Search result: GB/T 3352-2012 (GB/T 3352-1994 Older version)
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| GB/T 3352-2012 | English | 949 |
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Synthetic quartz crystal -- Specifications and guide to the use
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GB/T 3352-2012
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| GB/T 3352-1994 | English | 519 |
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Synthetic quartz crystal
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GB/T 3352-1994
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| GB 3352-1982 | English | 279 |
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Synthetic quartz crystal
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GB 3352-1982
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| Standard ID | GB/T 3352-2012 (GB/T3352-2012) | | Description (Translated English) | Synthetic quartz crystal. Specifications and guide to the use | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L21 | | Classification of International Standard | 31.140 | | Word Count Estimation | 43,453 | | Older Standard (superseded by this standard) | GB/T 3352-1994; GB/T 3353-1995; GB/T 6628-1996 | | Quoted Standard | GB/T 2421.1-2008; GB/T 2828.1; GB/T 12273-1996; IEC/TS 61994-1; IEC/TS 61994-2; IEC/TS 61994-3; IEC/TS 61994-4-1; IEC/TS 61994-4-2; IEC/TS 61994-4-3; IEC/TS 61994-4-4 | | Adopted Standard | IEC 60758-2008, MOD | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the frequency control and selection with artificial quartz crystal piezoelectric element raw grain and lumber terms and definitions, technical requirements, measurement methods, inspection rules and user guide. This standard applie |
GB/T 3352-2012
Synthetic quartz crystal. Specifications and guide to the use
ICS 31.140
L21
National Standards of People's Republic of China
Replacing GB/T 3352-1994, GB/T 3353-1995, GB/T 6628-1996
Artificial quartz crystal
Standard and Guide
(IEC 60758.2008, MOD)
Issued on. 2012-11-05
2013-02-15 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Table of Contents
Introduction Ⅲ
1 Scope 1
2 Normative references 1
3 Terms and definitions
4 original synthetic quartz crystal growth technology requirements 4
4.1 standard value 4
4.2 Requirements and measurement methods 6
4.3 mark 11
5 artificial quartz crystal material technical requirements 11
5.1 Standard value 11
5.2 Requirements and methods of measurement 12
5.3 Delivery conditions 12
6 synthetic quartz crystal and lumber inspection Rule 12
Inspection rules 6.1 original synthetic quartz crystal growth 12
6.2 artificial quartz crystal material inspection rules 14
7 artificial quartz crystal Guide 14
7.1 Overview 14
7.2 The shape and size of the artificial quartz crystal 15
7.3 standard method for identifying quality synthetic quartz crystal 15
7.4 Other methods of testing the quality of synthetic quartz crystal 16
7.5 α level 17
7.6 only used when ordering the optional levels. inclusion, corrosion tunnel, Al content 17
7.7 Order 18
Appendix A (informative) inclusions common sampling procedure 27
Annex B (informative) inclusions density calculation Example 29
Annex C (informative) inclusions density standard sample selected sample 30
Annex D (informative) Description of the 31-point caliper
Annex E (informative) Infrared absorption coefficient α value compensation 32
Annex F (informative) This standard and IEC 60758.2008 technical differences and their reasons 35
References 37
1 synthetic quartz crystal with over 18 Z-cut cross-sectional seed growth diagram
The name and face of the shaft 2 of the quartz crystal 19
Figure 3 AT-cut, small rhombohedral cut, X-cut, Y-cut and Z-cut wafer dicing typical example 20
4 test sample frequency - temperature characteristics of 21
5 Quartz names and faces of the body axis 21
Figure 6 X axial dimension smaller Z-cut seed the growth of synthetic quartz crystal 22
7 early 1970s, the relationship between sample 23 and the Q value of infrared absorption coefficient between the synthetic quartz crystal
8 artificial quartz crystal material shape and size (X-axis, Y-axis and Z-axis direction) 23
9 plane angle deviation 24
10 with respect to the Z-axis or Z 'axis dimension seed center position 25
Figure D.1 point caliper 31
Figure D.2 digital point caliper 31
32 Figure E.1 Measurement schematic
Figure E.2 In α3500, α3585 and α3410 three wave number, α measure the mean value curve 34
Table 1 Inclusion density level 5
Table 2 Infrared Grade 5
Table 3 etch channel density level 6
Table 4 A group (batch test) test conditions and requirements 13
Table 5 Group B (batch test) test conditions and requirements 13
Table 6 batch test requirements and test conditions 14
Table E.1 α3585 corrected data Example 33
Table E.2 α3500 corrected data Example 33
Table E.3 α3410 corrected data Example 34
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
This standard replaces GB/T 3352-1994 "artificial crystal", GB/T 3353-1995 "artificial quartz crystal Guide" and
GB/T 6628-1996 "artificial quartz crystal material", and GB/T 3352-1994, GB/T 3353-1995 and GB/T 6628-
Compared to 1996, the main changes are as follows.
--- Increased 17 terms and definitions;
--- Original inclusion density levels Ⅰa Ⅰb level to level, redefining Ⅰa level;
--- Quality level Aa infrared wave number three level limits are fine-tuning;
--- Etch channel density level to remove 5, and increasing the level 1a 1aa level;
Measurement Method --- α value by only provides a way to read two ways, you can choose one;
--- Add data to a standard sample compensation α value measurement method;
--- Revised GB/T 3352-1994 and GB/T 6628-1996 sampling program;
--- GB/T 3352-1994 Appendix A is written to standard text content, Appendix A to the "common inclusions sampling procedures";
--- Added Appendix B, Appendix C, Appendix D, Appendix E and Appendix F.
This standard uses redrafted law revision adopted IEC 60758.2008 "Specification for artificial quartz crystal User Guide" (English version).
This standard and IEC 60758.2008 technical differences exist compared to the terms of these differences has been involved through its outer margin bits
Opposing vertical single line (|) were marked. Appendix F gives a list of corresponding technical differences and their causes.
This standard also made the following editorial changes.
--- Pressure value and unit "Atm" in terms of the International System of Units and unit value "MPa";
--- Angle "35.25 °" to "35 ° 15 '";
--- Tables in Appendix E E.3 fifth line to the left of "0.2148" to "0.2194."
The standard proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This standard by the national focal point for frequency control and selection piezoelectric Standardization Technical Committee (SAC/TC182) devices.
This standard was drafted. Dan Jingguang Beijing Science and Technology Co., China Electronic Materials Industry Association Branch of the piezoelectric crystal materials, in
State CESI, Shimmering Crystal Technology Co., Ltd. special.
The main drafters of this standard. Zhao Xiong Zhang, Zhang Yi, T., Wang Xiaogang, dried and infidelity.
This standard replaces GB/T 3352-1994, GB/T 3353-1995 and GB/T 6628-1996.
The previous versions of GB/T 3352-1994 release case.
GB 3352-1982, GB/T 3352-1994;
The previous versions of GB/T 3353-1995 release case.
GB 3353-1983, GB/T 3353-1995;
The previous versions of GB/T 6628-1996 release case.
GB 6628-1986, GB/T 6628-1996.
Artificial quartz crystal
Standard and Guide
1 Scope
This standard specifies the frequency control and selection of the piezoelectric element Terminology and definitions for synthetic quartz crystal raw material and manufacturing, technical requirements, measurements
Methods, inspection rules and usage guidelines.
This standard applies to the manufacture of frequency control and selection of the piezoelectric element with an artificial quartz crystal.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 2421.1-2008 Environmental testing for electric and electronic products overview and guidance (IEC 60068-1. 1988, IDT)
GB/T 2828.1 Sampling procedures for inspection - Part 1. by acceptance quality limit (AQL) retrieval batch inspection sampling plan
(GB/T 2828.1-2003, ISO 2859-1.1999, IDT)
GB/T 12273-1996 crystal element quality assessment system for electronic components - Part 1. Generic specification
(IEC 1178-1.1993, IDT)
IEC 61994 (all parts) for frequency control and selection of the piezoelectric and dielectric devices terminology (Piezoelectricanddielectric
devicesforfrequencycontrolandselection-Glossary)
3 Terms and Definitions
IEC 61994 define the following terms and definitions apply to this document.
3.1
Hydrothermal crystal growth method hydrothermalcrystalgrowth
At high temperature and pressure, water in crystal growth. Crystal growth process is considered to be geological processes in the Earth's crust. Industrial
Synthetic quartz growth is equipped with an alkaline solution in an autoclave under supercritical temperature (330 ℃ ~ 400 ℃) and pressure (70MPa ~
200MPa) performed. The autoclave is divided into two areas, in the higher temperature zone of quartz fragments containing dissolved raw material, low temperature growth area is equipped with
Seed (see 7.1.2).
3.2
Artificial quartz crystal syntheticquartzcrystal
Hydrothermal quartz single crystal grown by α. It is the left or right under the original crystal growth conditions.
3.21
Original synthetic quartz crystal growth as-grownsyntheticquartzcrystal
Hydrothermal quartz single crystal grown by α. Growth is original without any post-growth processing (but except for the Process Quality Control) crystal
State, referred to as the original crystal.
3.2.2
Native Area Y rods as-grownY-bar
The Y direction as seed crystals grown maximum size.
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