| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ 20789-2000 | English | 179 |
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Days<=2
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Rapid screening test methods for Thermal sensitive parameter of MOS field effect transistor
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SJ 20789-2000
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SJ 20789-2000
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