SJ 2141-1982 English PDFUS$199.00 ยท In stock
Delivery: <= 2 days. True-PDF full-copy in English will be manually translated and delivered via email. SJ 2141-1982: Methods of measurement for breakdown voltage of silicon currenet regulator diodes Status: Obsolete
Basic dataStandard ID: SJ 2141-1982 (SJ2141-1982)Description (Translated English): Methods of measurement for breakdown voltage of silicon currenet regulator diodes Sector / Industry: Electronics Industry Standard Classification of Chinese Standard: L41 Word Count Estimation: 1,126 Date of Issue: 8/20/1982 Date of Implementation: 1/1/1983 Regulation (derived from): Industry-Science (2010) No. 77 |
