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SN/T 2004.4-2006: Determination of Lead, Cadmium, Chromiun and Mercury in electrical and electronic equipment. Part 4: Inductively coupled plasma atomic emission spectrometric method
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Determination of Lead, Cadmium, Chromiun and Mercury in electrical and electronic equipment. Part 4: Inductively coupled plasma atomic emission spectrometric method
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SN/T 2004.4-2006
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Basic data | Standard ID | SN/T 2004.4-2006 (SN/T2004.4-2006) | | Description (Translated English) | Determination of Lead, Cadmium, Chromiun and Mercury in electrical and electronic equipment. Part 4: Inductively coupled plasma atomic emission spectrometric method | | Sector / Industry | Commodity Inspection Standard (Recommended) | | Classification of Chinese Standard | L04 | | Classification of International Standard | 31.020 | | Word Count Estimation | 13,143 | | Date of Issue | 2006-04-25 | | Date of Implementation | 2006-11-15 | | Quoted Standard | GB/T 602; GB/T 6682-1992 | | Regulation (derived from) | Industry Standard Notice 2006 No. 7 (No. 79 overall) | | Issuing agency(ies) | General Administration of Customs | | Summary | This standard specifies the inductively coupled plasma atomic emission spectrometry (ICP-AES) Determination of polymer electronic products (except PTFE), metal materials, electronic components, lead (Pb), cadmium (Cd), chromium (Cr) and mercury (Hg) method. This standard applies to electrical and electronic products Polymer (except PTFE), metal materials, electronic components, lead (Pb), chromium (Cr) and mercury (Hg) the determination of the detection limit of each element as shown in Table 1 shown. | SN/T 2004.4-2006: Determination of Lead, Cadmium, Chromiun and Mercury in electrical and electronic equipment. Part 4: Inductively coupled plasma atomic emission spectrometric method
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Determination of Lead, Cadmium, Chromiun and Mercury in electrical and electronic equipment. Part 4. Inductively coupled plasma atomic emission spectrometric method
Book of the People's Republic of China Entry and Exit Inspection and Quarantine
Determination of lead, cadmium, chromium and mercury in electrical and electronic products
Part 4. Inductively coupled plasma
Atomic emission spectroscopy
Released on.2006-04-25
Implementation of.2006-11-15
People's Republic
The General Administration of Quality Supervision, Inspection and Quarantine issued
Content
Foreword III
1 Scope 1
2 Normative references 1
3 Method Summary 1
4 reagent 1
5 Instruments and materials 2
6 Sample Preparation 2
7 Analysis step 3
8 analysis results calculation 4
9 Report 4
Appendix A (informative) Microwave digestion furnace working conditions 5
Appendix B (informative) Instrument working conditions 6
Appendix C (informative) Standard solution 6
Appendix D (informative) Spectral interference of lead, cadmium, chromium and mercury wavelengths 7
Foreword
This part is the fourth part of SN/T 2004.
Appendix A, Appendix B, Appendix C and Appendix D of this part are informative annexes.
This part is proposed and managed by the National Certification and Accreditation Administration.
This part is drafted by the Guangdong Entry-Exit Inspection and Quarantine Bureau of the People's Republic of China, Shenzhen Entry-Exit Inspection and Quarantine
Bureau of the People's Republic of China, Liaoning Entry-Exit Inspection and Quarantine Bureau, Shanghai Entry-Exit Inspection and Quarantine Bureau of the People's Republic
The main drafters of this section. Zhong Zhiguang, Liu Chonghua, Zhang Haifeng, Liu Zhihong, Yan Junwen, Chen Peiling, Li Zhengjun, Chen Wei, Zhang Zhenkun,
Zheng Jianguo, Zhang Shaoping, Chen Zhiyong.
This section is the first industry standard for entry-exit inspection and quarantine.
Determination of lead, cadmium, chromium and mercury in electrical and electronic products
Part 4. Inductively coupled plasma
Atomic emission spectroscopy
Warning. Personnel using this section should have hands-on experience in formal laboratory work. This section does not address all possible security issues.
It is the responsibility of the user to take appropriate safety and health measures and to ensure compliance with the relevant national regulations.
1 Scope
This section specifies inductively coupled plasma atomic emission spectrometry (ICP-AES) for the determination of polymers for electrical and electronic products (polytetrafluoroethylene).
A method of lead (Pb), cadmium (Cd), chromium (Cr) and mercury (Hg) in metal materials and electronic components.
This section applies to polymers (excluding polytetrafluoroethylene) for electronic and electrical products, lead (Pb), cadmium (Cd) in metal materials and electronic components.
For the determination of chromium (Cr) and mercury (Hg), the detection limits of each element are shown in Table 1.
Table 1 Detection limits of each element of the method
Element Pb Cd Cr Hg
Detection limit/(mg/kg) 10 5 5 20
2 Normative references
The terms in the following documents become the terms of this section by reference in this section. All dated references, followed by all
Modifications (not including errata content) or revisions do not apply to this section, however, parties to agreements based on this section are encouraged to study
Is it possible to use the latest version of these files? For undated references, the latest edition applies to this section.
Preparation of standard solution for GB/T 602 chemical reagent impurity determination
GB/T 6682-1992 Analytical laboratory water specifications and test methods
General rules for inductively coupled plasma atomic emission spectrometry of GB/T 10725 chemical reagents
JJG015-1996 Inductively coupled plasma atomic emission spectrometer verification procedure
3 Method summary
For polymers (except polytetrafluoroethylene) and some electronic components in electronic and electrical products, high temperature pressure sealed digestion tanks and microwave digestion
Sample processing such as furnace; for metal materials and some electronic components in electronic and electrical products, samples are directly processed by conventional acid wet digestion
deal with. Lead, cadmium, chromium and mercury in the treated sample solution were measured by inductively coupled plasma atomic emission spectrometry.
4 reagents
This part uses excellent grade pure reagents except for special regulations. The experimental water should meet the requirements of 4.2 of GB/T 6682-1992.
Grade water.
4.1 Nitric acid (ρ = 1.42 g/mL, 65%).
4.2 Nitric acid solution (犞/犞, 5+95).
4.3 Hydrogen peroxide (ρ = 1.10 g/mL, 30%).
4.4 Tetrafluoroboric acid solution. HBF 450%.
4.5 Hydrochloric acid (ρ = 1.19 g/mL, 37%).
4.6 Cadmium standard solution containing Cd concentration of 1000μg/mL.
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