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JJF 1100-2016 English PDF

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JJF 1100-2016: Calibration Specification for Flat Equal Thickness Interferometers
Status: Valid

JJF 1100: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
JJF 1100-2016English349 Add to Cart 3 days [Need to translate] Calibration Specification for Flat Equal Thickness Interferometers Valid JJF 1100-2016
JJF 1100-2003English559 Add to Cart 3 days [Need to translate] Calibration Specification for Flat Equal Thickness Interferometers Obsolete JJF 1100-2003

PDF similar to JJF 1100-2016


Standard similar to JJF 1100-2016

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Basic data

Standard ID JJF 1100-2016 (JJF1100-2016)
Description (Translated English) Calibration Specification for Flat Equal Thickness Interferometers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A52
Word Count Estimation 15,184
Date of Issue 2016-11-30
Date of Implementation 2017-05-30
Older Standard (superseded by this standard) JJF 1100-2003
Regulation (derived from) State Administration of Quality Supervision, Inspection and Quarantine Notice No.119 of 2016
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine

JJF 1100-2016: Calibration Specification for Flat Equal Thickness Interferometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Flat Equal Thickness Interferometers National Metrological Technical Code of the People's Republic of China Standard for Equal Thickness Interferometer Calibration 2016-11-30 release 2017-05-30 implementation State Administration of Quality Supervision, Inspection and Quarantine issued Standard for Equal Thickness Interferometer Calibration Replacing JJF 1100-2003 Coordinate Unit. National Geometric Engineering Parameter Measurement Technical Committee The main drafting unit. China Testing Technology Research Institute China Institute of Metrology Participated in the drafting unit. Institute of Optoelectronic Technology, Chinese Academy of Sciences Test Technology Co., Ltd. in the test The specification commissioned by the National Geometric Engineering Engineering Metrology Technical Committee is responsible for the interpretation The main drafters of this specification. Ran Qing (China Testing Technology Research Institute) Zhang Heng (China Institute of Metrology) Zhao xiaoping (China Test Technology Research Institute) Kang Yanhui (China Institute of Metrology) Participate in the drafters. WU Shi-bin (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Xu Deyu (China Testing Technology Research Institute) Qingguang Asia (in the test test Technology Co., Ltd.)

table of Contents

Introduction (II) 1 Scope (1) 2 References (1) 3 Overview (1) 4 Metrological characteristics (3) 4.1 Repeatability of interference fringe pitch measurements (3) 4.2 Test error of micrometer eyepiece (3) 4.3 The amount of interference fringes caused by the objective system (3) 4.4 Instrument indication error (3) 5 Calibration conditions (3) 5.1 Environmental conditions (3) 5.2 Calibration items and measuring standards and other equipment (3) 6 Calibration method (4) 6.1 Repeatability of Interference Fringe Spacing (4) 6.2 test eyepiece of the indication error (4) 6.3 The amount of interference fringes caused by the objective system (4) 6.4 Indication error of instrument (5) 7 Expression of calibration results (5) 8 Recurrence time interval (5) Appendix A Graphic and Introduction of Planar Equal Thickness Interference Fringe Measurements (6) APPENDIX B Example of Uncertainty Evaluation of Indication Error of Planar Equal Thickness Interferometer (7) Appendix C Calibration Certificate Information and Format (10)

Introduction

JJF 1071-2010 "Rules for the preparation of national metrological calibration specifications", JJF 1001-2011 "General measurement terms and Definitions "and JJF 1059.1-2012" Measurement Uncertainty Assessment and Representation "together constitute support for this calibration specification revision Work of the basic series of norms. Compared with JJF 1100-2003 "flat equal thickness interferometer calibration standard", this specification, in addition to editorial changes, the main The technical changes are as follows. --- This specification eliminates the accuracy of the instrument on the plane equal thickness interferometer grading; --- This specification eliminates the "no standard plane flat crystal plane equal thickness interferometer indication error can not measure" this Regulations; --- This specification adds an illustration and brief introduction to Appendix A. Method of measurement of plane equal thickness interference fringes; --- The specification of the plane equal thickness interferometer indication error measurement is recommended by two φ150mm first-class standard plane Flat crystal according to its two measurement cross-section one by one corresponding measurement method to obtain, and retain the original specification with three second-level flat crystal mutual inspection method; --- This specification eliminates the "recommended no more than one year" clause in the re-election interval, and the calibration interval is According to their own business to determine the situation. The previous versions of this specification are released. --- JJF 1100-2003 "flat equal thickness interferometer calibration specification"; --- JJG336-1983 "plane equal thickness interferometer". Standard for Equal Thickness Interferometer Calibration

1 Scope

This specification applies to the calibration of planar equal thickness interferometers.

2 reference file

This specification refers to the following documents. JJG28-2000 flat crystal JB/T 7401-1994 plane flat crystal For dated references, only the dated edition applies to this specification; references that are not dated , The latest version (including all amendments) applies to this specification.

3 Overview

Plane equal thickness interferometer (hereinafter referred to as instrument) is the use of equal thickness light interference principle for the object surface flatness Measuring (or detecting) an optical instrument. According to the instrument structure is divided into standard flat crystal and standard flat crystal with two Kind of plane equal thickness interferometer. Instrument shape and optical structure are shown in Figure 1, Figure 2, Figure 3 and Figure 4. Figure 1 Outline structure without standard flat crystal interferometer

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