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Database: 189759 (26 Oct 2025)
SJ/T 10739-1996 English PDF
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Standard Title (Description)
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SJ/T 10739-1996
English
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Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
Obsolete
SJ/T 10739-1996
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Basic data
Standard ID
SJ/T 10739-1996 (SJ/T10739-1996)
Description (Translated English)
Semiconductor integrated circuits - General principles of measuring methods for MOS random access memories
Sector / Industry
Electronics Industry Standard (Recommended)
Classification of Chinese Standard
L56
Word Count Estimation
32,333
Date of Implementation
1/1/1997
Older Standard (superseded by this standard)
GB 3443-1982
Adopted Standard
IEC 60147-2, NEQ
Regulation (derived from)
Industry-Science (2010) No. 77
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