| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| JC/T 2133-2012 | English | 289 |
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Determination of impurities in silica sol for polishing solution in semiconductor industry. Inductively coupled plasma atomic emission spectrometric method
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JC/T 2133-2012
| Valid |
JC/T 2133-2012
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