GB/T 17626.11-2023 PDF English
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| GB/T 17626.11-2023 | English | 470 |
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Electromagnetic compatibility - Testing and measurement techniques - Part 11: Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
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| GB/T 17626.11-2008 | English | 135 |
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Electromagnetic compatibility -- Testing and measurement techniques -- Voltage dips, short interruptions and voltage variations immunity tests
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| GB/T 17626.11-1999 | English | 559 |
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Electromagnetic compatibility. Testing and measurement techniques. Voltage dips, short interruptions and voltage variations immunity tests
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GB/T 17626.11-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 11: Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT17626.11-2023
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 33.100.20
CCS L 06
Replacing GB/T 17626.11-2008
Electromagnetic compatibility - Testing and measurement
techniques - Part 11.Voltage dips, short interruptions and
voltage variations immunity tests for equipment with input
current up to 16 A per phase
[IEC 61000-4-11.2020, Electromagnetic compatibility (EMC) - Part 4-11.Testing and
measurement techniques - Voltage dips, short interruptions and voltage variations
immunity tests for equipment with input current up to 16 A per phase]
Issued on. MAY 23, 2023
Implemented on. JUNE 01, 2024
Issued by. State Administration for Market Regulation;
Standardization Administration of the People’s Republic of China.
Table of Contents
Foreword... 3
Introduction... 7
1 Scope... 12
2 Normative references... 12
3 Terms and definitions... 13
4 General... 15
5 Test levels... 15
5.1 General... 15
5.2 Voltage dips and short interruptions... 16
5.3 Voltage variations... 17
6 Test instrumentation... 20
6.1 Test generator... 20
6.2 Power source... 23
7 Test set-up... 23
8 Test procedures... 24
8.1 General... 24
8.2 Laboratory reference conditions... 24
8.3 Execution of the test... 25
9 Evaluation of test results... 26
10 Test report... 27
Annex A (Normative) Test circuit details... 29
A.1 Test generator peak inrush current drive capability... 29
A.2 Current monitor's characteristics for measuring peak inrush current capability... 29
A.3 EUT peak inrush current requirement... 30
Annex B (Informative) Electromagnetic environment classes... 32
Annex C (Informative) Test instrumentation... 34
Annex D (Informative) Rationale for generator specification regarding voltage, rise-
time and fall-time, and inrush current capability... 37
D.1 Concept of basic standard... 37
D.2 IEC 61000-4-11.1994 (first edition)... 37
D.3 Rationale for the need of rapid fall-times... 37
D.4 Interpretation of the rise-time and fall-time requirements during EUT testing... 38
D.5 Main conclusions... 38
D.6 Rationale for inrush current capability... 39
Bibliography... 40
1 Scope
This document defines the immunity test methods and range of preferred test levels for
electrical and electronic equipment connected to low-voltage power supply networks
for voltage dips, short interruptions, and voltage variations.
This document applies to electrical and electronic equipment having a rated input
current not exceeding 16 A per phase, for connection to 50 Hz AC networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz AC
networks. Tests for these networks will be covered by future IEC documents.
The object of this document is to establish a common reference for evaluating the
immunity of electrical and electronic equipment when subjected to voltage dips, short
interruptions and voltage variations.
Note 1.Voltage fluctuation immunity tests are covered by IEC 61000-4-14.
The test method documented in this document of GB/T 17626 describes a consistent
method to assess the immunity of equipment or a system against a defined phenomenon.
Note 2.As described in IEC Guide 107, this is a basic EMC publication for use by
product committees of the IEC. As also stated in Guide 107, the IEC product
committees are responsible for determining whether this immunity test
standard should be applied or not, and, if applied, they are responsible for
defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the
evaluation of the value of particular immunity tests for their products.
2 Normative references
The following documents are referred to in the text in such a way that some or all of
their content constitutes requirements of this document. For dated references, only the
edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1 immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence
of an electromagnetic disturbance
3.2 voltage dip
sudden reduction of the voltage at a particular point of an electricity supply system
below a specified dip threshold followed by its recovery after a brief interval
3.3 short interruption
sudden reduction of the voltage on all phases at a particular point of an electric supply
system below a specified interruption threshold followed by its restoration after a brief
interval
Note. Short interruptions are typically associated with switchgear operations related to
the occurrence and termination of short circuits on the system or on installations
connected to it.
3.4 residual voltage (of voltage dip)
minimum value of RMS voltage recorded during a voltage dip or short interruption
3.5 malfunction
breakdown of the ability of equipment to carry out intended functions or the execution
of unintended functions by the equipment
3.6 calibration
method to prove that the measurement equipment is in compliance with its
specifications
3.7 verification
set of operations which are used to check the test equipment system (e.g., the test
generator and the interconnecting cables) to demonstrate that the test system is
functioning within the specifications given in Clause 6
4 General
Electrical and electronic equipment can be affected by voltage dips, short interruptions
or voltage variations of the power supply.
Voltage dips and short interruptions occur due to faults in a (public or non-public)
network or in installations by sudden changes of large loads. In certain cases, two or
more consecutive dips or interruptions can occur. Voltage variations are caused by
continuously varying loads connected to the network.
5 Test levels
5.1 General
The voltages in this document use the rated voltage for the equipment (UT) as a basis
for the voltage test level specification.
Where the equipment has a rated voltage range the following shall apply.
5.2 Voltage dips and short interruptions
The change between UT and the changed voltage is abrupt. The step can start and stop
at any phase angle on the mains voltage. The following test voltage levels (in %UT) are
used. 0%, 40%, 70% and 80%, corresponding to dips with residual voltages of 0%, 40%,
70% and 80%.
The rise and fall time are detailed in Figure 3.
The preferred test levels and durations given in Table 1 and Table 2 take into account
the information given in IEC TR 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of
many real world dips, but are not intended to guarantee immunity to all voltage dips.
More severe dips, for example 0% for 1 s and balanced three-phase dips, may be
considered by product committees.
The generator specification for voltage rise time, tr, and voltage fall time, tf, during
abrupt changes is indicated in Table 4.
5.3 Voltage variations
This test considers a defined transition between the rated voltage UT and the changed
voltage.
6 Test instrumentation
6.1 Test generator
6.1.1 General
The following features are common to the generator for voltage dips, short interruptions
and voltage variations, except as indicated.
Examples of generators are given in Annex C.
6.1.2 Performance and characteristics of the generator
UT (RMS)
See Table 4 for technical specifications for the performance and characteristics of the
generator.
6.1.3 Verification of the characteristics of the voltage dips, short interruptions
generators
For output voltages of 70% and 40% of the nominal value, the above requirements need
only be verified for a maximum of 3 s duration.
For output voltages of 40% of the nominal value it is acceptable to verify the load
regulation requirements either at 200 V ~ 240 V nominal voltage or at 100 V ~ 120 V
nominal voltage..
The 100 Ω resistive load used to test the generator should not have additional inductivity.
Rise and fall time, as well as overshoot and undershoot, shall be verified for switching
at both 90° and 270°, from 0% to 100%, 100% to 80%, 100% to 70%, 100% to 40%,
and 100% to 0%.
Phase angle accuracy shall be verified for switching from 0% to 100% and 100% to 0%,
at nine phase angles from 0° to 360° in 45° increments. It shall also be verified for
switching from 100% to 80% and 80% to 100%, 100% to 70% and 70% to 100%, as
well as from 100% to 40% and 40% to 100%, at 90° and 180°.
The voltage generators shall, preferably, be recalibrated at defined time periods in
accordance with a recognized quality assurance system.
6.2 Power source
The frequency of the test voltage shall be within ±2% of rated frequency.
7 Test set-up
The test shall be performed with the EUT connected to the test generator with the
shortest power supply cable as specified by the EUT manufacturer. If no cable length is
specified, it shall be the shortest possible length suitable to the application of the EUT.
The test set-ups are defined for the three types of phenomena described in this document.
Figure C.1a) shows a schematic for the generation of voltage dips, short interruptions
and voltage variations with gradual transition between rated and changed voltage using
a generator with internal switching. In Figure C.1b) a generator and a power amplifier
are used.
8 Test procedures
8.1 General
Before starting the test of a given EUT, a test plan shall be prepared.
The test plan should be representative of the way the system is actually used.
Systems can require a precise pre-analysis to define which system configurations shall
be tested to reproduce field situations.
Test cases shall be explained and indicated in the test report.
It is recommended that the test plan include the following items.
If the actual operating signal sources are not available to the EUT, they can be simulated.
For each test, any degradation of performance shall be recorded. The monitoring
equipment should be capable of displaying the status of the operational mode of the
EUT during and after the tests. After each group of tests, a full functional check shall
be performed.
8.2 Laboratory reference conditions
8.2.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product
standard, the climatic conditions in the laboratory shall be within any limits specified
for the operation of the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation
on the EUT or the test equipment.
8.2.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall be such as to guarantee the
correct operation of the EUT in order not to influence the test results.
8.3 Execution of the test
8.3.1 General
During the tests, the mains voltage for testing shall be monitored within an accuracy of ±2%.
8.3.2 Voltage dips and short interruptions
The EUT shall be tested for each selected combination of test level and duration with a
sequence of three dips/interruptions with intervals of 10 s minimum (between each test
event). Each representative mode of operation shall be tested.
For short interruptions, the angle shall be defined by the product committee as the worst
case. In the absence of definition, it is recommended to use 0° for one of the phases.
For the short interruption test of three-phase systems, all the three phases shall be
simultaneously tested according to 5.2.
For the voltage dips test of single-phase systems, the voltage shall be tested according
to 5.2.This implies one series of tests.
For the voltage dips test of three-phase systems with neutral, each individual voltage
(phase-to-neutral and phase-to-phase) shall be tested, one at a time, according to 5.2.
This implies six different series of tests. See Figure 5.
For the voltage dips test of three-phase systems without neutral, each phase-to-phase
voltage shall be tested, one at a time, according to 5.2.This implies three different series
of tests. See Figure 5b).
8.3.3 Voltage variations
The EUT is tested to each of the specified voltage variations, three times at 10 s interval
for the most representative modes of operations.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its
manufacturer or the requestor of the test, or agreed between the manufacturer and the
purchaser of the product. The recommended classification is as follows.
a) normal performance within limits specified by the manufacturer, requestor or
purchaser;
b) temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance, without operator intervention;
c) temporary loss of function or degradation of performance, the correction of which
requires operator intervention;
d) loss of function or degradation of performance which is not recoverable, owing to
damage to hardware or software, or loss of data.
The manufacturer's specification may define effects on the EUT which can be
considered insignificant, and therefore acceptable.
This classification may be used as a guide in formulating performance criteria, by
committees responsible for generic, product and product-family standards, or as a
framework for the agreement on performance criteria between the manufacturer and the
purchaser, for example where no suitable generic, product or product-family standard
exists.
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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