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JJF 1944-2021 English PDF

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JJF 1944-2021: Calibration Specification for Capacitance Comparators
Status: Valid

Standard ID	Contents [version]	USD	STEP2	[PDF] delivered in	Standard Title (Description)	Status	PDF
JJF 1944-2021	English	489	Add to Cart	4 days [Need to translate]	Calibration Specification for Capacitance Comparators	Valid	JJF 1944-2021

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Basic data

Standard ID	JJF 1944-2021 (JJF1944-2021)
Description (Translated English)	Calibration Specification for Capacitance Comparators
Sector / Industry	Metrology & Measurement Industry Standard
Classification of Chinese Standard	A52
Classification of International Standard	17.040
Word Count Estimation	22,293
Date of Issue	2021-12-08
Date of Implementation	2022-06-08
Issuing agency(ies)	State Administration for Market Regulation
Summary	This standard applies to the calibration of capacitive micrometers with a measuring range of 20 ��m to 10 mm and a resolution of 1 nm to 1 ��m.

JJF 1944-2021: Calibration Specification for Capacitance Comparators

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
National Metrology Technical Specifications of the People's Republic of China Calibration Specifications for Capacitance Micrometers Released on 2021-12-08 2022-06-08 Implementation Released by the State Administration for Market Regulation Calibration Specifications for Capacitance Micrometers Replace JJG570-2006 Responsible unit: National Technical Committee of Geometric Engineering Parameter Metrology Main drafting unit: Henan Institute of Metrology China Institute of Metrology Participating in the drafting unit: Liaoning Institute of Metrology Jiangsu Institute of Metrology Tianjin University This specification entrusts the National Geometric Engineering Parameter Metrology Technical Committee to be responsible for interpretation The main drafters of this specification: Jia Xiaojie (Henan Institute of Metrology) Cui Jianjun (National Institute of Metrology) Huang Yuzhu (Henan Institute of Metrology) Zhou Qiang (Henan Institute of Metrology) Participating drafters: Liu Na (Liaoning Institute of Metrology) Wang Xiaofei (Jiangsu Institute of Metrology) Duan Fajie (Tianjin University)

Introduction (Ⅱ) 1 Scope(1) 2 Overview(1) 3 Metrological characteristics(1) 3:1 Repeatability(1) 3:2 Indication error(1) 3:3 Stability(2) 4 Calibration conditions(2) 4:1 Environmental conditions (2) 4:2 Calibration standard and corresponding equipment (2) 5 Calibration Items and Calibration Methods(2) 5:1 Preparations before calibration(2) 5:2 Repeatability(2) 5:3 Indication error(3) 5:4 Stability(4) 6 Expression of Calibration Results(4) 7 Recalibration interval(5) Appendix A Example of measurement data processing of indication error of capacitive micrometer with a measuring range of 20 μm (6) Appendix B Technical Requirements for Measuring Baffles (7) Appendix C Precision Length Measuring Device(8) Appendix D Calibration Certificate Information and Inner Page Format (9) Appendix E Example of Calibration Uncertainty Evaluation of Indication Error of Capacitance Micrometer (Precision Length Measuring Device Method) (10) Appendix F Example of Calibration Uncertainty Evaluation of Indication Error of Capacitance Micrometer (Gauge Block Measurement Method) (13)

Introduction

JJF 1071-2010 "Rules for Compilation of National Metrology Calibration Standards", JJF 1001-2011 "General Metrology Terminology and Definition", JJF 1094-2002 "Evaluation of Measuring Instrument Characteristics" and JJF 1059:1-2012 "Evaluation of Measurement Uncertainty "Determination and Representation" together constitute the basic series of specifications supporting the revision of this specification: Compared with JJG570-2006 "Capacitance Micrometer", except for editorial modifications, the main technical changes in this specification as follows: ---The scope of application is expanded from "the measuring range is not greater than:2000μm, and the resolution is 1nm~0:5μm" to "the measuring range Calibration of capacitive micrometers with a resolution of 20 μm to 10 mm and a resolution of 1 nm to 1 μm; --- Deleted "Citation"; --- Modified the schematic diagram of the structure of the capacitive micrometer and the schematic diagram of the probe of the capacitive micrometer; ---Modify "repeatability of indication value" to "repeatability", and re-describe its technical indicators and calibration methods As described above, the repeatability calculation formula has been added; --- Deleted the "response time", "discrimination" and "zero adjustment range" technical indicators; ---Modified the indication error technical index, and re-described its calibration method; --- Modified the calibration method of "stability"; --- Deleted "Measurement Performance Requirements for Pointer Capacitance Micrometer"; --- Added "Appendix A Measurement data processing example of capacitance micrometer indication error with a range of 20 μm"; --- Modified the "standard baffle" in Appendix B to "measurement baffle"; modified the diameter requirements of the measurement baffle; --- Added Appendix C Structural Diagram of Precision Length Measuring Device: The previous releases of this specification are as follows: ---JJG570-2006; ---JJG570-1988: Calibration Specifications for Capacitance Micrometers

1 Scope

This specification is applicable to capacitive micrometers with a measuring range of 20 μm to 10 mm and a resolution of 1 nm to 1 μm calibration:

2 Overview

Capacitance micrometer (hereinafter referred to as micrometer) is a non-contact micrometer that adopts the principle of capacitance frequency modulation or capacitance operation: Dimensional precision measuring instrument, suitable for geometric measurement in aviation, medical, precision manufacturing and other industries: Micrometer structure As shown in Figure 1: Micrometers are available with complete sets of probes: The shape of the probe is shown in Figure 2: Fig:1 Schematic diagram of capacitive micrometer structure 1-acquisition module; 2-digital display; 3-host computer software; 4-communication interface; 5-probe Figure 2 Schematic diagram of the shape of the capacitive micrometer probe

3 Metrological characteristics

3:1 Repeatability The repeatability of the micrometer should not exceed 0:01%FS: 3:2 Indication error The maximum allowable error MPE of the micrometer: ±0:1%FS:

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