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GB 3834-1983 English PDF

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GB 3834-1983EnglishRFQ ASK 9 days [Need to translate] General principles of measuring methods of CMOS circuits for semiconductor integrated circuits Obsolete GB 3834-1983

PDF similar to GB 3834-1983


Standard similar to GB 3834-1983

GB/T 43770   SAMR 76   SJ/T 11460.6.4   GB/T 43034.2   GB/T 42968.4   GB/T 4377   

Basic data

Standard ID GB 3834-1983 (GB3834-1983)
Description (Translated English) General principles of measuring methods of CMOS circuits for semiconductor integrated circuits
Sector / Industry National Standard
Classification of Chinese Standard L56
Word Count Estimation 38,372
Date of Issue 8/31/1983
Date of Implementation 7/1/1984
Adopted Standard IEC 147-2, NEQ