GB/T 17626.11-2023 PDF in English
GB/T 17626.11-2023 (GB/T17626.11-2023, GBT 17626.11-2023, GBT17626.11-2023)
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Name of Chinese Standard | Status |
| GB/T 17626.11-2023 | English | 470 |
Add to Cart
|
0-9 seconds. Auto-delivery.
|
Electromagnetic compatibility -- Testing and measurement techniques -- Part 11: Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
| Valid |
| GB/T 17626.11-2008 | English | 135 |
Add to Cart
|
0-9 seconds. Auto-delivery.
|
Electromagnetic compatibility -- Testing and measurement techniques -- Voltage dips, short interruptions and voltage variations immunity tests
| Valid |
| GB/T 17626.11-1999 | English | 559 |
Add to Cart
|
3 days
|
Electromagnetic compatibility. Testing and measurement techniques. Voltage dips, short interruptions and voltage variations immunity tests
| Obsolete |
Standards related to (historical): GB/T 17626.11-2023
PDF Preview
GB/T 17626.11-2023: PDF in English (GBT 17626.11-2023) GB/T 17626.11-2023
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 33.100.20
CCS L 06
Replacing GB/T 17626.11-2008
Electromagnetic compatibility - Testing and measurement
techniques - Part 11: Voltage dips, short interruptions and
voltage variations immunity tests for equipment with input
current up to 16 A per phase
[IEC 61000-4-11:2020, Electromagnetic compatibility (EMC) - Part 4-11: Testing and
measurement techniques - Voltage dips, short interruptions and voltage variations
immunity tests for equipment with input current up to 16 A per phase]
ISSUED ON: MAY 23, 2023
IMPLEMENTED ON: JUNE 01, 2024
Issued by: State Administration for Market Regulation;
Standardization Administration of the People’s Republic of China.
Table of Contents
Foreword ... 3
Introduction ... 7
1 Scope ... 12
2 Normative references ... 12
3 Terms and definitions ... 13
4 General ... 15
5 Test levels ... 15
5.1 General ... 15
5.2 Voltage dips and short interruptions ... 16
5.3 Voltage variations ... 17
6 Test instrumentation ... 20
6.1 Test generator ... 20
6.2 Power source ... 23
7 Test set-up ... 23
8 Test procedures ... 24
8.1 General ... 24
8.2 Laboratory reference conditions ... 24
8.3 Execution of the test ... 25
9 Evaluation of test results ... 26
10 Test report ... 27
Annex A (Normative) Test circuit details ... 29
A.1 Test generator peak inrush current drive capability ... 29
A.2 Current monitor's characteristics for measuring peak inrush current capability ... 29
A.3 EUT peak inrush current requirement ... 30
Annex B (Informative) Electromagnetic environment classes ... 32
Annex C (Informative) Test instrumentation ... 34
Annex D (Informative) Rationale for generator specification regarding voltage, rise-
time and fall-time, and inrush current capability ... 37
D.1 Concept of basic standard ... 37
D.2 IEC 61000-4-11:1994 (first edition) ... 37
D.3 Rationale for the need of rapid fall-times ... 37
D.4 Interpretation of the rise-time and fall-time requirements during EUT testing ... 38
D.5 Main conclusions ... 38
D.6 Rationale for inrush current capability ... 39
Bibliography ... 40
Foreword
This document is drafted in accordance with the rules provided in GB/T 1.1-2020
Directives for standardization - Part 1: Rules for the structure and drafting of
standardizing documents.
This document is Part 11 of GB/T 17626, Electromagnetic compatibility - Testing and
measurement techniques. The following parts have been issued for GB/T 17626:
– GB/T 17626.1-2006, Electromagnetic compatibility - Testing and measurement
techniques - Overview of immunity tests;
– GB/T 17626.2-2018, Electromagnetic compatibility - Testing and measurement
techniques - Electrostatic discharge immunity test;
– GB/T 17626.3-2016, Electromagnetic compatibility - Testing and measurement
techniques - Radiated radio-frequency electromagnetic field immunity test;
– GB/T 17626.4-2018, Electromagnetic compatibility - Testing and measurement
techniques - Electrical fast transient/burst immunity test;
– GB/T 17626.5-2019, Electromagnetic compatibility - Testing and measurement
techniques - Surge immunity test;
– GB/T 17626.6-2017, Electromagnetic compatibility - Testing and measurement
techniques - Immunity to conducted disturbances induced by radio-frequency fields;
– GB/T 17626.7-2017, Electromagnetic compatibility - Testing and measurement
techniques - General guide on harmonics and inter-harmonics measurements and
instrumentation, for power supply systems and equipment connected thereto;
– GB/T 17626.8-2006, Electromagnetic compatibility (EMC) - Part 8: Testing and
measurement techniques - Power frequency magnetic field immunity test;
– GB/T 17626.9-2011, Electromagnetic compatibility - Testing and measurement
techniques - Pulse magnetic field immunity test;
– GB/T 17626.10-2017, Electromagnetic compatibility - Testing and measurement
techniques - Damped oscillatory magnetic field immunity test;
– GB/T 17626.11-2023, Electromagnetic compatibility - Testing and measurement
techniques - Part 11: Voltage dips, short interruptions and voltage variations
immunity tests for equipment with input current up to 16 A per phase;
– GB/T 17626.12-2023, Electromagnetic compatibility - Testing and measurement
techniques - Ring wave immunity test;
– GB/T 17626.13-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Harmonics and inter-harmonics including mains
signalling at a.c. power port low frequency immunity test;
– GB/T 17626.14-2005, Electromagnetic Compatibility - Testing and measurement
techniques - Voltage fluctuation immunity test;
– GB/T 17626.15-2011, Electromagnetic compatibility - Testing and measurement
techniques - Flickermeter - Functional and design specifications;
– GB/T 17626.16-2007, Electromagnetic compatibility - Testing and measurement
techniques - Test for immunity to conducted common mode disturbances in the
frequency range 0 Hz to 150 kHz;
– GB/T 17626.17-2005, Electromagnetic Compatibility - Testing and measurement
techniques - Ripple on d.c. input power port immunity test;
– GB/T 17626.18-2016, Electromagnetic compatibility - Testing and measurement
techniques - Damped oscillatory wave immunity test;
– GB/T 17626.19-2022, Electromagnetic compatibility - Testing and measurement
techniques - Part 19: Test for immunity to conducted, differential mode disturbances
and signalling in the frequency range 2 kHz to 150 kHz at a.c. power ports;
– GB/T 17626.20-2014; Electromagnetic compatibility - Testing and measurement
techniques - Emission and immunity testing in transverse electromagnetic (TEM)
waveguide;
– GB/T 17626.21-2014, Electromagnetic compatibility - Testing and measurement
techniques - Reverberation chamber test methods;
– GB/T 17626.22-2017, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Radiated emissions and immunity measurements in fully
anechoic rooms (FARs);
– GB/T 17626.24-2012, Electromagnetic compatibility - Testing and measurement
techniques - Test methods for protective devices for HEMP conducted disturbance;
– GB/T 17626.27-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Unbalance immunity test;
– GB/T 17626.28-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Variation of power frequency immunity test;
– GB/T 17626.29-2006, Electromagnetic compatibility (EMC) - Testing and
measurement techniques - Voltage dips short interruptions and voltage variations on
d.c. input power port immunity tests;
– GB/T 17626.30-2012, Electromagnetic compatibility - Testing and measurement
techniques - Power quality measurement methods;
– GB/T 17626.31-2021, Electromagnetic compatibility - Testing and measurement
techniques - Part 31: AC mains ports broadband conducted disturbance immunity
test;
– GB/T 17626.33-2023, Electromagnetic compatibility - Testing and measurement
techniques - Part 33: Measurement methods for high-power transient parameters;
– GB/T 17626.34-2012, Electromagnetic compatibility - Testing and measurement
techniques - Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase;
This Standard replaces GB/T 17626.11-2008, Electromagnetic compatibility - Testing
and measurement techniques - Voltage dips, short interruptions and voltage variations
immunity tests. Compared with GB/T 17626.11-2008, in addition to structural
adjustments and editorial changes, the main technical changes are as follows:
a) Add the terms and definitions of “rise time” and “fall time” (see Clause 3);
b) Add the causes of voltage dips and short interruptions (see Clause 4).
This document modifies and adopts IEC 61000-4-11:2020 Electromagnetic
compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips,
short interruptions and voltage variations immunity tests for equipment with input
current up to 16 A per phase.
The technical differences between this document and IEC 61000-4-11:2020, and the
causes for these differences are as follows:
– Delete the parameters related to 60 Hz in Tables 1, 2 and 3, including the 60 Hz
frequency point of the test levels and durations of voltage dips and short interruptions
in Tables 1 and 2, the requirements for 12 cycles, 30 cycles and 300 cycles of Class
2 and Class 3 as well as footnote c in Tables 1 and 2, the 60 Hz frequency point of
the time required for voltage increase in Table 3, and the requirements of 30 cycles
required for voltage increase when the voltage test level is 70% as well as footnote
b in Table 3, so as to be applicable to the national conditions in China (see Clause
5);
– Change "operating voltage (230 V, 120 V, etc.)" in 6.1.3 to "operating voltage (220
V, 120 V, etc.)" to be applicable to the national conditions in China.
This document also makes the following editorial modifications:
– To be consistent with the standard system in our country, change the name of the
standard to "Electromagnetic compatibility - Testing and measurement techniques -
Electromagnetic compatibility - Testing and measurement
techniques - Part 11: Voltage dips, short interruptions and
voltage variations immunity tests for equipment with input
current up to 16 A per phase
1 Scope
This document defines the immunity test methods and range of preferred test levels for
electrical and electronic equipment connected to low-voltage power supply networks
for voltage dips, short interruptions, and voltage variations.
This document applies to electrical and electronic equipment having a rated input
current not exceeding 16 A per phase, for connection to 50 Hz AC networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz AC
networks. Tests for these networks will be covered by future IEC documents.
The object of this document is to establish a common reference for evaluating the
immunity of electrical and electronic equipment when subjected to voltage dips, short
interruptions and voltage variations.
Note 1: Voltage fluctuation immunity tests are covered by IEC 61000-4-14.
The test method documented in this document of GB/T 17626 describes a consistent
method to assess the immunity of equipment or a system against a defined phenomenon.
Note 2: As described in IEC Guide 107, this is a basic EMC publication for use by
product committees of the IEC. As also stated in Guide 107, the IEC product
committees are responsible for determining whether this immunity test
standard should be applied or not, and, if applied, they are responsible for
defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the
evaluation of the value of particular immunity tests for their products.
2 Normative references
The following documents are referred to in the text in such a way that some or all of
their content constitutes requirements of this document. For dated references, only the
edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
Where the equipment has a rated voltage range the following shall apply:
– if the voltage range does not exceed 20% of the lower voltage specified for the
rated voltage range, a single voltage within that range may be specified as a basis
for the test level specification (UT);
– in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
– guidance for the selection of test levels and durations is given in IEC TR 61000-
2-8.
5.2 Voltage dips and short interruptions
The change between UT and the changed voltage is abrupt. The step can start and stop
at any phase angle on the mains voltage. The following test voltage levels (in %UT) are
used: 0%, 40%, 70% and 80%, corresponding to dips with residual voltages of 0%, 40%,
70% and 80%.
For voltage dips, the preferred test levels and durations are given in Table 1, and an
example is shown in Figure 1a) and Figure 1b).
For short interruptions, the preferred test levels and durations are given in Table 2, and
an example is shown in Figure 2.
The rise and fall time are detailed in Figure 3.
The preferred test levels and durations given in Table 1 and Table 2 take into account
the information given in IEC TR 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of
many real world dips, but are not intended to guarantee immunity to all voltage dips.
More severe dips, for example 0% for 1 s and balanced three-phase dips, may be
considered by product committees.
The generator specification for voltage rise time, tr, and voltage fall time, tf, during
abrupt changes is indicated in Table 4.
The levels and durations shall be given in the product specification. A test level of 0%
corresponds to a total supply voltage interruption. In practice, a test voltage level from
0% to 20% of the rated voltage may be considered as a total interruption.
Shorter durations in Table 1, in particular the half-cycle, should be tested to ensure that
the equipment under test (EUT) operates within the performance limits specified for it.
When setting performance criteria for disturbances of a half-period duration for
products with a mains transformer, product committees should pay particular attention
to effects which can result from inrush currents. For such products, these can reach 10
Chinese Standards
This is an excerpt of the PDF (Some pages are marked off intentionally)
Full-copy PDF can be purchased from 1 of 2 websites:
1. https://www.ChineseStandard.us
SEARCH the standard ID, such as GB 4943.1-2022.
Select your country (currency), for example: USA (USD); Germany (Euro).
Full-copy of PDF (text-editable, true-PDF) can be downloaded in 9 seconds.
Tax invoice can be downloaded in 9 seconds.
Receiving emails in 9 seconds (with download links).
SEARCH the standard ID, such as GB 4943.1-2022.
Full-copy of PDF (text-editable, true-PDF) can be downloaded in 9 seconds.
Receiving emails in 9 seconds (with PDFs attached, invoice and download links).
Translated by: Field Test Asia Pte. Ltd. (Incorporated & taxed in Singapore. Tax ID: 201302277C)
Linkin: https://www.linkedin.com/in/waynezhengwenrui/
------ The End ------
......
Source: Above contents are excerpted from the PDF -- translated/reviewed by: www.chinesestandard.net / Wayne Zheng et al.
|