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Std ID |
Description (Standard Title) |
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SJ 21096-2016
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(Printed board environmental test method)
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SJ 21097-2016
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(Printed board cleanliness test method and requirements)
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SJ 21098-2016
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(Printed board micro - cutting method and requirements)
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SJ 21100-2016
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(Specification for Leakage Cable for DFYJ-3-3 Type)
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SJ 21102-2016
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(General specification for aluminum nitride piezoelectric films)
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SJ 21103-2016
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(General specification for fiber optic acousto - optic devices)
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SJ 21104-2016
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(General specification for electromechanical automatic leveling system)
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SJ 21105-2016
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(Specification for XTG - 10A Type Fiber Optic Gyroscope)
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SJ 21106-2016
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(Specification for soft thermal insulation materials)
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SJ 21107-2016
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(Performance requirements and test methods for military radar RF digital receivers)
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SJ 21108-2016
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(Simulation requirements for numerical control machining of military electronic equipment)
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SJ 21109-2016
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(General Requirements for Digital Technology of Military Electronic Equipment Based on 3D Digital Prototype)
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SJ 21110-2016
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(Design of military electronic equipment structure from top to bottom)
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SJ 21111-2016
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(Technical requirements for virtual assembly of military electronic equipment)
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SJ 21112.1-2016
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(General rules for 3D modeling of military electronic equipment - Part 1: General requirements)
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SJ 21112.2-2016
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(General rules for 3D modeling of military electronic equipment - Part 2: Part modeling)
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SJ 21112.3-2016
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(General rules for 3D modeling of military electronic equipment - Part 3: Assembly modeling)
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SJ 21113-2016
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(Military electronic equipment 3D CAD dataset requirements)
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SJ 21114-2016
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(General rules for digital prototypes of military electronic equipment structures)
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SJ 21115-2016
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(Monolithic rotary development/cleaning machine general specification)
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SJ 21116-2016
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(Raw porcelain laser cutting machine general specification)
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SJ 21117-2016
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(General specification for fully automatic chip stickers)
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SJ 21118-2016
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General specification for double sides flying probe test system
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SJ 211-1966
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(Rules for the radio industry and special equipment design documents (Trial))
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SJ 21120-2016
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(Specification for semi - insulating gallium arsenide polishing sheet for high electron mobility transistors)
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SJ 21121-2016
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(Specification for PVTCdSN1/T-BP01 type cadmium sulfide single crystal polishing sheet)
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SJ 2112-1982
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Prefered electrical matching values for interconnection of loudspeaker systems for halls and parlors
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SJ 21122-2016
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(Specification for PVTSiC76SI1-BP01 type silicon carbide single crystal polishing sheet)
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SJ 21124-2016
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(General specification for low temperature co - fired ceramic discharge sintering furnaces)
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SJ 21125-2016
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(Specification for thick film chain sintering furnaces)
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SJ 21126-2016
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(General specification for laser dampers)
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SJ 21127-2016
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(General specification for chemical mechanical polishing machines)
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SJ 21128-2016
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(General specification for horizontal plasma chemical vapor deposition equipment (PECVD))
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SJ 21129-2016
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(General specification for metal organic chemical vapor deposition equipment (MOCVD))
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SJ 21130-2016
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(General specification for plasma etching machines)
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SJ 21131-2016
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(General specification for reactive ion etching machines)
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SJ 21132-2016
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(Specification for rope - type travel sensors)
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SJ 21133-2016
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(General specification for load cell)
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SJ 21134-2016
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(Specification for WXF0812-L16 Low Noise Amplifier Chip)
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SJ 21135-2016
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(Specification for WXF0812-L17 Low Noise Amplifier Chip)
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SJ 21136-2016
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(Specification for single - pole three - throw switch chip for WXK0812-103)
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SJ 21137-2016
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(Specification for WXD0812-06 Type Six - digit Control Attenuator Chip)
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SJ 21138-2016
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(Specification for WXX0812-C15 Limiter Chip)
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SJ 21139-2016
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(General specification for naval shore base standard display console)
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SJ 21140.1-2016
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(Military command and control equipment - Safety design requirements - Part 1: General guidelines)
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SJ 21140.2-2016
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(Military command and control equipment - Safety design requirements - Part 2: Electrical and electronic design requirements)
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SJ 21140.3-2016
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(Military command and control equipment - Safety design requirements - Part 3: Lightning protection design requirements)
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SJ 21140.4-2016
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(Military command and control equipment - Safety design requirements - Part 4: Mechanical structural design requirements)
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SJ 21140.5-2016
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(Military command and control equipment - Safety design requirements - Part 5: Thermal design requirements)
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SJ 21141.1-2016
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(Military software C/C ++ Programming requirements Part 1: General)
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SJ 21141.2-2016
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(Military software C/C ++ Programming requirements Part 2: Program structure and layout design)
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SJ 21141.3-2016
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(Military software C/C ++ Programming requirements Part 3: Naming, defining and declaring)
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SJ 21141.4-2016
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(Military software C/C ++ Programming requirements Part 4: Preprocessing, expressions and basic statements)
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SJ 21141.5-2016
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(Military software C/C ++ Programming requirements - Part 5: Functions, pointers and classes)
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SJ 21142.1-2016
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(Military Software Quality Metrics - Maintenance Part 1: Indicator System)
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SJ 21142.2-2016
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(Military Software Quality Metrics - Maintenance Part 2: Metrics)
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SJ 21142.3-2016
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(Military software - Quality measures - Maintenance - Part 3: Test methods)
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SJ 21143.1-2016
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(Military Software Quality Measurement - Portability Part 1: Indicator System)
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SJ 21143.2-2016
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(Military Software Quality Metrics - Portability Part 2: Metrics)
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SJ 21143.3-2016
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(Military Software Quality Metrics - Portability Part 3: Test Methods)
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SJ 21144.1-2016
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(Military Software Quality Measurement - Ease of Use Part 1: Indicator System)
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SJ 21144.2-2016
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(Military Software Quality Metrics - Ease of Use Part 2: Metrics)
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SJ 21144.3-2016
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(Military software quality metrics - ease of use - Part 3: Test methods)
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SJ 21145.1-2016
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(Military Software Quality Measurement - Efficiency Part 1: Indicator System)
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SJ 21145.2-2016
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(Military Software Quality Measurement - Efficiency Part 2: Measurement Methods)
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SJ 21145.3-2016
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(Military Software Quality Metrics - Efficiency Part 3: Test Methods)
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SJ 21147.1-2016
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(Military integrated circuits - Electromagnetic emission measurement methods - Part 1: General conditions and definitions)
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SJ 21147.2-2016
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(Military integrated circuits - Electromagnetic emission measurement methods - Part 2: Radiation emission measurements - TEM cells and broadband TEM chamber)
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SJ 21147.3-2016
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(Methods of measurement for electromagnetic emission of military integrated circuits - Part 3: Radiation emission measurements - Surface scanning)
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SJ 21147.4-2016
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(Methods of measurement for electromagnetic emission of military integrated circuits - Part 4: Conducted emission measurements - 1Ω/150Ω direct coupling method)
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SJ 21147.5-2016
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(Methods of measurement for electromagnetic emission of military integrated circuits - Part 5: Conducted emission measurements - Workbench Faraday cage method)
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SJ 2124-1982
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Resilient tube couplers
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SJ 2125-1982
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Cross block couplers
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SJ 2126-1982
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Bellow couplers
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SJ 2127-1982
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Film couplers
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SJ 2130-1982
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Interior graduation for cathode-ray tubes
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SJ 2131-1982
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General specification for clean work stations
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SJ 2133-1982
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Method of accelerated life test for oxide cathode
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SJ 2137-1982
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General procedures of measurement for silicon current-regulator diodes
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SJ 2138-1982
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Methods of measurement for regulated current of silicon current regulator diodes
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SJ 2139-1982
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Methods of measurement for dynamic impedance of silicon current regulator diodes
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SJ 2140-1982
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Methods of measurement for limiting voltage of silicon current regulator diodes
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SJ 2141-1982
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Methods of measurement for breakdown voltage of silicon currenet regulator diodes
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SJ 2142-1982
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Methods of measurement for current temperature coefficient of silicon current regulator diodes
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SJ 2146-1982
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(Silicon Transistor steady flow test method General)
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SJ 2147-1982
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(Silicon transistor stable steady flow of current test methods)
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SJ 2148-1982
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Methods of measurement for dynamic impedance of silicon current regulator transistors
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SJ 2149-1982
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(Steady flow silicon transistor threshold voltage of the test method)
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SJ 2150-1982
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(Silicon transistor breakdown voltage steady flow test method)
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SJ 2151-1982
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(Silicon transistor current steady flow test method temperature coefficient)
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SJ 2152-1982
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Sintered solf-oiling bearings
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SJ 2154-1982
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Miorocrystal glass substrates for use in thick film integrated circuits
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SJ 2168-1982
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Epoxy powder for coatings
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SJ 2169-1982
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Epoxy powder for coatings
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SJ 2170-1982
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Basic method for transport packages of general electronic products--General procedu
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SJ 2176-1982
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Test method for moisture transmission rate of moisture-proof containers of electronic products
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SJ 2179-1982
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Terms for piezoelectric filters
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SJ 2180-1982
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(Piezoelectric filters electrical performance test methods)
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SJ 2181-1982
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(Piezoelectric filter type designation)
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SJ 2182-1982
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Generic specification for piezoelectric filters
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