|
Std ID |
Description (Standard Title) |
Detail |
|
SJ/T 10774-2000
|
Detail specification for electronic components Fixed low-power non-wirewound resistors Type RT 14 carbon film fixed resistors Assessment level E
|
SJ/T 10774-2000
|
|
SJ/T 10775-1996
|
(Chinese Industry Standard)
|
SJ/T 10775-1996
|
|
SJ/T 10775-2000
|
Detail specification for electronic components Fixed low-power non-wirewound resistors Type RJ 14 metal film fixed resistors Assessment level E
|
SJ/T 10775-2000
|
|
SJ/T 10775-2013
|
(Electronic Component Detail specification - Fixed low power non- wirewound resistors RJ14 Metal Film Fixed Resistors - Assessment level E)
|
SJ/T 10775-2013
|
|
SJ/T 10776-1996
|
Detail specification for electronic components Fixed ceramic dielectric capacitors type CT1 Assessment level E
|
SJ/T 10776-1996
|
|
SJ/T 10777-1996
|
Detail specification for electronic components Fixed ceramic dielectric capacitors type CC1 Assessment level E
|
SJ/T 10777-1996
|
|
SJ/T 10778-1996
|
Detail specification for electronic components Type CD11 fixed aluminium electrolyte capacitors
|
SJ/T 10778-1996
|
|
SJ/T 10779-1996
|
Detailed specifications for electronic components - 2CN41 silicon fast-switching rectifier diodes - Assessment level E (Applicable for certification)
|
SJ/T 10779-1996
|
|
SJ/T 10780-1996
|
Electronic components detail specification CY-0, 1, 2, 3mica dielectric capacitors Assessment level E
|
SJ/T 10780-1996
|
|
SJ/T 10781-1996
|
Detailed specifications for electronic components - 37SX101Y22-DC01 color picture tubes (Applicable for certification)
|
SJ/T 10781-1996
|
|
SJ/T 10782-1996
|
Detailed specifications for electronic components - 56SX101Y22-DC03 color picture tubes (Applicable for certification)
|
SJ/T 10782-1996
|
|
SJ/T 10783-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CD7176CP SIF amplifying circuits (Applicable for certification)
|
SJ/T 10783-1996
|
|
SJ/T 10784-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification)
|
SJ/T 10784-1996
|
|
SJ/T 10785-1996
|
Detail specification for electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL10 Assessment level E
|
SJ/T 10785-1996
|
|
SJ/T 10786-1996
|
Detail specification for electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL11 Assessment level E
|
SJ/T 10786-1996
|
|
SJ/T 10787-1996
|
Detail specification for electronic component Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors type CL12 Assessment level E
|
SJ/T 10787-1996
|
|
SJ/T 10788-1996
|
Detailed specifications for electronic components - 3DG79 forward AGC low-noise transistor for high-frequency (Applicable for certification)
|
SJ/T 10788-1996
|
|
SJ/T 10789-1996
|
Detailed specifications for electronic components - 2CL24, 2CL25, 2CL27 and 2CL29 glass passivated and encapsulated high voltage silicon stacks (Applicable for certification)
|
SJ/T 10789-1996
|
|
SJ/T 10790-1996
|
Detailed specifications for electronic components - 3CG21B and 3CG21C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
|
SJ/T 10790-1996
|
|
SJ/T 10791-1996
|
Detailed specifications for electronic components - 3CX2014A, 3CX201B and 3CX201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
|
SJ/T 10791-1996
|
|
SJ/T 10792-1996
|
Detailed specifications for electronic components - 33DX201A, 3DX201B and 3DX201C ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
|
SJ/T 10792-1996
|
|
SJ/T 10793-1996
|
Terms for glass in electronic techniques
|
SJ/T 10793-1996
|
|
SJ/T 10794-1996
|
Designation method for glass in electronic techniques
|
SJ/T 10794-1996
|
|
SJ/T 10795-1996
|
General purpose rigid coaxial transmission lines and their associated flange connectors Detail specification
|
SJ/T 10795-1996
|
|
SJ/T 10796-1996
|
Specification for raised floor of computer rooms
|
SJ/T 10796-1996
|
|
SJ/T 10796-2001
|
General specification for raised access floor for electrostatic protection
|
SJ/T 10796-2001
|
|
SJ/T 10797-1996
|
Symbols and other markings on hearing aids and related equipment
|
SJ/T 10797-1996
|
|
SJ/T 10798-1996
|
(Chinese Industry Standard)
|
SJ/T 10798-1996
|
|
SJ/T 10798-2000
|
Detail specification for electronic component Directly heated negative temperature coefficient thermistor for style MF11 Assessment level E
|
SJ/T 10798-2000
|
|
SJ/T 10799-1996
|
(Chinese Industry Standard)
|
SJ/T 10799-1996
|
|
SJ/T 10799-2000
|
Detail specification for electronic component Directly heated negative temperature coefficient thermistor for style MF53-1 Assessment level E
|
SJ/T 10799-2000
|
|
SJ/T 10800-1996
|
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for sense amplifiers
|
SJ/T 10800-1996
|
|
SJ/T 10801-1996
|
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for magnetic memory drivers
|
SJ/T 10801-1996
|
|
SJ/T 10802-1996
|
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for peripheral drivers
|
SJ/T 10802-1996
|
|
SJ/T 10803-1996
|
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
|
SJ/T 10803-1996
|
|
SJ/T 10804-1996
|
Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator
|
SJ/T 10804-1996
|
|
SJ/T 10804-2000
|
Semiconductor integrated circuits. General principles of measuring methods for level translator
|
SJ/T 10804-2000
|
|
SJ/T 10805-1996
|
Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
|
SJ/T 10805-1996
|
|
SJ/T 10805-2000
|
Semiconductor interface integrated circuits General principles of measuring methods for voltage comparators
|
SJ/T 10805-2000
|
|
SJ/T 10806-1996
|
Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for display drivers
|
SJ/T 10806-1996
|
|
SJ/T 10807-1996
|
Detail specification for electronic component Glass passivated high voltage rectifier silicon stack for types 2CL61, 2CL62, 2CL63, 2CL64, 2CL65, 2CL66, 2CL67, 2CL68
|
SJ/T 10807-1996
|
|
SJ/T 10808-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1000 TTL Quad 2-input positive-NAND gate (Applicable for certification)
|
SJ/T 10808-1996
|
|
SJ/T 10809-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1002 TTL Quad 2-input positive-NAND gate (Applicable for certification)
|
SJ/T 10809-1996
|
|
SJ/T 10810-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1004 TTL Hex inverters (Applicable for certification)
|
SJ/T 10810-1996
|
|
SJ/T 10811-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1008 TTL Quad 2-input positive-NAND gate (Applicable for certification)
|
SJ/T 10811-1996
|
|
SJ/T 10812-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1010 TTL Triple 3-input positive-NAND gate (Applicable for certification)
|
SJ/T 10812-1996
|
|
SJ/T 10813-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1020 TTL dual 4-input positive-NAND gate (Applicable for certification)
|
SJ/T 10813-1996
|
|
SJ/T 10814-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1027 TTL Triple 3-input positive-NAND gate (Applicable for certification)
|
SJ/T 10814-1996
|
|
SJ/T 10815-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1030 TTL8 input positive-NAND gate (Applicable for certification)
|
SJ/T 10815-1996
|
|
SJ/T 10816-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1040 TTL dual 4-input positive-NAND buffer (Applicable for certification)
|
SJ/T 10816-1996
|
|
SJ/T 10817-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CT1054 TTL4-channel 2-2-2-2 input AND OR INVENT gate (Applicable for certification)
|
SJ/T 10817-1996
|
|
SJ/T 10818-1996
|
Semiconductor integrated circuits - General principles of measuring methods for D/A and A/D converters of non-linear circuits
|
SJ/T 10818-1996
|
|
SJ/T 10819-1996
|
Detailed specifications for electronic components - 35SX5B black and white picture tubes (Applicable for certification)
|
SJ/T 10819-1996
|
|
SJ/T 10820-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CH2001 HTL dual 4-input positive-NAND gate
|
SJ/T 10820-1996
|
|
SJ/T 10821-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CH2007 HTL Quad inverters
|
SJ/T 10821-1996
|
|
SJ/T 10822-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CH2008 HTL dual 4-input positive-NAND gate
|
SJ/T 10822-1996
|
|
SJ/T 10823-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CH2009 HTL triple 3-input positive-NAND gate
|
SJ/T 10823-1996
|
|
SJ/T 10824-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CH2010 HTL Quad 2-input positive-NAND gate
|
SJ/T 10824-1996
|
|
SJ/T 10825-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CH2013 HTL Hex inverters
|
SJ/T 10825-1996
|
|
SJ/T 10826-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0450 HTL dual peripheral positive AND drivers
|
SJ/T 10826-1996
|
|
SJ/T 10827-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0451 HTL dual peripheral positive AND drivers
|
SJ/T 10827-1996
|
|
SJ/T 10828-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0452 HTL dual peripheral positive NAND drivers
|
SJ/T 10828-1996
|
|
SJ/T 10829-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0453 HTL dual peripheral positive OR drivers
|
SJ/T 10829-1996
|
|
SJ/T 10830-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CJ0454 HTL dual peripheral positive NOR drivers
|
SJ/T 10830-1996
|
|
SJ/T 10831-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits
|
SJ/T 10831-1996
|
|
SJ/T 10832-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CD7611CP PIF amplifying circuits
|
SJ/T 10832-1996
|
|
SJ/T 10833-1996
|
Detailed specifications for electronic components - 3DG80 ambient-rated bipolar transistors for low and high frequency amplification (Applicable for certification)
|
SJ/T 10833-1996
|
|
SJ/T 10834-1996
|
Detailed specifications for electronic components - CS111, CS112, CS113, CS114, CS115 and CS116 single-gate junction field-effect transistors (Applicable for certification)
|
SJ/T 10834-1996
|
|
SJ/T 10835-1996
|
Detailed specifications for electronic components - 3DK105A and 3DK105B bipolar switching transistors (Applicable for certification)
|
SJ/T 10835-1996
|
|
SJ/T 10836-1996
|
Detailed specifications for electronic components - 3DK107A and 3DK107B bipolar switching transistors (Applicable for certification)
|
SJ/T 10836-1996
|
|
SJ/T 10837-1996
|
Detailed specifications for electronic components -3DG131A, 3DG131B and 3DG131C ambient-rated bipolar transistors for high frequency amplification (Applicable for certification)
|
SJ/T 10837-1996
|
|
SJ/T 10838-1996
|
Detailed specifications for electronic components - 2CZ201, 2CZ202 and 2CZ203 switching rectifier diodes (Applicable for certification)
|
SJ/T 10838-1996
|
|
SJ/T 10839-1996
|
Alkaline secondary cell XY 20
|
SJ/T 10839-1996
|
|
SJ/T 10840-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10101 ECL Quad 2-input OR/NOR gate (Applicable for certification)
|
SJ/T 10840-1996
|
|
SJ/T 10841-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10102 ECL Quad 4-input NOR gate (Applicable for certification)
|
SJ/T 10841-1996
|
|
SJ/T 10842-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10104 ECL Quad 2-input AND gate (Applicable for certification)
|
SJ/T 10842-1996
|
|
SJ/T 10843-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10105 ECL Triple 2, 3, 2-input OR/NOR gate (Applicable for certification)
|
SJ/T 10843-1996
|
|
SJ/T 10844-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10106 ECL Triple 4, 3, 3-input NOR gate (Applicable for certification)
|
SJ/T 10844-1996
|
|
SJ/T 10845-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10109 ECL dual 4, 5-input OR/NOR gate (Applicable for certification)
|
SJ/T 10845-1996
|
|
SJ/T 10846-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10110 ECL dual 3-input OR gate (3-output) (Applicable for certification)
|
SJ/T 10846-1996
|
|
SJ/T 10847-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10111 ECL dual 3-input NOR gate (3-output) (Applicable for certification)
|
SJ/T 10847-1996
|
|
SJ/T 10848-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10117 ECL dual 2-channel 2-3-input AND-OR/OR-NAND gate (Applicable for certification)
|
SJ/T 10848-1996
|
|
SJ/T 10849-1996
|
Detailed specifications for electronic components - Semiconductor integrated circuits - CE10121 ECL4-channel 3-3-3-3 input AND-OR/OR-NAND gate (Applicable for certification)
|
SJ/T 10849-1996
|
|
SJ/T 10850-1996
|
Detail specification for electronic components Type CD10 fixed aluminium electrolyte capacitors
|
SJ/T 10850-1996
|
|
SJ/T 10851-1996
|
Detail specification for electronic components Type CD13 fixed aluminium electrolyte capacitors
|
SJ/T 10851-1996
|
|
SJ/T 10852-1996
|
Detail specification for electronic components Type CD15 fixed aluminium electrolyte capacitors
|
SJ/T 10852-1996
|
|
SJ/T 10853-1996
|
Detail specification for electronic components Type CD19 fixed aluminium electrolyte capacitors
|
SJ/T 10853-1996
|
|
SJ/T 10854-1996
|
Detail specification for electronic components Type CD26 fixed aluminium electrolyte capacitors
|
SJ/T 10854-1996
|
|
SJ/T 10855-1996
|
Detail specification for electronic components Type CD27 fixed aluminium electrolyte capacitors
|
SJ/T 10855-1996
|
|
SJ/T 10856-1996
|
Detail specification for electronic components Type CA42 fixed tantalum capacitors with solid electrolyte Assessment level E
|
SJ/T 10856-1996
|
|
SJ/T 10857-1996
|
Chrome blanks
|
SJ/T 10857-1996
|
|
SJ/T 10858-1996
|
Test methods for surface flatness of glass substrate and chromium film
|
SJ/T 10858-1996
|
|
SJ/T 10859-1996
|
Test method for chromium film and photoresist thickness of chrome blanks
|
SJ/T 10859-1996
|
|
SJ/T 10860-1996
|
Test method for surface reflectivity of chromium film on chrome blanks
|
SJ/T 10860-1996
|
|
SJ/T 10861-1996
|
Test method for optical density of chrome blanks
|
SJ/T 10861-1996
|
|
SJ/T 10862-1996
|
Measurement of the performance characteristics of hearing aids for quality inspection for delivery purposes
|
SJ/T 10862-1996
|
|
SJ/T 10863-1996
|
Detailed specifications for electronic components - 47SX101Y22-DC05 color picture tubes (Applicable for certification)
|
SJ/T 10863-1996
|
|
SJ/T 10864-1996
|
Measurement of the electrical properties of disk-seal tubes General
|
SJ/T 10864-1996
|
|
SJ/T 10865-1996
|
Measurement of the electrical properties of disk-seal tubes Measuring methods of the frequency-response characteristic
|
SJ/T 10865-1996
|
|
SJ/T 10866-1996
|
Measurement of the electrical properties of disk-seal tubes Measuring methods of the frequency position
|
SJ/T 10866-1996
|