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Database: 189759 (19 Oct 2025)
GB 3834-1983 English PDF
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Standard Title (Description)
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GB 3834-1983
English
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General principles of measuring methods of CMOS circuits for semiconductor integrated circuits
Obsolete
GB 3834-1983
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Basic data
Standard ID
GB 3834-1983 (GB3834-1983)
Description (Translated English)
General principles of measuring methods of CMOS circuits for semiconductor integrated circuits
Sector / Industry
National Standard
Classification of Chinese Standard
L56
Word Count Estimation
38,372
Date of Issue
8/31/1983
Date of Implementation
7/1/1984
Adopted Standard
IEC 147-2, NEQ