SJ 2133-1982 PDF English
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Basic data
| Standard ID | SJ 2133-1982 (SJ2133-1982) |
| Description (Translated English) | Method of accelerated life test for oxide cathode |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | L39 |
| Word Count Estimation | 13,170 |
| Date of Issue | 8/6/1982 |
| Date of Implementation | 1/1/1983 |
| Regulation (derived from) | Industry-Science (2010) No. 77 |
| Summary | This standard specifies the use of the experimental diode (SJ 1381-78) of the oxide cathode accelerated life test method, which estimates the cathode operating life under normal conditions. |