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GB/T 17554.1-2025: Cards and security devices for personal identification - Test methods - Part 1: General characteristics
Status: Valid GB/T 17554.1: Evolution and historical versions
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Cards and security devices for personal identification - Test methods - Part 1: General characteristics
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GB/T 17554.1-2025
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| GB/T 17554.1-2006 | English | 549 |
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Identification cards -- Test methods -- Part 1: General characteristics tests
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GB/T 17554.1-2006
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| GB/T 17554-1998 | English | RFQ |
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Identification cards--Test methods
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Basic data | Standard ID | GB/T 17554.1-2025 (GB/T17554.1-2025) | | Description (Translated English) | Cards and security devices for personal identification - Test methods - Part 1: General characteristics | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L70 | | Classification of International Standard | 35.240.15 | | Word Count Estimation | 50,530 | | Date of Issue | 2025-02-28 | | Date of Implementation | 2025-09-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 17554.1-2025: Cards and security devices for personal identification - Test methods - Part 1: General characteristics
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GB/T 17554.1-2025 English version. Cards and security devices for personal identification - Test methods - Part 1.General characteristics
ICS 35.240.15
CCSL70
National Standard of the People's Republic of China
Replaces GB/T 17554.1-2006
Test methods for cards and identity security devices
Part 1.General characteristics
Part 1.General characteristics
(ISO /IEC 10373-1.2020,MOD)
Released on 2025-02-28
2025-09-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface V
Introduction VII
1 Scope 1
2 Normative references 1
3 Terms, definitions and abbreviations 1
3.1 Terms and Definitions 1
3.2 Abbreviations 3
4 Defaults for test methods 3
4.1 Test Environment 3
4.2 Preprocessing 3
4.3 Test method selection 3
4.4 Default Tolerance 3
4.5 Total measurement uncertainty 3
5 Test Method 3
5.1 Card Warping 3
5.2 Card size 4
5.3 Peel strength 5
5.4 Peel strength including card edge 8
5.5 Chemical resistance 13
5.6 Card Dimensional Stability and Warpage under Temperature and Humidity Conditions 15
5.7 Adhesion or block 16
5.8 Flexural toughness 16
5.9 Dynamic bending stress 18
5.10 Dynamic torsional stress 21
5.11 Opacity 23
5.12 Ultraviolet 23
5.13 X-ray 24
5.14 Height of embossed characters 24
5.15 Heat resistance 25
5.16 Surface distortion, raised areas and sunken areas 26
5.17 Toxic and hazardous substances content 26
6 Test methods for IC cards 26
6.1 Electrical Measurement Conventions for IC Cards with Contacts 26
6.2 IC card measurement device with contacts 26
6.3 IC card with contacts, contact size and position 28
6.4 Mechanical strength of contacts 29
6.5 ESD --- Electrostatic Discharge on IC Cards with Contacts 31
6.6 ESS---Electrostatic stress on PICC and VICC 31
6.7 Surface resistance of IC card contacts with contacts 32
6.8 Surface profile of IC card contacts with contacts 33
6.9 IC card---Mechanical strength. Three rounds of test for IC cards with contacts 35
References 39
Figure 1 Warpage measurement device 4
Figure 2 Quadrant Distribution 5
Figure 3 Card preparation 6
Figure 4 Sample preparation for peel test 7
Figure 5 Sample installed in the tensile tester 7
Figure 6 Peel strength graph recording example 8
Figure 7 Stabilizing plate (top and side views) 9
Figure 8 Guide rail (end view) 9
Figure 9 Card preparation 10
Figure 10 Sample preparation for peel test 10
Figure 11 Sample and stabilizing plate installed in the tensile tester
Figure 12 Example of adjacent negative and positive spikes 11
Figure 13 Peel strength graph recording example 12
Figure 14.Card 17 in the fixture before loading
Figure 15.Card in the fixture during loading 17
Figure 16 Card 18 in the fixture after the load is removed
Figure 17 Dynamic bending test equipment 19
Figure 18 Definition of axis 21
Figure 19 Twist test machine 22
Figure 20 Pressure cycle function 22
Figure 21.Each area for measuring light opacity 23
Figure 22 Card 25 in the clamping device before exposure to temperature
Figure 23 Card 26 in clamping device after exposure to temperature
Figure 24 IC card holder 27
Figure 25 Flat plate 27
Figure 26 The position of the IC card and the flat plate on the fixture 28
Figure 27 Default IC card holder and flat plate 30 with positioning template and steel ball or round tip assembly
Figure 28 Positioning template 30
Figure 29 ESD test circuit 31
Figure 30 ESD test area of PICC or VICC 32
Figure 31 Test probe 33
Figure 32 Measuring probe 34
Figure 33 Measurement line 35 from C1 to C5
Figure 34 Three-round test principle 35
Figure 35 The position of the roller and the initial position of the IC card 36
Figure 36 Position of axis A, axis B and axis C 37
Figure 37 Insertion position of IC card 38
Table 1 Short-term effects of reagent 13
Table 2 Long-term effects of reagents 14
Table 3 Bending dimensions around axis A 20
Table 4 Bending dimensions around axis B 20
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
This document is Part 1 of GB/T 17554.GB/T 17554 has been published in the following parts.
--- Test methods for cards and identity security devices Part 1.General characteristics;
--- Identification card test methods Part 2.Cards with magnetic stripe;
--- Identification card test methods Part 3.Integrated circuit cards with contacts and related interface devices;
--- Identification card test methods Part 7.Proximity cards.
This document replaces GB/T 17554.1-2006 "Identification card test method Part 1.General characteristics test" and
Compared with GB/T 17554.1-2006, in addition to structural adjustments and editorial changes, the main technical changes are as follows.
--- Added terms and definitions such as "basic standard", "electrostatic discharge" and "electrostatic stress" (see 3.1.12, 3.1.13, 3.1.14);
--- Deleted the terms and definitions such as "flammability", "< light> transmittance", "transmittance density" and "normal use" (see 3.12,.2006 edition)
3.13, 3.14, 3.15);
--- Deleted "select the test according to the characteristics presented by the card" (see Table 1 of the.2006 edition);
--- Changed "total measurement uncertainty" to "total measurement uncertainty" (see 4.5, 4.5 of the.2006 edition);
--- Deleted the "flammability" and "static magnetic field" test methods (see 5.10 and 5.14 of the.2006 edition);
--- Added "peel strength including card edge", "surface distortion, raised area and recessed area", "toxic and hazardous substance content" tests
Methods (see 5.4, 5.16, 5.17);
--- Technical improvements have been made to the dynamic bending stress calibration method, and "calibration method" has been added (see 5.9.3, 5.8 of the.2006 edition);
--- Changed the "Opacity" spectral measurement range to meet the requirements of the basic standard GB/T 14916-2022 (see 5.11,.2006
Version 5.11);
--- Added "Test methods for IC cards" (see Chapter 6).
This document is modified to adopt ISO /IEC 10373-1.2020 "Test methods for cards and identity security devices - Part 1.General characteristics"
sex".
This document has the following structural adjustments compared to ISO /IEC 10373-1.2020.
--- Add 5.12 (ultraviolet rays) and 5.17 (toxic and hazardous substances content), delete 3.1.12,
3.1.16, 6.8, Appendix A, Appendix B, Figure 21, Figure 22 and Figure 23;
---3.1.12 corresponds to 3.1.13 in ISO /IEC 10373-1.2020;
---3.1.13 corresponds to 3.1.14 in ISO /IEC 10373-1.2020;
---3.1.14 corresponds to 3.1.15 in ISO /IEC 10373-1.2020;
---5.13 corresponds to 5.12 in ISO /IEC 10373-1.2020;
---5.14 corresponds to 5.13 in ISO /IEC 10373-1.2020;
---5.15 corresponds to 5.14 in ISO /IEC 10373-1.2020;
---5.16 corresponds to 5.15 in ISO /IEC 10373-1.2020;
---6.8 corresponds to 6.9 in ISO /IEC 10373-1.2020;
---6.9 corresponds to 6.10 in ISO /IEC 10373-1.2020.
The technical differences between this document and ISO /IEC 10373-1.2020 and their reasons are as follows.
--- IEC 60749-26 (see 6.5) was replaced by the normative reference GB/T 4937.26 to adapt to my country's technical conditions;
--- ISO 9227 (see 5.5) is replaced by the normative reference GB/T 10125 to adapt to my country's technical conditions;
--- ISO /IEC 7810 (see 5.3.1) is replaced by the normative reference GB/T 14916 to adapt to my country's technical conditions;
--- ISO /IEC 7816-1 (see 6.4.4) is replaced by the normative reference GB/T 16649.1 to adapt to my country's technical conditions;
--- ISO /IEC 7816-2 (see 6.3) is replaced by the normative reference GB/T 16649.2 to adapt to my country's technical conditions;
--- ISO /IEC 10373-2 (see 5.16) was replaced by the normative reference GB/T 17554.2 to adapt to my country's technical conditions;
--- IEC 61000-4-2 (see 6.6.2) was replaced by the normative reference GB/T 17626.2 to adapt to my country's technical conditions;
--- ISO 3696 (see 5.5) was replaced by GB/T 6682 to adapt to my country's technical conditions and included in the references;
--- Deleted two terms and definitions such as "dual interface chip card" and "electrostatic discharge conductivity" (see ISO /IEC 10373-1.2020
3.1.12, 3.1.16);
--- Added normative references to GB/T 39560 (all parts) to provide test for the added "toxic and hazardous substances content" requirement
method;
--- Deleted 3.1.2e of ISO /IEC 10373-1.2020), only memory cards have no practical application in China (see 3.1.2);
---The test method of "light blocking" has been changed to meet the requirements of the supporting basic standard GB/T 14916-2022 and meet the current domestic application status
(See 5.11, 5.11 of ISO /IEC 10373-1.2020);
--- Added two test methods, "ultraviolet rays" (see 5.12) and "toxic and hazardous substances content" (see 5.17), to support the basic standards
Requirements for “light” and “toxicity” in GB/T 14916-2022;
--- Deleted "Additional test methods for electrostatic effects" (see 6.8 of ISO /IEC 10373-1.2020).
The following editorial changes were made to this document.
--- Incorporated the amendments to ISO /IEC 10373-1.2020/Amd1.2023, the outer margin positions of the clauses involved
It is marked with vertical double lines (‖);
--- Deleted the document "ANSI/ESDA/JEDECJS-002" (see ISO /IEC 10373-1.2020) referenced in the informative appendix
Chapter 2 of);
--- Changed the description of abbreviations in 3.2 to comply with the requirements of national standards (see 3.2 of ISO /IEC 10373-1.2020);
--- Changed the duplication of the original index number 2 in Figure 26 (see Figure 28 of ISO /IEC 10373-1.2020);
--- Corrected the editorial error in the original text of 6.4.4."ISO /IEC 7810" should be "ISO /IEC 7816-1", and the corresponding national standard should be changed to
It is "GB/T 16649.1" (see 6.4.4 of ISO /IEC 10373-1.2020).
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed and coordinated by the National Information Technology Standardization Technical Committee (SAC/TC28).
This document was drafted by. China Electronics Technology Standardization Institute, Shenzhen CESI Technology Co., Ltd., the First Research Institute of the Ministry of Public Security, Yilianzhong
Information Technology Co., Ltd., Zhongguancun Xinhai Zeyou Technology Co., Ltd., Unigroup Tongxin Microelectronics Co., Ltd., Zhuhai Hetian Electronic Technology
Co., Ltd., Beijing Zhongke Zodik Electronic Technology Development Co., Ltd., Dongxin Heping Technology Co., Ltd., Jinbonda Co., Ltd., Beijing
China Electronics HuaDa Electronic Design Co., Ltd., China Mobile Communications Corporation Research Institute, China Unicom Group Co., Ltd.,
Hong Electronics (Kunshan) Co., Ltd., Beijing Huahong Integrated Circuit Design Co., Ltd., and Zhuhai Global Times Technology Co., Ltd.
The main drafters of this document are. Jin Qian, Feng Jing, Xiao Peisen, He Lan, Wang Qingzhi, Lou Shuiyong, Chen Longcong, Zhang Kunbao, Xu Muping, Qiao Shenjie,
Li Mengya, Li Zheng, Cao Longtao, Li Chenguang, Shan Zhiwei, Fu Qingqin, You Xiaojun, Lin Boyan, Cheng Wenjie, Han Bo, Ye Xinwen.
The previous versions of this document and the documents it replaces are as follows.
---First published as GB/T 17554-1998 in.1998 and first revised in.2006;
---This is the second revision.
Introduction
Cards and security devices for identity recognition include magnetic stripe cards, integrated circuit cards with contacts, contactless proximity cards,
Contactless proximity objects, etc. For cards and identity recognition security devices with different implementation technologies, my country has successively formulated and issued relevant national
Standards. GB/T 14916 "Physical characteristics of identification cards", GB/T 15120 "Recording technology of identification cards", GB/T 16649 "Collection of identification cards"
GB/T 42756 "Contactless proximity objects for cards and identity recognition security devices" and GB/T 22351 "Contactless proximity objects for identification cards"
The above standards specify the requirements for different implementation technologies.
GB/T 17554 "Test Methods for Cards and Identity Recognition Security Equipment" is a supporting test method standard for the above technical standards.
The implementation technology is planned to consist of five parts.
--- Part 1.General characteristics. The purpose is to provide a standard conformity test for general characteristics of identification cards that comply with GB/T 14916.
Try method.
--- Part 2.Cards with magnetic stripes. The purpose is to provide standard compliance test methods for magnetic stripe cards that comply with GB/T 15120.
--- Part 3.Integrated circuit cards with contacts and related interface devices. The purpose is to provide integrated circuit cards with contacts that comply with GB/T 16649
Provides standard compliance test methods for integrated circuit cards and related interface devices.
--- Part 6.Non-contact proximity objects. The purpose is to provide standards for non-contact proximity objects that comply with GB/T 42756
Compliance test methods.
--- Part 7.Proximity card. The purpose is to provide standard compliance test methods for proximity cards that comply with GB/T 22351.
Test methods for cards and identity security devices
Part 1.General characteristics
1 Scope
This document specifies the requirements for conformity with GB/T 14916 and other standards [such as GB/T 15120 (all parts), GB/T 16649 (all parts)
GB/T 42756 (all parts), GB/T 22351 (all parts), etc.] for testing the general characteristics of cards and identity security equipment
method.
This document applies to the design, manufacture, application and testing of cards and identity security devices.
NOTE 1 The criteria for the tests do not form part of this document but can be found in other national standards.
NOTE 2 The test methods described in this document are intended to be performed individually. A given card is not required to pass all tests in sequence.
2 Normative references
The contents of the following documents constitute essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 4937.26 Mechanical and climatic test methods for semiconductor devices Part 26.Electrostatic discharge (ESD) sensitivity test
Human Body Model (HBM) (GB/T 4937.26-2021, IEC 60749-26.2018, IDT)
GB/T 10125 Artificial atmosphere corrosion test Salt spray test (GB/T 10125-2021, ISO 9227.2017, MOD)
GB/T 14916 Physical characteristics of identification cards (GB/T 14916-2022, ISO /IEC 7810.2019, MOD)
GB/T 16649.1 Identification cards Integrated circuit cards with contacts Part 1.Physical characteristics (GB/T 16649.1-2006,
ISO /IEC 7816-1.1998, MOD)
GB/T 16649.2 Identification cards - Integrated circuit cards with contacts - Part 2.Dimensions and positions of contacts (GB/T 16649.2-
2024,ISO /IEC 7816-2.2007,MOD)
GB/T 17554.2 Identification card test method Part 2.Cards with magnetic stripe (GB/T 17554.2-2015, ISO /IEC
10373-2.2006,IDT)
GB/T 17626.2 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test (GB/T 17626.2-2018,
IEC 61000-4-2.2008, IDT)
GB/T 39560 (all parts) Determination of certain substances in electrical and electronic products
3 Terms, definitions and abbreviations
3.1 Terms and Definitions
The following terms and definitions apply to this document.
3.1.1
testmethod
A method of testing the properties of a tag in order to verify that it complies with certain standards.
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