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GB/T 15244-2013: Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
Status: Valid GB/T 15244: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 15244-2013 | English | 209 |
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Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
| Valid |
GB/T 15244-2013
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| GB/T 15244-2002 | English | 279 |
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Glass of quantitative electron probe analysis method
| Obsolete |
GB/T 15244-2002
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| GB/T 15244-1994 | English | 199 |
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Quantitative analysis method of electron probe on glasses
| Obsolete |
GB/T 15244-1994
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PDF similar to GB/T 15244-2013
Basic data | Standard ID | GB/T 15244-2013 (GB/T15244-2013) | | Description (Translated English) | Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Classification of International Standard | 71.040.40 | | Word Count Estimation | 9,974 | | Older Standard (superseded by this standard) | GB/T 15244-2002 | | Quoted Standard | GB/T 4930-2008; GB/T 17359-2012; GB/T 17366; GB/T 28634-2012 | | Regulation (derived from) | National Standards Bulletin 2013 No. 10 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies: electron microprobe analyzer (EPMA) and scanning electron microscopy (SEM) X -ray spectrometer (WDS) and energy dispersive spectroscopy (EDS) for silicate glass quantitative analysis methods. This standard applies to silicate glas | GB/T 15244-2013: Microbeam analysis -- Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
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Microbeam analysis. Quantitative analysis of silicate glass by wavelength dispersive X-ray spectrometry and energy dispersive X-ray spectrometry
ICS 71.040.40
G04
National Standards of People's Republic of China
Replacing GB/T 15244-2002
Microbeam analysis quantitative analysis of silicate glass
Spectroscopy and spectroscopy
Issued on. 2013-07-19
2014-03-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
This standard replaces GB/T 15244-2002 "electron probe quantitative analysis method of Glass"
This standard compared with GB/T 15244-2002 main changes as follows.
--- To increase the selection principles of the standard sample (see 5.1 and 5.2);
--- Delete 5.3 (K-44) and (K-45);
--- Increased requirements after sample preparation (see 6.1);
--- Modify the sample and standard samples deposited conductive film specific requirements (see 6.3);
--- Modify the quantitative analysis instrument before boot time requirements (see 7.1.1);
--- Added "analysis region is large, you can also use a coaxial optical microscope electron microprobe analysis to determine the site" (see 7.14);
--- Accelerating voltage selection increases the overvoltage ratio requirements by modifying the atomic number of different accelerating voltage selection method (see 7.2.1);
--- Increased silicon drift EDS (SDD) of the beam selection method (see 7.2.2);
--- Increasing the electron beam scanning method for analyzing unstable glass (see 7.2.3);
--- Atomic number range of options to modify the X-ray line system (see 7.2.4);
--- Increased SDD spectrometer measurement conditions (see 7.3.3);
--- Increasing the X-ray intensity in the measurement time of less than 1% of the requirements (see 7.3.5);
--- Increasing the difference between the measurement of light elements (see 8.2);
--- Adds no standard EDS quantitative analysis method (see 8.4).
The standard micro-beam analysis by the National Standardization Technical Committee (SAC/TC38) and focal points.
This standard was drafted. Shanghai Institute of Ceramics, Chinese Academy of Sciences.
The main drafters of this standard. Li Xiangting, Zeng Yi, Wu Wei.
This standard replaces the standards previously issued as follows.
--- GB/T 15244-2002.
Microbeam analysis quantitative analysis of silicate glass
Spectroscopy and spectroscopy
1 Scope
This standard specifies the electron probe analyzer (EPMA) and scanning electron microscopy (SEM) X-ray spectrometer (WDS) and energy dispersive spectroscopy
(EDS) for quantitative analysis of silicate glass.
This standard applies to silicate glass samples (including alkali metal silicate glass) spectroscopy (WDX) and spectroscopy (EDX) fixed
Quantitative analysis.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 4930-2008 electron probe microanalysis standard specimen technical conditions Guidelines
GB/T 17359-2012 micro beam analysis Spectroscopy Quantitative Analysis
Electron microprobe GB/T 17366 of mineral and rock specimen preparation
GB/T 28634-2012 micro beam analysis electron probe microanalysis bulk sample spectrum Quantitative point analysis
3 Terms and Definitions
The following terms and definitions apply to this document.
3.1
Field mobility field-inducedmigration
The internal electric field in the insulator by an electron or ion bombardment caused by the effects of migration of atoms occurs.
3.2
Silicate glass silicateglass
Silica glass as a main component. The most commonly used soda lime silicate glass, soda aluminosilicate glass, sodium borosilicate glass,
Architectural glass, household glass, most optical glass, glass fibers and the like.
3.3
Ion transport ionmigration
In the electron beam irradiation, the sample ions of certain elements of the mobile electron beam spot phenomenon.
3.4
Migration components migrationcomposition
In the electron beam irradiation, ion transport elements of the sample occurs.
3.5
Dynamic Measurement dynamicmeasurement
X-ray intensity in the measurement sample while the sample method of a mobile station or the electron beam irradiation point.
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