HOME
Cart(0)
Quotation
About-Us
Policy
PDFs
Standard-List
www.ChineseStandard.net
Database: 189759 (26 Oct 2025)
SJ 20831-2002 English PDF
US$389.00 ยท In stock
Delivery: <= 3 days.
True-PDF full-copy in English will be manually translated and delivered via email.
SJ 20831-2002
: Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly
Status: Valid
Standard ID
Contents [version]
USD
STEP2
[PDF] delivered in
Standard Title (Description)
Status
PDF
SJ 20831-2002
English
389
Add to Cart
3 days [Need to translate]
Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly
Valid
SJ 20831-2002
PDF similar to SJ 20831-2002
Standard similar to SJ 20831-2002
GB/T 7247.1
SJ/T 11460.6.4
GB/T 18490.1
SJ/T 11466
Basic data
Standard ID
SJ 20831-2002 (SJ20831-2002)
Description (Translated English)
Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly
Sector / Industry
Electronics Industry Standard
Classification of Chinese Standard
L52
Word Count Estimation
12,151
Date of Issue
2002-10-30
Date of Implementation
2003-03-01
Summary
This standard specifies the 4N infrared focal plane detector dewar assembly (hereinafter referred to as 4N components) parameter definitions, test methods and general test conditions. 4N 4N component consists of infrared focal plane array detectors and Dewar composition. 4N infrared focal plane detector is with four time delay integration (TDI) circuit infrared focal plane detector. The total number of pixels 4N months, a total of N- channel electricity. This standard applies to 4N component testing.
Refund Policy
Privacy Policy
Terms of Service
Shipping Policy
Contact Information