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Std ID |
Description (Standard Title) |
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SJ/T 10867-1996
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Measurement of the electrical properties of disk-seal tubes Measuring methods of resonator unloaded Q
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SJ/T 10868-1996
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Measurement of the electrical properties of disk-seal tubes Measuring methods of sell neutralization frequency
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SJ/T 10869-1996
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Measurement of the electrical properties of disk-seal tubes Measuring methods of the power gain
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SJ/T 10870-1996
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Measurement of the electrical properties of disk-seal tubes Measuring methods of AM-PM conversion coeffient
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SJ/T 10871-1996
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Methods of measurement for electrical properties of disk-seal tubes - Methods of measurement for the three tone inter-modulation distortion
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SJ/T 10872-1996
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(Chinese Industry Standard)
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SJ/T 10872-2000
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Detail specification for electronic components Fixed low-power non-wirewound resistors Type RJ15 metal film fixed resistors Assessment level E
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SJ/T 10873-1996
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Detail specification for electronic components Fixed metallized polyethylene-terephthalate film dielectric DC capacitors Type CL2 Assessment level E
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SJ/T 10874-1996
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Detail specification for electronic components Fixed metallized polyethylene-terephthalate film dielectric DC capacitors Type CL21 Assessment level E
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SJ/T 10875-1996
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Detail specification for electronic components fixed capacitors, ceramic dielectric disc feed-through type CC52
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SJ/T 10876-1996
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Detail specification for electronic components fixed capacitors, ceramic dielectric disc feed-through type CT52
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SJ/T 10877-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CF741 operational amplifiers (Applicable for certification)
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SJ/T 10878-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CW723 multi-terminal adjustable voltage regulators (Applicable for certification)
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SJ/T 10879-1996
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Semiconductor integrated audio circuits - General principles of measuring methods for audio preamplifiers
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SJ/T 10880-1996
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Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
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SJ/T 10881-1996
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Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
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SJ/T 10882-1996
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Semiconductor integrated circuits - General principles of measuring methods for linear amplifiers
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SJ/T 10883-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CDA7520 10-bit D/A converters (Applicable for certification)
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SJ/T 10884-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CE10131 ECL dual D-type master-slave flip-flops (Applicable for certification)
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SJ/T 10885-1996
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Detailed specifications for electronic components -3DA150B and 3DA150C bipolar transistors for high frequency amplification case (Applicable for certification)
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SJ/T 10886-1996
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Detailed specifications for electronic components - 3DD201 bipolar transistors for low frequency amplification case (Applicable for certification)
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SJ/T 10887-1996
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Detailed specifications for electronic components -3DD102B bipolar transistors for low frequency amplification case (Applicable for certification)
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SJ/T 10888-1996
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Type designation system for magnetic heads of cassette tape recorders
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SJ/T 10889-1996
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Variable ceramic vacuum capacitors of type CKTB 400/7.5/60
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SJ/T 10890-1996
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(Cathode ray tube defects effectively screen specification)
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SJ/T 10890-2003
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Defect criteria in useful screen area for cathode ray tubes
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SJ/T 10891-1996
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(Cathode ray tube bulb test specification)
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SJ/T 10891-2003
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Inspection standards of glass bulbs for Cathode-Ray tubes
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SJ/T 10892-1996
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Silicon switching rectifier diode for type 2CN31D
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SJ/T 10893-1996
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The general rules for chemical analysis of electronic glass
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SJ/T 10894-1996
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Determination of Li2O Na2O and K2O in electronic glass by atomic absorption
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SJ/T 10895-1996
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Determination of CaO SrO and MgO in electronic glass by atomic absorption
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SJ/T 10896-1996
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Determination of ZnO PbO and Sb2O3 in electronic glass by atomic absorption
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SJ/T 10897-1996
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Determination of Co2O3 NiO and MnO2 in electronic glass by atomic absorption
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SJ/T 10898-1996
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Determination of iron oxide and titania in electronic glass by photometric method
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SJ/T 10899-1996
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Determination of zirconia in electronic glass
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SJ/T 10900-1996
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Determination of arsenic (As2O3) in electronic glass
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SJ/T 10901-1996
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Determination of manganese dioxide in electronic glass by the potassium periodate oxidation method
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SJ/T 10902-1996
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Determination of silica (SiO2) in electronic glass
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SJ/T 10903-1996
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Determination of boron (B2O3) in electronic glass
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SJ/T 10904-1996
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Determination of fluorine in electronic glass by specification electrode measurement
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SJ/T 10905-1996
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Determination of lead oxide in electronic glass
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SJ/T 10906-1996
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Determination of baryta (BaO) in electronic glass
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SJ/T 10907-1996
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Determination of alumina (Al2O3) in electronic glass by EDTA complexicretric titration
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SJ/T 10908-1996
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Determination of alumina (Al2O3) and zinc oxidein (ZnO) in electronic glass by EDTA complexicretric titration
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SJ/T 10909-1996
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Determination of K2O Na2O and Li2O in electronic glass by EDTA complexicretric titration fmission spectrcopy
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SJ/T 10910-1996
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Visual-frequency coaxial connectors, Series SL10
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SJ/T 10911-1996
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Visual-frequency coaxial connectors, Series SL12
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SJ/T 10912-1996
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Visual-frequency coaxial connectors, Series SL16
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SJ/T 10913-1996
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General specification for crimping tools hand or power actuated
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SJ/T 10914-1996
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Performance requirements for meteorogical facsimile (analogue)
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SJ/T 10915-1996
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Measuring methods for meteorological facsimile (analogue)
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SJ/T 10916-1996
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Packaging of color picture tubes
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SJ/T 10917-1996
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Performance requirements for camera tube yoke assemblies
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SJ/T 10918-1996
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Methods of measurement for camera tube yoke assemblies
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SJ/T 10919-1996
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Packaging of color broadcasting TV receiver
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SJ/T 10920-1996
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Test methods for transport packages of broadcasting TV receiver
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SJ/T 10921-1996
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Potassium silicate solution for use in electronic industry. Methods for determination of potassium carbonate
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SJ/T 10922-1996
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Potassium silicate solution for use in electronic industry. Generality for analytical methods
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SJ/T 10923-1996
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Potassium silicate solution for use in electronic industry. The methods of determination for total alkalinity
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SJ/T 10924-1996
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Potassium silicate solution for use in electronic industry. The methods of determination for silica content
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SJ/T 10925-1996
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Potassium silicate solution for use in electronic industry. The methods of calculation for concentration and modulus
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SJ/T 10926-1996
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Potassium silicate solution for use in electronic industry. The methods of determination for iron
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SJ/T 10927-1996
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Potassium silicate solution for use in electronic industry. The methods of determination for copper
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SJ/T 10928-1996
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Potassium silicate solution for use in electronic industry. The methods of determination for nickel
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SJ/T 10929-1996
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Potassium silicate solution for use in electronic industry. The methods of determination for weighty metals
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SJ/T 10930-1996
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Potassium silicate solution for use in electronic industry -- The methods of determination for chloride
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SJ/T 10931-1996
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Detailed specifications for electronic components - Semiconductor microcomputer integrated circuits - Cμ6800 8-bit microprocessors (Applicable for certification)
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SJ/T 10932-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CC4013 CMOS dual D positive edge-triggered flip-flops (Applicable for certification)
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SJ/T 10933-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CC4518 CMOS dual decimal system synchronous counters (Applicable for certification)
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SJ/T 10934-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CW7805 triple-terminal positive voltage regulators (Applicable for certification)
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SJ/T 10935-1996
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Detailed specifications for electronic components - Semiconductor integrated circuits - CF747 general dual operational amplifiers (Applicable for certification)
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SJ/T 10936-1996
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Method of measurement for residue stress in color picture tube bulbs
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SJ/T 10937-1996
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Method for measurement of chromaticity coordinates for color picture tube glass panel
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SJ/T 10938-1996
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Method for measurement of light transmissivity (τ546) for color pictrure tube glass panel
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SJ/T 10939-1996
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Determination of Cerium oxide in color picture tube glass
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SJ/T 10940-1996
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Determination of Chromium oxide (Cr2O3) in color picture tube glass
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SJ/T 10941-1996
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Determination of chlorine (Cl)in color picture tube glass
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SJ/T 10942-1996
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Determination of sulfur (S) in color picture tube glass
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SJ/T 10943-1996
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Test method for granulometric distribution of alundum powder for vacuum tubes. Density balance method
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SJ/T 10944-1996
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Alundum powder for vacuum tubes
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SJ/T 10945-1996
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Type designation system for alundum powder for vacuum tubes
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SJ/T 10946-1996
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(Liquid soldering flux (rosin-based))
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SJ/T 10947-1996
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Detailed specifications for electronic components - FG341052 and FG343053 semiconductor green light emitting diodes
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SJ/T 10948-1996
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Detailed specifications for electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes
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SJ/T 10949-1996
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Detailed specifications for electronic components - 2CZ321 ambient-rated silicon rectifier diodes (Applicable for certification)
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SJ/T 10950-1996
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Detailed specifications for electronic components - 2CZ322 ambient-rated silicon rectifier diodes (Applicable for certification)
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SJ/T 10951-1996
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Detailed specifications for electronic components - 2CZ33 ambient-rated silicon rectifier diodes (Applicable for certification)
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SJ/T 10952-1996
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Detailed specifications for electronic components - 2CZ323 ambient-rated silicon rectifier diodes (Applicable for certification)
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SJ/T 10953-1996
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Detailed specifications for electronic components - 2CZ324Q ambient-rated silicon rectifier diodes (Applicable for certification)
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SJ/T 10954-1996
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Detail specification for electronic component silicon switching diode for type 2CK120
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SJ/T 10955-1996
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Detailed specifications for electronic components - 3DG107 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
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SJ/T 10956-1996
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Detailed specifications for electronic components - 4CS122 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
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SJ/T 10957-1996
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Detailed specifications for electronic components - 4CS103 high frequency silicon dual insulated-gate field-effect transistors (Applicable for certification)
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SJ/T 10958-1996
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Detailed specifications for electronic components - 3CT320 case-rated reverse blocking triode thyristors (Applicable for certification)
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SJ/T 10959-1996
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Detailed specifications for electronic components - 3CT320 case-rated avalanche triode thyristors (Applicable for certification)
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SJ/T 10960-1996
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Detailed specifications for electronic components - 3CG844 silicon PNP ambient-rated transistors for high frequency amplification
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SJ/T 10961-1996
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Detailed specifications for electronic components - 3CG778 silicon PNP ambient-rated transistors for high frequency amplification (Applicable for certification)
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SJ/T 10962-1996
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Detailed specifications for electronic components - 3DA1514 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
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SJ/T 10963-1996
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Detailed specifications for electronic components - 3DG2271 silicon NPN ambient-rated transistors for high frequency amplification (Applicable for certification)
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