| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ/T 11706-2018 | English | 669 |
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Days<=7
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Semiconductor integrated circuits test methodof field programmable gate array
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SJ/T 11706-2018
| Valid |
SJ/T 11706-2018
|