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GB 3439-1982 English PDF

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GB 3439-1982EnglishRFQ ASK 9 days [Need to translate] General principles of measuring methods of TTL circuits for semiconductor integrated circuits Obsolete GB 3439-1982

PDF similar to GB 3439-1982


Standard similar to GB 3439-1982

GB/T 43770   SAMR 76   SJ/T 11460.6.4   GB/T 43034.2   GB/T 42968.4   GB/T 4377   

Basic data

Standard ID GB 3439-1982 (GB3439-1982)
Description (Translated English) General principles of measuring methods of TTL circuits for semiconductor integrated circuits
Sector / Industry National Standard
Classification of Chinese Standard L56
Word Count Estimation 34,351
Date of Issue 12/31/1982
Date of Implementation 10/1/1983
Adopted Standard IEC 147-2, NEQ