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JJG(SJ)04047-1995 English PDF

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JJG(SJ)04047-1995: (QG-6, QG-16-type high-frequency low-power transistors ft parameter tester test procedures)
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JJG(SJ)04047-1995English319 Add to Cart 3 days [Need to translate] (QG-6, QG-16-type high-frequency low-power transistors ft parameter tester test procedures) JJG(SJ)04047-1995

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Basic data

Standard_ID JJG(SJ)04047-1995 (JJG(SJ)04047-1995)
Description (Translated English) (QG-6, QG-16-type high-frequency low-power transistors ft parameter tester test procedures)
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A56
Word Count Estimation 9,000
Date of Issue 17/6/1905
Drafting Organization Shanghai Radio Instrument Factory
Administrative Organization Ministry of Electronics Industry Research Center of Electronic Measurement and Testing Station
Summary This standard applies to QG-6, QG-16-type high-frequency low-power transistors fr parameter tester test.