| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 4937.4-2012 | English | 154 |
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Days<=3
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Semiconductor devices -- Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
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GB/T 4937.4-2012
| Valid |
GB/T 4937.4-2012
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