facility for radiation processing | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | F92 | | Classification of International Standard | 27.120.99 | | Word Count Estimation | 18,158 | | Date of Issue | 2025-04-25 | | Date of Implementation | 2025-11-01 | | Older Standard (superseded by this standard) | GB/T 20130-2006 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 20130-2025: Self-shielding electron beam facility for radiation processing---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 27.120.99
CCSF92
National Standard of the People's Republic of China
Replaces GB/T 20130-2006
Self-shielded electron beam radiation processing device
Released on 2025-04-25
2025-11-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of contents
Preface III
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Device composition and working conditions 2
5 Technical Requirements 3
6 Test methods 5
7 Inspection Rules 9
8 Marking, packaging, transportation, accompanying documents and storage 10
Reference 12
Figure 1 Schematic diagram of reference point and reference surface 2
Figure 2 Schematic diagram of Faraday cup measurement 6
Figure 3 Schematic diagram of direct average current measurement method 7
Figure 4 Schematic diagram of dosimeter method for measuring scanning non-uniformity 8
Table 1 Test conditions 5
Table 2 Inspection items for self-shielded electron beam radiation processing equipment 9
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
This document replaces GB/T 20130-2006 "Self-shielded electron beam disinfection and sterilization device". Compared with GB/T 20130-2006,
In addition to structural adjustments and editorial changes, the main technical changes are as follows.
a) The scope of application of the standard has been changed (see Chapter 1, Chapter 1 of the.2006 edition);
b) Added the terms and definitions of “radiation processing” and “electron beam radiation processing device” (see 3.2 and 3.3);
c) Changed the terms and definitions of "reference plane", "beam intensity", "beam power", "beam scanning non-uniformity" and "beam scanning width"
(See 3.4, 3.6, 3.7, 3.8, 3.9, 3.2, 3.4, 3.5, 3.8, 3.7 of the.2006 edition);
d) The term and definition of “energy instability” have been deleted (see 3.6 of the.2006 edition);
e) Changed "beam device", "monitoring and control system" and "shielding system" (see 4.1.1, 4.1 of the.2006 edition);
f) Deleted "Device model name" (see 4.2 of the.2006 edition);
g) "Environmental conditions" has been changed (see 4.2.1, 4.3.1 of the.2006 edition);
h) "Power supply conditions" have been changed (see 4.2.2, 4.3.2 of the.2006 edition);
i) "Working methods" has been deleted (see 4.4 of the.2006 edition);
j) "Appearance" has been changed (see 5.1, 5.1 of the.2006 edition);
k) "Control system" has been changed (see 5.2, 5.2 of the.2006 edition);
l) "Performance indicators" have been changed (see 5.3, 5.3 of the.2006 edition);
m) "beam energy" has been changed (see 5.3.1, 5.3.1 of the.2006 edition);
n) "Beam intensity" has been changed (see 5.3.2, 5.3.3 of the.2006 edition);
o) "Beam intensity instability" has been changed (see 5.3.3, 5.3.2 of the.2006 edition);
p) "Beam power" has been changed (see 5.3.4, 5.3.4 of the.2006 edition);
q) "Scan width" was deleted (see 5.3.5 of the.2006 edition);
r) "Beam scanning non-uniformity" has been changed (see 5.3.5, 5.3.6 of the.2006 edition);
s) "Electrical safety" has been changed (see 5.4, 5.4 of the.2006 edition);
t) "Radiation safety" was changed (see 5.5, 5.5 of the.2006 edition);
u) Deleted the requirement of “ozone dilution emission” (see 5.6 of the.2006 edition)
v) Changed “Operation requirements”, “Start-up”, “Resume startup” and “Stable operation” (see 5.6, 5.7 of the.2006 edition);
w) Changed "Complete machine performance test" (see 6.4, 6.4 of the.2006 edition);
x) "Beam energy" has been changed (see 6.4.1, 6.4.1 of the.2006 edition);
y) "Beam intensity" was changed (see 6.4.2, 6.4.3 of the.2006 edition);
z) "Beam intensity instability" was changed (see 6.4.3, 6.4.2 of the.2006 edition);
aa) "Beam power" has been changed (see 6.4.4, 6.4.4 of the.2006 edition);
bb) "Beam scanning non-uniformity and scanning width" was changed (see 6.4.5, 6.4.5 and 6.4.6 of the.2006 edition);
cc) "Inspection classification" has been changed (see 7.1, 7.1 of the.2006 edition);
dd) The “Judgment Rules” were modified (see 7.3, 7.3 of the.2006 edition);
ee) The content of the product certificate has been changed (see 8.4.2, 8.4.2 of the.2006 edition).
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed and coordinated by the National Nuclear Instrumentation Standardization Committee (SAC/TC30).
This document was drafted by. China Institute of Atomic Energy and Nuctech Technology Co., Ltd.
The main drafters of this document are. Xiang Yihuai, Wang Guobao, Zhang Lifeng, Zhu Zhibin, Cui Aijun, Qin Cheng, Yu Guolong, Liu Yilu, Yang Lu, Qin Huaili,
Chen Zhiqiang.
This document was first published in.2006 and this is the first revision.
Self-shielded electron beam radiation processing device
1 Scope
This document specifies the composition, working conditions, technical requirements, inspection rules, and marking, packaging and
The contents of the test include transportation, accompanying documents, storage, etc., and the corresponding test methods are described.
This document is applicable to self-shielded electron beam radiation processing equipment with electron beam energy of 0.5MeV~5MeV (hereinafter referred to as "equipment"
(“Set”).
2 Normative references
The contents of the following documents constitute essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 191 Pictorial markings for packaging, storage and transportation
GB/T 9969 General principles for instructions for use of industrial products
GB/T 16841 Dosimetry Guidelines for Electron Beam Radiation Processing Equipment with Energy from 300keV to 25MeV
GB 18871 Basic Standard for Ionizing Radiation Protection and Radiation Source Safety
GB 19517 National Electrical Equipment Safety Technical Specifications
GB/T 25306 General specification for electron accelerator engineering for radiation processing
HJ979 Radiation safety and protection of electron accelerator irradiation devices
3 Terms and definitions
The following terms and definitions apply to this document.
3.1
Self-shielding
The shielding body of the device can reduce the leakage dose of X-rays generated by the electron beam hitting the irradiated object or absorber without additional
The dose can be reduced to below the prescribed limit under shielding conditions.
3.2
Radiation processing
A process in which ionizing radiation acts on matter to make its quality or performance meet the expected requirements.
3.3
A device that generates, accelerates, and extracts electron beams for radiation processing.
3.4
Reference plan
In the rectangular coordinate system, the plane composed of the X and Y axes is shown in Figure 1.
Note. In this document, the distance between the reference surface and the electron beam output window is specified as 1 cm to 15 cm.
|