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Program of Pattern Evaluation of Low Background α, β Measuring Instruments
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JJF 1763-2019
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Basic data Standard ID | JJF 1763-2019 (JJF1763-2019) | Description (Translated English) | Program of Pattern Evaluation of Low Background ��, �� Measuring Instruments | Sector / Industry | Metrology & Measurement Industry Standard | Classification of Chinese Standard | A58 | Classification of International Standard | 17.240 | Word Count Estimation | 25,265 | Date of Issue | 2019 | Date of Implementation | 2019-12-27 | Issuing agency(ies) | State Administration for Market Regulation |
JJF 1763-2019: Program of Pattern Evaluation of Low Background α, β Measuring Instruments---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Low-level α, β measuring instrument type evaluation outline)
National Measurement Technical Specification of the People's Republic of China
Low-level α, β measuring instrument type evaluation outline
2019-09-27 release
2019-12-27 Implementation
Issued by the State Administration of Market Supervision and Administration
Low-level α, β measuring instrument type evaluation outline
Centralized unit. National Technical Committee on Ionizing Radiation Measurement
Main drafting unit. China Institute of Testing Technology
Shanghai Institute of Metrology and Testing Technology
Chinese Academy of Metrology
Participated in the drafting unit. Hubei Institute of Metrology and Testing Technology
This specification entrusts the National Ionizing Radiation Measurement Technical Committee to interpret
The main drafters of this specification.
Yu Bing (China Institute of Testing Technology)
Tang Fangdong (Shanghai Institute of Metrology and Testing Technology)
Liang Juncheng (Chinese Academy of Metrology)
Participating drafters.
Shi Shuguang (Hubei Institute of Metrology and Testing Technology)
He Linfeng (Shanghai Institute of Metrology and Testing Technology)
Wang Wei (China Institute of Testing Technology)
Dan Yujuan (China Institute of Testing Technology)
table of Contents
Introduction (Ⅱ)
1 Scope (1)
2 References (1)
3 Terminology (1)
3.1 Sensitive area of the detector (1)
4 Overview (1)
5 Legal management requirements (2)
5.1 Unit of measurement (2)
5.2 Requirements for measurement legal signs and measurement appliance labels (2)
6 Measurement requirements (2)
6.1 Instrument background (2)
6.2 Detection efficiency (2)
6.3 Repeatability (2)
6.4 Cross-channel ratio (2)
7 General technical requirements (2)
7.1 Appearance and structure (2)
7.2 Functional requirements (3)
7.3 Environmental adaptability (3)
8 Type evaluation item table (3)
9 Provide the number of prototypes and how to use them (4)
9.1 Number of prototypes provided (4)
9.2 How to use the prototype (4)
10 Test methods and conditions of test items, data processing and qualification criteria (4)
10.1 Measurement performance inspection (4)
10.2 Appearance, structure and functional requirements (7)
10.3 Environmental adaptability (7)
11 Table of measuring instruments and equipment used in the test project (10)
12 Judgment of type evaluation results (10)
13 Type evaluation record format (10)
Appendix A Type Evaluation Record Format (11)
Introduction
This type evaluation outline is based on JJF 1015 "General Specification for Type Evaluation of Measuring Instruments" and JJF 1016 "Measuring Apparatus
"Guidelines for the preparation of a typed evaluation outline" and JJF 1001 "General Measurement Terms and Definitions".
The technical indicators and test methods of this type evaluation outline refer to JJG853-2013 "Low Background α, β Measurement
Instrument ”, GB/T 11682“ Low Background α and/or β Measuring Instrument ”and other technical regulations.
This type evaluation outline is released for the first time.
Low-level α, β measuring instrument type evaluation outline
1 Scope
This type evaluation outline is applicable to the type of low background alpha and beta measuring instruments with the classification code of measuring instruments 37061500
Evaluation.
This type of evaluation outline does not apply to the model of the total α and total β measuring instruments and the α and β energy spectrum measuring instruments of the proportional gas counter
Evaluation.
2 Reference documents
The following documents are cited in this type evaluation outline.
JJG853-2013 low background α, β measuring instrument
JJF 1001 General Measurement Terms and Definitions
GB/T 6587 General Specification for Electronic Measuring Instruments
GB/T 11682 Low background alpha and/or beta measuring instrument
GB/T 19661.1 Safety Requirements for Nuclear Instruments and Systems Part 1. General Requirements
For dated reference documents, only the dated version is applicable to this type of evaluation outline; those that are not dated
The latest version (including all amendments) of the cited documents is applicable to this type evaluation outline.
3 Terminology
The terms and definitions defined in JJF 1001 and JJG853-2013 and the following terms and definitions are applicable to this type review
Price outline.
3.1 Sensitive areaofadetector
The area of the detector that is sensitive to radiation and used for detection.
4 Overview
Low background alpha and beta measuring instruments are mainly used for measuring alpha and beta radioactivity in various samples. The instrument uses quality,
The larger lead shield is used in the laboratory.
The low background alpha and beta measuring instruments are mainly composed of detector unit, shielding unit, measurement and data processing unit.
The detector usually uses a scintillation detector. The measurement principle is that after the alpha and beta particles in the sample enter the detector scintillator, they will
All the energy is lost on the scintillation substance, causing the scintillation to glow, and the scintillation photons are accepted by the photomultiplier tube and converted to generate electricity
Pressure pulse signal. The number of α and β particles entering the detector is proportional to the voltage pulse signal. When measuring, in count (rate)
It is mainly displayed, and the count (rate) is directly proportional to the activity in the sample.
The degree value shows the measurement result.
The key components that affect the metering performance of the instrument are shown in Table 1.
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