| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ/T 10481-1994 | English | 319 |
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Days<=3
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Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques
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SJ/T 10481-1994
| Obsolete |
SJ/T 10481-1994
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