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JJG 989-2004 English PDF

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JJG 989-2004: Verification Regulation of Grating Micrometers
Status: Obsolete
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JJG 989-2004English919 Add to Cart 4 days [Need to translate] Verification Regulation of Grating Micrometers Obsolete JJG 989-2004

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Basic data

Standard ID JJG 989-2004 (JJG989-2004)
Description (Translated English) Verification Regulation of Grating Micrometers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A52
Classification of International Standard 17.040
Word Count Estimation 23,280
Date of Issue 2004-09-21
Date of Implementation 2004-12-21
Quoted Standard 2004 technical regulations issued by national metrology (industrial measurement 2005 Volume 15, Issue 1)
Regulation (derived from) 2004 technical regulations issued by national metrology (industrial measurement 2005 Volume 15, Issue 1)
Issuing agency(ies) State Administration of Quality Supervision, Inspection and Quarantine
Summary This standard applies to resolution of 0. 01��m ~ 1��m, measuring range up to 100mm of grating micrometer initial verification, testing and use of follow-up inspection.

JJG 989-2004: Verification Regulation of Grating Micrometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Verification Regulation of Grating Micrometers National Metrology Verification Regulations of the People's Republic Grating type micrometer Released on.2004-09-21 Implementation of.2004-12-21 The General Administration of Quality Supervision, Inspection and Quarantine issued Grating type micrometer verification procedure ofGrating This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on September 21,.2004, and Implemented on December 21,.2004. Focal Point. National Geometric Quantity Engineering Measurement Technology Committee Main drafting unit. Institute of Optoelectronic Technology, Chinese Academy of Sciences Participated in drafting unit. China Testing Technology Research Institute This regulation entrusts the National Geometric Quantity Engineering Parametric Measurement Technical Committee to explain The main drafters of this procedure. Yan Lihong (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Xiaolong (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Cao Xuedong (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Fan Tianquan (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Participate in the drafters. Li Jianmin (China Testing Technology Research Institute)

table of Contents

1 Scope (1) 2 Citations (1) 3 Overview (1) 4 Metrological performance requirements (2) 4.1 Force (2) 4.2 The change of indication value caused by the radial force of the measuring rod (2) 4.3 Repeatability (2) 4.4 indication error (2) 4.5 Drift (2) 5 General technical requirements (2) 5.1 Appearance (2) 5.2 Interaction of various parts (3) 5.3 Anti-interference (3) 6 measuring instrument control (3) 6.1 Verification conditions (3) 6.2 Verification project (4) 6.3 Verification method (4) 6.4 Processing of verification results (6) 6.5 verification period (6) Appendix A Example of calculation of micrometer indication error verification (quantity block and micrometer combination method) (7) Appendix B Uncertainty of measurement error of measurement error (laser length measuring device method) (8) Appendix C Indication Uncertainty of Measurement Errors (Quantum Block and Micrometer Verifier Combination Method) (12) Appendix D Verification certificate and verification result notice page format (18) Grating type micrometer verification procedure

1 Scope

This procedure is applicable to the first time of a grating micrometer with a resolution of 0.01μm~1μm and a measuring range of 100mm. Verification, follow-up verification and in-use inspection.

2 Citations

This procedure refers to the following documents. JJF1001-1998 General measurement terms and definitions JJF1059-1999 Measurement Uncertainty Evaluation and Representation JJF1094-2002 Measuring instrument characteristic evaluation JB/T 10080.2-2000 grating line displacement sensor When using this procedure, care should be taken to use the current valid version of the above cited documents.

3 Overview

A grating type micrometer (hereinafter referred to as a micrometer) uses a grating pair as a measuring element to convert a line displacement into light. An electrical signal, a length-precision measuring instrument that is processed by a circuit and displayed in digital form. The micrometer is divided into 5 levels according to its accuracy level. The micrometer is divided into two types according to its structure. integral type and split type. Integral The sensor of the micrometer is integrated with the display unit, and its structure is shown in Figure 1 (a). Split type micrometer The sensor (including the signal cable) and the digital display are composed of two parts, and the structure diagram is shown in Figure 1 (b). Figure 1 Schematic diagram of the micrometer 1-rod; 2-clamping sleeve; 3-micrometer body; 4-display unit; 5-digit display

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