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www.ChineseStandard.net Database: 189759 (26 Oct 2025)

YS/T 1755-2025 English PDF

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
YS/T 1755-2025EnglishRFQ ASK 3 days [Need to translate] Determination of Total Metal Content and Impurities in Polycrystalline Silicon - Inductively Coupled Plasma Mass Spectrometry Valid YS/T 1755-2025

Basic data

Standard ID YS/T 1755-2025 (YS/T1755-2025)
Description (Translated English) Determination of Total Metal Content and Impurities in Polycrystalline Silicon - Inductively Coupled Plasma Mass Spectrometry
Sector / Industry Nonferrous Metallurgy Industry Standard (Recommended)
Classification of Chinese Standard H17
Classification of International Standard 77.04
Date of Issue 2025-04-10
Date of Implementation 2025-11-01
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies a method for determining the total metal content in fluidized bed particulate silicon using inductively coupled plasma mass spectrometry (ICP-MS). This document applies to the determination of total metal content, such as iron, chromium, nickel, copper, sodium, magnesium, aluminum, potassium, calcium, zinc, titanium, molybdenum, tungsten, and cobalt, in fluidized bed particulate silicon. The detection range for each element is 0.05 ng/g to 50 ng/g.

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