US$529.00 · In stock Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email. JJF 1331-2011: Calibration Specification for Inductive Micrometers Status: Valid JJF 1331: Evolution and historical versions
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JJF 1331-2011 | English | 529 |
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Calibration Specification for Inductive Micrometers
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JJF 1331-2011
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JJF 1331-1990 | English | 199 |
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Operating Technical Norm of Primary Standard for Laser Energy at 1~40 J
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Basic data Standard ID | JJF 1331-2011 (JJF1331-2011) | Description (Translated English) | Calibration Specification for Inductive Micrometers | Sector / Industry | Metrology & Measurement Industry Standard | Classification of Chinese Standard | A52 | Classification of International Standard | 17.040 | Word Count Estimation | 23,268 | Date of Issue | 2011-12-28 | Date of Implementation | 2012-06-28 | Older Standard (superseded by this standard) | JJG 396-2002 | Quoted Standard | GB/T 26094-2010; GB/T 26095-2010; GB/T 26097-2010 | Regulation (derived from) | AQSIQ Announcement No. 205 of 2011 | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine | Summary | This standard applies to resolution (scale value) (0. 01 ~ 10) ��m, nominal range (-1 000 ~ +1000) ��m inductance micrometer calibration. |
JJF 1331-2011: Calibration Specification for Inductive Micrometers---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Inductive Micrometers
People's Republic of China National Metrology Technical Specifications
Inductance Sensor Calibration Specification
Issued on. 2011-12-28
2012-06-28 implementation
The State Administration of Quality Supervision, Inspection and Quarantine released
Inductance Sensor Calibration Specification
Instead of JJG396-2002
NFP. National Engineering Geometrical Parameters Measurement Technology Committee
Main drafting unit. Henan Institute of Metrology
Participated in the drafting unit. Meter Zhongyuan Ltd.
Liaoning Provincial Institute of Metrology
Shanghai Measurement and Testing Technology Research Institute
This specification project commissioned by the National geometric parameter measurement technology committee responsible for the interpretation
The main drafters of this specification.
Huang Yuzhu (Henan Institute of Metrology)
Gu Xiaojie (Henan Institute of Metrology)
Fannai Yin (Henan Institute of Metrology)
Drafters participate.
YU Zhen River (Central China Measuring Instruments Co., Ltd.)
Shizuo De (Liaoning Provincial Institute of Metrology)
Advantages and Disadvantages (Shanghai Institute of Measurement and Testing)
table of Contents
Introduction (Ⅱ)
1 Scope (1)
2. References (1)
3 Terms (1)
4 Overview (1)
5 Metrological characteristics (2)
5.1 Zero balance (2)
Drift 5.2 (2)
5.3 Indication variability (2)
5.4 Axial probe spindle influence the radial force of the indicated value (2)
5.5 load and load change (2)
5.6 Indication error (2)
5.7 "and" and "poor" calculation error indication (3)
6 calibration conditions (3)
Environmental conditions 6.1 (3)
6.2 calibration equipment (3)
7 calibration items and calibration methods (3)
7.1 calibration items (3)
7.2 Calibration method (3)
Expression 8 calibration results (8)
9 Recalibration interval (8)
Appendix A pairing method calibration indication error calculation example (9)
Evaluation of Uncertainty Appendix B 0.01μm digital gear inductors micrometer indication error measurement result (10)
Appendix C 0.1μm gear number of explicit inductance micrometer Error in Measurement of Uncertainty Evaluation (13)
Appendix D calibration certificate content and in-page format (16)
Introduction
JJF 1071-2010 "National Calibration Specifications writing rules", JJF 1001-1998 "common terminology and measurement
Definitions ", JJF 1059-1999" Evaluation and Expression of Uncertainty in Measurement ", JJF 1094-2002" measuring instrument characteristics
Assessment ", JJG396-2002" inductance micrometer "constitute support calibration specification revision of the basic series
specification.
Compared with JJG396-2002 "inductance micrometer", in addition to editorial changes, the major technical changes to this specification
as follows.
--- The calibration specifications to test procedures be revised;
--- Abolition of the "discrimination", "response time" metrological characteristics requirements;
--- Calibration method "load" requirements of the metrological characteristics have been modified to increase the load changing requirements;
--- Will "show the value of stability," the description to "drift", modified digital Inductance Sensor drift technology
index;
--- Original procedure with the same amount of 2 blocks pairing method or the direct method of calibration error indication to the amount of the block (or 2, etc.
3, etc.);
--- Added Appendix B, C, D.
The previous versions of the release JJG396-2002 case.
--- JJG396-1985, JJG804-1993.
Inductance Sensor Calibration Specification
1 Scope
This standard applies to the resolution (division value) (0.01 ~ 10) μm, nominal range (-1000 ~ 1000) μm
Inductance Sensor Calibration.
2. References
GB/T 26094-2010 inductance micrometer
GB/T 26095-2010 electronic column inductance micrometer
GB/T 26097-2010 Digital inductance micrometer
For dated references, only the dated edition applies to this specification; undated reference documents
Member, the latest edition (including any amendments) applies to this specification.
3 Terms
3.1 Zero balance zerobalance
When converting inductance micrometer range gear, the consistency of each block shown zero value.
3.2 Indication variability thevariationindication
Under the same measurement conditions, the measurement was performed on the same instrument repeatedly measuring the maximum difference between the results.
4 Overview
Inductance micrometer is a measure of the amount of displacement of small highly accurate measuring instruments, which consists of axial or next to the inductor sensing
Is (probes) to convert the displacement amount into an electrical signal by the display means to be displayed measured. Press significant inductance micrometer
The display device is divided into several different explicit, electronic pointer and column three types. Its shape shown in Figure 1, Figure 2, Figure 3.
Figure 1 Digital inductors micrometer
1- digital meter; 2 - measurement function selection switch; 3 - Range selector switch; 4- magnification adjustment knob; 5- zero adjustment knob; 6- axial probe
2 Analog inductance micrometer
1- pointer; 2- indicator; 3- magnification adjustment knob; 4- range switch; 5- measurement function selection switch; 6- axial probe
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