| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| SN/T 2011-2007 | English | 319 |
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Electronic (capacitive) testing method for raw silk
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SN/T 2011-2007
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Basic data | Standard ID | SN/T 2011-2007 (SN/T2011-2007) | | Description (Translated English) | Electronic (capacitive) testing method for raw silk | | Sector / Industry | Commodity Inspection Standard (Recommended) | | Classification of Chinese Standard | W40 | | Classification of International Standard | 59.060.10 | | Word Count Estimation | 8,875 | | Date of Issue | 2007-12-24 | | Date of Implementation | 2008-07-01 | | Quoted Standard | GB/T 1798-2001; GB/T 8170 | | Regulation (derived from) | National-accreditation-Science [2011] 63 | | Issuing agency(ies) | General Administration of Customs | | Summary | This standard specifies the use of capacitive electronic detector for raw silk for defect detection and classification method. This standard applies to 13D ~ 69D specifications of twisted silk dress and cartridges detection. | SN/T 2011-2007: Electronic (capacitive) testing method for raw silk---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Electronic (capacitive) testing method for raw silk
Exit inspection and quarantine industry standard book People's Republic of China
Raw silk electronic (capacitive) detection method
Posted 2007-12-24
2008-07-01 implementation
People's Republic of China
The State Administration of Quality Supervision, Inspection and Quarantine released
Foreword
Appendix A of this standard is an informative annex.
This standard is proposed and managed by the National Certification and Accreditation Administration Committee.
This standard was drafted. People's Republic of China Zhejiang Exit Inspection and Quarantine.
The main drafters of this standard. pull locked Dong, Xu Jin, Hu Wei, Wei Junling.
This standard is the first release of the entry-exit inspection and quarantine industry standards.
Raw silk electronic (capacitive) detection method
1 Scope
This standard specifies the use of capacitive electronic detector for detecting raw silk and defect classification method.
This standard applies to 13D ~ 69D specifications of twisted silk dress and testing cartridges.
2 Normative references
The following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent
Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research
Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard.
GB/T 1798-2001 Test methods for raw silk
GB/T 8170 numerical rounding rules
3 Terms and Definitions
The following terms and definitions apply to this standard.
3.1
Electronic detector raw silk yarn faults were detected and fineness.
3.2
Test sample length under the weight of the unit.
3.3
Quality samples tested by more than 100% of the average sample quality testing, a length greater than or equal 1mm or more defects.
3.4
Quality samples tested by more than 35% to 100% of the average sample quality testing, defect length greater than or equal 10mm.
3.5
It is lower than the quality of the test sample 40% of the average sample quality testing, defect length greater than or equal 10mm.
3.6
Snow rough defect IPM
Quality test sample is larger than 40% to 250% by mass of normal test sample, not included in the rough defect tiny defects.
3.7
The relative percentage of the test sample and set the center fineness fineness is.
4 detection principle
This standard capacitive detection, causing changes in electricity consumption comparison with the standard value by the capacitance sensor as the detection sample medium,
Calculate the defect size and the fineness variation.
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