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Program of Pattern Evaluation of α, β Surface Contamination Monitors
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JJF 1762-2019
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Basic data Standard ID | JJF 1762-2019 (JJF1762-2019) | Description (Translated English) | Program of Pattern Evaluation of ��, �� Surface Contamination Monitors | Sector / Industry | Metrology & Measurement Industry Standard | Classification of Chinese Standard | A58 | Classification of International Standard | 17.240 | Word Count Estimation | 26,264 | Date of Issue | 2019 | Date of Implementation | 2019-12-27 | Issuing agency(ies) | State Administration for Market Regulation |
JJF 1762-2019: Program of Pattern Evaluation of α, β Surface Contamination Monitors---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Program of Pattern Evaluation of α, β Surface Contamination Monitors
National Measurement Technical Specification of the People's Republic of China
Outline of Type Evaluation of α and β Surface Pollution Meters
2019-09-27 release
2019-12-27 Implementation
Issued by the State Administration of Market Supervision and Administration
Outline of Type Evaluation of α and β Surface Pollution Meters
Centralized unit. National Technical Committee on Ionizing Radiation Measurement
Drafting unit. Shanghai Institute of Metrology and Testing Technology
Beijing Academy of Metrology and Testing Science
Shenzhen Institute of Metrology and Quality Inspection
This specification entrusts the National Ionizing Radiation Measurement Technical Committee to interpret
Drafters of this specification.
Tang Fangdong (Shanghai Institute of Metrology and Testing Technology)
He Linfeng (Shanghai Institute of Metrology and Testing Technology)
Luo Chen (Beijing Institute of Metrology and Testing Science)
Zhou Yingchun (Shenzhen Institute of Metrology and Quality Inspection)
Xu Yihe (Shanghai Institute of Metrology and Testing Technology)
table of Contents
Introduction (Ⅱ)
1 Scope (1)
2 References (1)
3 Terms and definitions (1)
4 Overview (2)
5 Legal management requirements (2)
5.1 Unit of measurement (2)
5.2 Requirements for measurement legal signs and measurement appliance labels (2)
6 Measurement requirements (2)
6.1 Background count rate (2)
6.2 Surface emissivity response (2)
6.3 Relative inherent error (2)
6.4 Repeatability (3)
7 General technical requirements (3)
7.1 Appearance and structure (3)
7.2 Function check (3)
7.3 Environmental adaptability (3)
8 Type evaluation items (3)
9 Provide the number of prototypes and how to use them (4)
9.1 Number of prototypes provided (4)
9.2 How to use the prototype (4)
10 Test methods and conditions of test items, data processing and qualification criteria (4)
10.1 Measurement performance inspection (4)
10.2 Appearance, structure and functional requirements (7)
10.3 Environmental adaptability (7)
11 Table of measuring instruments and equipment used in the test project (8)
12 Principles for processing and judgment of type evaluation results (9)
Appendix A Type Evaluation Record Format (10)
Introduction
This type evaluation outline is based on JJF 1015-2014 "General Specification for Type Evaluation of Measuring Instruments" and JJF 1016-
2014 "Guidelines for the Preparation of Outlines for Measuring Apparatus Type Evaluation", and JJF 1001-2011 "General Measurement Terms and Definitions"
Written.
The technical indicators and test methods of this type of evaluation outline refer to JJG478-2016 "α, β Surface Pollution Meter",
GB/T 5202-2008 "radiation protection instruments α, β and α/β (β energy greater than 60keV) pollution measuring instrument and monitoring
Standards and other standards.
This type evaluation outline is released for the first time.
Outline of Type Evaluation of α and β Surface Pollution Meters
1 Scope
This type evaluation program is applicable to the type evaluation of α, β surface contamination meters with the classification code of measuring instruments 37062000
Price test.
This type of evaluation outline does not apply to fixed α, β personal surface pollution monitoring devices, and the maximum energy is less than
Or equal to 60keV beta particle measuring or monitoring equipment type evaluation test.
2 Reference documents
The following documents are cited in this type evaluation outline.
JJG478-2016 α, β surface pollution meter
JJF 1001-2011 General Measurement Terms and Definitions
JJF 1015-2014 General Specification for Type Evaluation of Measuring Instruments
JJF 1016-2014 Compilation Rules for Type Evaluation Outline of Measuring Instruments
GB/T 5202-2008 Radiation protection instruments α, β and α/β (β energy greater than 60keV) pollution measuring instruments and
Monitor
GB/T 6587-2012 General specification for electronic measuring instruments
GB/T 19661.1-2005 Safety requirements for nuclear instruments and systems Part 1.General requirements
For dated reference documents, only the dated version is applicable to this type of evaluation outline; those that are not dated
The latest version (including all amendments) of the cited documents is applicable to this type evaluation outline.
3 Terms and definitions
The terms and definitions defined in JJF 1001-2011 and the following apply to this type of evaluation outline.
3.1 background
Signals not due to the physical quantity to be measured.
3.2 backgroundcountrate
In the absence of the measured sample, the unit counts per unit time.
Note. These counts come from cosmic rays, radioactive material in the surrounding environment, and electronic noise.
3.3 [Source] surface emission rate
In a unit time, the specific type and energy emitted from the source front surface (2π · sr spherical degree) exceed a specific value
Number of particles.
3.4 surface emissivity response
Under certain conditions, the response characteristic of the measuring instrument or device (system) to the excitation is called the response.
The quotient of the indicator value and the excitation quantity. When the magnitude of the radioactive source is expressed as surface emissivity, it is called surface emissivity
response.
3.5 relative intrinsic error
Under the specified reference conditions, when exposed to the specified reference radiation, the relative error of the instrument's indicated value.
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