GB/T 6346.14-2023 PDF English (GB/T 6346.14-2015: Older version)
Search result: GB/T 6346.14-2023 (GB/T 6346.14-2015 Older version)
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Name of Chinese Standard | Status |
| GB/T 6346.14-2023 | English | 875 |
Add to Cart
|
0-9 seconds. Auto-delivery.
|
Fixed capacitors for use in electronic equipment - Part 14: Sectional specification--Fixed capacitors for electromagnetic interference suppression and connection to the supply mains
| Valid |
| GB/T 6346.14-2015 | English | RFQ |
ASK
|
6 days
|
Fixed capacitors for use in electronic equipment -- Part 14: Sectional specification -- Fixed capacitors for electromagnetic interference suppression and connection to the supply mains
| Obsolete |
PDF Preview: GB/T 6346.14-2023
GB/T 6346.14-2023: PDF in English (GBT 6346.14-2023) GB/T 6346.14-2023
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 31.060.10
CCS L 11
GB/T 6346.14-2023 / IEC 60384-14:2013
Replacing GB/T 6346.14-2015
Fixed capacitors for use in electronic equipment - Part 14:
Sectional specification - Fixed capacitors for electromagnetic
interference suppression and connection to the supply mains
(IEC 60384-14:2013, IDT)
ISSUED ON: MARCH 17, 2023
IMPLEMENTED ON: OCTOBER 01, 2023
Issued by: State Administration for Market Regulation;
Standardization Administration of the People’s Republic of China.
Table of Contents
Foreword ... 4
Introduction ... 10
1 General ... 19
1.1 Scope ... 19
1.2 Object ... 19
1.3 Normative references ... 19
1.4 Information to be given in a detail specification ... 21
1.5 Terms and definitions ... 22
1.6 Marking ... 28
1.7 Classification of Class X and Class Y capacitors... 30
2 Preferred ratings and characteristics ... 31
2.1 Preferred characteristics ... 31
2.2 Preferred values of ratings ... 32
2.3 Requirements for sleeving, tape, tubing and wire insulation ... 33
3 Assessment procedures ... 33
3.1 Primary stage of manufacture ... 33
3.2 Structurally similar components ... 33
3.3 Certified records of released lots ... 33
3.4 Approval testing ... 33
3.5 Quality conformance inspection ... 45
4 Test and measurement procedures ... 48
4.1 Visual examination and check of dimensions ... 48
4.2 Electrical tests ... 50
4.3 Robustness of terminations ... 54
4.4 Resistance to soldering heat ... 54
4.5 Solderability ... 55
4.6 Rapid change of temperature ... 55
4.7 Vibration ... 55
4.8 Bump ... 56
4.9 Shock ... 57
4.10 Container sealing ... 57
4.11 Climatic sequence ... 58
4.12 Damp heat, steady state ... 59
4.13 Impulse voltage ... 60
4.14 Endurance ... 62
4.15 Charge and discharge ... 65
4.16 Radiofrequency characteristics ... 66
4.17 Passive flammability test ... 67
4.18 Active flammability test ... 68
4.19 Component solvent resistance (if applicable) ... 70
4.20 Solvent resistance of the marking ... 70
Annex A (Normative) Circuit for the impulse voltage test ... 71
Annex B (Normative) Circuit for the endurance test ... 73
Annex C (Normative) Circuit for the charge and discharge test ... 74
Annex D (Normative) Declaration of design ... 75
Annex E (Normative) Pulse test circuits ... 77
Annex F (Normative) Particular requirements for safety test of surface mounting
capacitors ... 79
Annex G (Normative) Capacitance ageing of fixed capacitors of ceramic dielectric,
Class 2 ... 82
Annex H (Normative) Use of safety approved a.c. rated capacitors in d.c. applications
... 85
Annex I (Normative) Humidity robustness grade for applications, where high stability
under high humidity operating conditions is required ... 87
Bibliography ... 89
Foreword
This document is drafted in accordance with the rules provided in GB/T 1.1-2020
Directives for standardization - Part 1: Rules for the structure and drafting of
standardizing documents.
This document is part 14 of GB/T 6346, Fixed capacitors for use in electronic
equipment. The following parts have been issued for GB/T 6346:
-- Part 1: Generic specification;
-- Part 2: Sectional specification - Fixed metalized polyethylene-terephthalate film
dielectric d.c. capacitors;
-- Part 2-1: Blank detail specification - Fixed metallized polyethylene-terephthalate film
dielectric d.c. capacitors - Assessment levels E and EZ;
-- Part 3: Sectional specification - Surface mount fixed tantalum electrolytic capacitors
with manganese dioxide solid electrolyte;
-- Part 3-1: Blank detail specification - Surface mount fixed tantalum electrolytic
capacitors with manganese dioxide solid electrolyte - Assessment level EZ;
-- Part 4: Sectional specification - Aluminium electrolytic capacitors with solid and non-
solid electrolyte;
-- Part 4-1: Blank detail specification - Aluminium electrolytic capacitors with non-
solid electrolyte - Assessment level E;
-- Part 5: Sectional specification: Fixed mica dielectric d.c. capacitors with a rated
voltage not exceeding 3 000 V - Selection of methods of test and general
requirements;
-- Part 5-1: Blank detail specification: Fixed mica dielectric d.c. capacitors with a rated
voltage not exceeding 3 000 V - Assessment level E;
-- Part 6: Sectional specification: Fixed metallized polycarbonate film dielectric d.c.
capacitors;
-- Part 6-1: Blank detail specification: Fixed metallized polycarbonate film dielectric
d.c. capacitors - Assessment level E;
-- Part 7: Sectional specification: Fixed polystyrene film dielectric metal foil d.c.
capacitors;
-- Part 7-1: Blank detail specification: Fixed polystyrene film dielectric metal foil d.c.
capacitors - Assessment level E;
6346.14-2015, except for structural adjustment and editorial changes, the main
technical changes are as follows:
-- CHANGE d.c. voltage between mains applicable to capacitors from 1 000 V to 1 500
V (see 1.1; 1.1 of the 2015 edition);
-- ADD “The overvoltage categories in combination with the a.c. mains voltages for the
capacitors classified in this document shall be taken from IEC 60664-1” (see 1.2);
-- ADD the markings a.c. and d.c. for alternating current and direct current respectively
(see 1.6);
-- REMOVE capacitor of Class X3 and capacitor of Class Y3 (see 1.5.3 and 1.5.4 of
the 2015 edition);
-- CHANGE the maximum rated voltage (a.c.) for capacitor of Class Y2 from 300 V to
500 V (see 1.7.2 and Table 10; 1.5.4 and Table 10 of the 2015 edition);
-- CHANGE the peak impulse voltage applied before endurance test of Y2-capacitors
to be divided according to the nominal capacitance (see 1.7.2; 1.5.4 of the 2015
edition);
-- CHANGE the flame retardance category permitted from the minimum category C to
the preferred category B, and to category C for components smaller than 1 750 mm3
(see 2.2.6 and 4.17; 2.2.6 and 4.17 of the 2015 edition);
-- ADD rated voltage, rated temperature, and flame retardant requirements for sleeving,
tape, tubing and wire insulation (see 2.3);
-- ADD provisions for grouping ceramic capacitors according to relative permittivity in
sampling (see 3.4.3.1);
-- DELETE the provisions of assessment level D (see Table 4, Table 5, Table 7 and
Table 8 of the 2015 edition);
-- CHANGE the voltage -- if a d.c. test voltage is used instead of a.c. for Y-capacitors -
- from 1.8 times to 1.5 times (see 3.5; 3.5 of the 2015 edition);
-- CHANGE the interval for re-inspection in the case of delayed delivery from not
exceeding 3 months to not exceeding 3 years (see 3.5.3; 3.5.3 of the 2015 edition);
-- CHANGE part of the creepage distances and clearances of Y1- and Y2-capacitors
(see Table 9; Table 9 of the 2015 edition);
-- CHANGE the test conditions for the withstanding voltage test (see Table 10; Table
10 of the 2015 edition);
-- ADD supplementary provisions for the measuring frequency of ceramic capacitors
(see 4.2.3);
-- ADD the provision “When preconditioning is performed, initial measurements shall
be carried out after preconditioning” (see 4.4, 4.6, 4.8.2, 4.9.2, 4.13.1, 4.15.1);
-- ADD specific provisions on the test conditions of damp heat, steady state (see 4.12.2);
-- ADD provisions for the fuse in the endurance test (see 4.14.1);
-- ADD the requirement that the case temperature of the capacitor shall be measured for
RC units with specified rated temperature in the endurance test (see 4.14.3);
-- CHANGE the impulse voltage of capacitor endurance test (see 4.14.3 and 4.14.4;
4.14.3 and 4.14.4 of the 2015 edition);
-- ADD provisions for the resistor of Class X capacitors >10 μF in the endurance test
circuit (see 4.14.3.1);
-- ADD that for SMD capacitors consisting of ceramic and metal only, the passive
flammability test can be omitted (see 4.17);
-- ADD the alternative passive flammability test (see 4.17.2);
-- CHANGE the Ct value of the tank capacitor in the test circuit of the active
flammability test (see 4.18.2; 4.18.2 of the 2015 edition);
-- ADD the normative Annex H “Use of safety approved a.c. rated capacitors in d.c.
Applications” and the normative Annex I “Humidity robustness grade for
applications, where high stability under high humidity operating conditions is
required” (see Annex H and Annex I).
This document is identical to IEC 60384-14:2013, Fixed capacitors for use in electronic
equipment - Part 14: Sectional specification - Fixed capacitors for electromagnetic
interference suppression and connection to the supply mains.
The following minimal editorial changes are made to this document:
-- INCLUDE the amendment given in IEC 60384-14:2013/AMD1:2016, and MARK
the terms involved with vertical double lines (ǁ) on the outer margin.
Please note that some of the contents of this document may involve patents. The issuing
organization of this document is not responsible for identifying patents.
This document was proposed by the Ministry of Industry and Information Technology
of the People’s Republic of China.
Fixed capacitors for use in electronic equipment - Part 14:
Sectional specification - Fixed capacitors for electromagnetic
interference suppression and connection to the supply mains
1 General
1.1 Scope
This document applies to capacitors and resistor-capacitor combinations which will be
connected to an a.c. mains or other supply with nominal voltage not exceeding 1 000 V
a.c. (r.m.s.) or 1 500 V d.c. and with a nominal frequency not exceeding 100 Hz.
1.2 Object
The principal object of this document is to prescribe preferred ratings and
characteristics and to select from IEC 60384-1:2016, the appropriate quality assessment
procedures, tests and measuring methods and to give general performance requirements
for this type of capacitor. Test severities and requirements prescribed in detail
specifications referring to this sectional specification will be of equal or higher
performance level; lower performance levels are not permitted.
This document also provides a schedule of safety tests to be used by national testing
stations in countries where approval by such stations is required.
The overvoltage categories in combination with the a.c. mains voltages for the
capacitors classified in this document shall be taken from IEC 60664-1.
1.3 Normative references
The following documents, in whole or in part, are normatively referenced in this
document and are indispensable for its application. For dated references, only the
edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
GB/T 2421-2020, Environmental testing - General and guidance (IEC 60068-1:2013,
IDT)
Note: There is no technical difference between the referenced content of GB/T 2421-
2020 and the referenced content of IEC 60068-1:1988.
ISO 7000-0434:2004, Graphical symbols for use on equipment - Index and synopsis
design (see Annex D) registering essential data and basic design details of the capacitors
for which approval is sought.
3.4.2 Qualification approval
Tables 4, 5 and 7 shall be used when qualification approval is sought.
The procedures for qualification approval testing are given in the generic specification,
IEC 60384-1:2016, Clause Q.2.4. The schedules to be used for qualification approval
testing on the basis of lot-by-lot and periodic inspections are given in 3.5 and Table 8
of this standard. The schedule to be used for qualification approval testing on the basis
of fixed sample sizes according to IEC 60384-1:2016, Q.2.4, is given in 3.4.3 and
Tables 4 and 5 of this standard. For the two procedures, the sample sizes and the number
of permissible nonconforming items shall be of comparable order. The test conditions
and requirements shall be the same. Qualification approval according to the fixed
sample sizes of Tables 4 and 5 is preferred.
3.4.3 Qualification approval on the basis of the fixed sample size procedure
3.4.3.1 Sampling
Capacitors of each technology, rated voltage, class and subclass shall be separately
qualified. The total number of capacitors of each rated voltage in each group is given
in Tables 3, 4 and 5. For multi-section capacitors containing sections of different classes
and for lead-through capacitors, larger numbers are required as indicated.
The sample shall contain equal numbers of specimens of the highest and lowest
capacitance values in the range to be qualified, except for the passive flammability test
of 4.17 and the active flammability test of 4.18. For the passive flammability test, the
rules of sampling in 4.17, footnote d to Table 3 and footnote h to Table 4 shall be
followed. For the active flammability test, the rules of sampling in 4.18 shall be
followed. For RC units, the sample of highest capacitance values and the sample of the
lowest capacitance values shall contain each, as nearly as possible, an equal number of
resistors of the highest and lowest resistance value in the range to be qualified. Where
only one capacitance value is involved, the total number of capacitors as stated in Tables
3, 4 and 5 shall be tested.
Spare specimens are permitted as follows:
a) one per capacitance value which may be used to replace the permitted
nonconforming item in Group 0;
b) the remainder of the spare specimens may be required, if it is necessary, to repeat
any test according to the provisions of footnote a of either Tables 3 or 4.
The numbers given in Group 0 assume that all subgroups are applicable. If this is not
so, the numbers may be reduced accordingly.
......
Source: Above contents are excerpted from the PDF -- translated/reviewed by: www.chinesestandard.net / Wayne Zheng et al.
|