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JJF 1894-2021 English PDF

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JJF 1894-2021: Calibration Specification for Calibrators of Semiconductor Curve Tracers
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JJF 1894-2021English579 Add to Cart 4 days [Need to translate] Calibration Specification for Calibrators of Semiconductor Curve Tracers Valid JJF 1894-2021

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Standard similar to JJF 1894-2021

JJF 1234   JJF 1396   JJG 376   JJF 1896   JJF 1897   JJF 1893   

Basic data

Standard ID JJF 1894-2021 (JJF1894-2021)
Description (Translated English) Calibration Specification for Calibrators of Semiconductor Curve Tracers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A56
Word Count Estimation 25,245
Issuing agency(ies) State Administration for Market Regulation

JJF 1894-2021: Calibration Specification for Calibrators of Semiconductor Curve Tracers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Calibrators of Semiconductor Curve Tracers National Metrology Technical Specifications of the People's Republic of China Calibration specification for calibrator of semiconductor tube characteristic diagram instrument Released on 2021-02-23 2021-08-23 implementation Issued by the State Administration for Market Regulation Semiconductor tube characteristic diagram instrument Calibrator calibration specification Replace JJG838-1993 Focal point. National Radio Metrology Technical Committee Main drafting unit. China Electronics Standardization Institute Participating in the drafting. Beijing Ketong Electronic Relay Factory Co., Ltd. China Institute of Metrology Xi'an Institute of Microelectronics Technology This specification entrusts the National Radio Measurement Technical Committee to be responsible for the interpretation The main drafters of this specification. Li Jie (China Electronics Standardization Institute) Liu Chong (China Electronics Standardization Institute) Shan Zhang (China Electronics Standardization Institute) Participating drafters. Cao Yufeng (Beijing Ketong Electronic Relay Factory Co., Ltd.) Gao Ying (China Institute of Metrology) Rao Zhangfei (Xi'an Institute of Microelectronics Technology)

table of Contents

Introduction (Ⅱ) 1 Scope (1) 2 Overview (1) 3 Measurement characteristics (1) 3.1 Output part (1) 3.2 Sampling resistance (1) 3.3 Measurement part (1) 4 Calibration conditions (2) 4.1 Environmental conditions (2) 4.2 Equipment for calibration (2) 5 Calibration items and calibration methods (3) 5.1 Calibration items (3) 5.2 Calibration method (3) 6 Calibration result expression (6) 7 Re-calibration interval (6) Appendix A Original Record Format (7) Appendix B Format of the inner page of the calibration certificate (10) Appendix C Examples of Evaluation of Calibration Uncertainty for Major Items (13) Appendix D Definition of Ports of Calibrator for Semiconductor Tube Characteristic Grapher (20)

Introduction

This specification is based on JJF 1071-2010 "Rules for the Compilation of National Metrology and Calibration Specifications" and JJF 1059.1-2012 "Evaluation and Expression of Measurement Uncertainty" was compiled. This specification is revised on the basis of JJG838-1993 "Transistor Characteristic Graphic Instrument Calibrator". versus Compared with JJG838-1993, in addition to editorial changes, the main technical changes are as follows. --- Modify the name of the specification to "Semiconductor Tube Characteristic Grapher Calibrator Calibration Specification"; ---Revised the calibration items; ---Added the calibration method of the ladder voltmeter; ---Added the calibration method of the ladder ammeter; ---The calibration method of pulse ammeter has been added; ---The uncertainty evaluation method of level measurement is given in the appendix (see appendix C); ---The definition of the calibrator port of the semiconductor tube characteristic diagram instrument is given in the appendix (see appendix D). The release status of previous versions of this specification. ---JJG838-1993. Calibration specification for calibrator of semiconductor tube characteristic diagram instrument

1 Scope

This specification applies to the calibration of the calibrator of the semiconductor tube characteristic diagram instrument.

2 overview

The calibrator of the semiconductor tube characteristic graph instrument (hereinafter referred to as the graph instrument calibrator) is to provide standard voltage source, standard Standard signal such as quasi-current source is a special calibration instrument for calibrating the semiconductor tube characteristic graph instrument. There are currently two main types Type. Ladder normalization graph instrument calibrator and step sampling measurement graph instrument calibrator. Step normalization graph instrument calibration The internal stepped normalization comparison method is used to calibrate the graphical instrument, and the internal calibration instrument of the stepped sampling measurement graphical instrument is used. The step sampling method is used to calibrate the graphic instrument.

3 Metrological characteristics

3.1 Output section 3.1.1 DC voltage a) Output range. 0.01V~5000V; b) Maximum allowable error. ± (0.3%~3%). 3.1.2 DC current a) Output range. 10nA~10A; b) Maximum allowable error. ± (0.3%~3%). 3.2 Sampling resistance a) Range. 0.005Ω~10MΩ; b) Maximum allowable error. ± (0.3%~1%). 3.3 Measurement part 3.3.1 Step voltage normalization transformation a) V0 voltage conversion range. 0.1V~20V; b) Maximum allowable error. ±0.3%. 3.3.2 Step current normalization transformation a) Is current conversion range. 10μA~20A; b) Maximum allowable error. ±0.3%. 3.3.3 Deviation table a) Measuring range. ± (3%~10%); b) Maximum allowable error. ±0.5%. 3.3.4 Step voltage indication a) V0 voltage conversion range. 0.01V/step~10V/step; b) Maximum allowable error. ± (0.3%~1%).

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