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Calibration Specification for Laser Micrometers
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JJF 1663-2017
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Basic data Standard ID | JJF 1663-2017 (JJF1663-2017) | Description (Translated English) | Calibration Specification for Laser Micrometers | Sector / Industry | Metrology & Measurement Industry Standard | Classification of Chinese Standard | A52 | Classification of International Standard | 17.040 | Word Count Estimation | 13,118 | Date of Issue | 2017-11-20 | Date of Implementation | 2018-02-20 | Quoted Standard | JJF 1094-2002 | Regulation (derived from) | AQSIQ Notice 2017 No. 103 | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine | Summary | This standard applies to the calibration of laser micrometers using optical triangulation. |
JJF 1663-2017: Calibration Specification for Laser Micrometers---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Laser Micrometers
National Metrology Technical Specification of the People's Republic
Laser micrometer calibration specification
Released on.2017-11-20
2018-02-20 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
Laser micrometer calibration specification
Focal Point. National Geometric Quantity Engineering Measurement Technology Committee
Main drafting unit. Saibao Metrology and Testing Center, Electronic Fifth Institute, Ministry of Industry and Information Technology
Foshan Saibao Information Industry Technology Research Institute Co., Ltd.
Shaanxi Institute of Metrology
Participated by. Jiangsu Institute of Metrology
Qinghai Province Metrology Testing Institute
China Institute of Metrology
This specification entrusts the National Geometric Quantity Engineering Parametric Measurement Technical Committee to explain
The main drafters of this specification.
Li Jiangyun (Saibao Metrology and Testing Center, The Fifth Institute of Electronics, Ministry of Industry and Information Technology)
Li Shengchun (Foshan Saibao Information Industry Technology Research Institute Co., Ltd.)
Chang Qing (Saibao Metrology and Testing Center, The Fifth Institute of Electronics, Ministry of Industry and Information Technology)
Zhang Hui (Shaanxi Institute of Metrology)
Participate in the drafters.
Wang Xiaofei (Jiangsu Institute of Metrology)
Zhao Yong (Qinghai Province Metrology Testing Institute)
Cui Jianjun (China Institute of Metrology)
table of Contents
Introduction (II)
1 Scope (1)
2 References (1)
3 Overview (1)
4 Measurement characteristics (2)
4.1 Repeatability (2)
4.2 Drift (2)
4.3 indication error (2)
5 Calibration conditions (2)
5.1 Environmental conditions (2)
5.2 Standards and corresponding equipment for calibration (2)
6 Calibration items and calibration methods (2)
6.1 Preparation before calibration (2)
6.2 Repeatability (3)
6.3 Drift (3)
6.4 indication error (3)
7 Expression of calibration results (4)
8 re-study interval (4)
Appendix A Evaluation of Uncertainty of Measurement Results of Laser Micrometers (5)
Appendix B Calibration Certificate Information and Inner Page Format (7)
Introduction
This specification is a metrological specification for the calibration of laser micrometers measured by triangulation.
This specification is written in JJF 1071-2010 "National Metrology Calibration Specification Writing Rules", JJF 1001-
2011 "General Measurement Terms and Definitions", JJF 1059.1-2012 "Measurement Uncertainty Evaluation and Representation"
And based on newly developed metrology specifications.
This specification is the first release.
Laser micrometer calibration specification
1 Scope
This specification applies to the calibration of laser micrometers measured by optical triangulation.
2 reference files
JJF 1094-2002 Measuring instrument characteristic evaluation
For dated references, only dated versions apply to this specification; undated quotations
The latest version (including all amendments) applies to this specification.
3 Overview
Laser micrometer (hereinafter referred to as micrometer) is a measurement principle that uses optical triangulation to measure object displacement.
(size) measuring instrument, mainly by laser light source, lens, optical array receiving part, signal conversion circuit
And so on. The laser beam emitted by the laser source is vertically irradiated onto the surface of the object to be measured to form a spot, and then from the other corner
The laser spot on the surface of the object is imaged and aimed and memorized by the receiving component. When the surface of the object is measured
After the displacement is generated along the direction of the laser axis, the optical array receiving component senses the position change of the spot and changes the amount of change.
It is calculated as the displacement change ΔL, and then the displacement is displayed by the signal conversion system. The working principle is shown in Fig. 1.
Micrometers are mainly used for surface dimensional changes in equipment manufacturing, jitter, sloshing and vibration of high-speed rotating parts.
Non-contact measurement of parameters such as quantity.
Figure 1 Laser micrometer working principle diagram
1- distal position of the object to be tested; 2 - proximal position of the object to be tested; 3-laser; 4-lens;
5-micrometer body; 6-optical array receiving part; 7-control and signal processor and display
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