JJF 1096-2002_English: PDF (JJF1096-2002)
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| JJF 1096-2002 | English | 459 |
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Calibration Specification for Calibrator of Extensometers
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JJF 1096-2002
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JJF 1096-2002
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| Standard ID | JJF 1096-2002 (JJF1096-2002) | | Description (Translated English) | Calibration Specification for Calibrator of Extensometers | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | A52 | | Word Count Estimation | 19,118 | | Date of Issue | 2002-11-04 | | Date of Implementation | 2003-02-04 | | Drafting Organization | Shaanxi Provincial Institute of Measurement Testing | | Administrative Organization | National Engineering geometric parameters measured Technical Committee | | Issuing agency(ies) | State Administration of Quality Supervision, Inspection and Quarantine | | Summary | This standard applies to the extensometer dedicated calibration device (hereinafter referred to as the calibrator) the metrological characteristics calibration. | JJF 1096-2002
Calibration Specification for Calibrator of Extensome
National Metrology Technical Specification of the People's Republic
Extensometer Calibrator Calibration Specifications
Released on November 11,.2002
2003-02-04 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on November 4,.2002, and
Implemented on February 4,.2003.
Focal Point. National Geometric Quantity Engineering Measurement Technology Committee
Main drafting unit. Shaanxi Institute of Metrology and Testing
Participated in the drafting unit. Xi'an Century Measurement and Control Technology Research Institute
Institute of Analysis and Testing, Central Iron and Steel Research Institute
This specification entrusts the focal point to be responsible for interpretation
The main drafters of this specification.
Zhang Lei (Shaanxi Institute of Metrology and Testing)
Shi Jize (Xi'an Century Measurement and Control Technology Research Institute)
Wang Chunhua (Institute of Analytical Testing, Central Iron and Steel Research Institute)
table of Contents
1 range (1)
2 Citations (1)
3 Overview (1)
4 Measurement characteristics (2)
4.1 The quality of the micro-head and the relative position of each part (2)
4.2 Coaxiality of the upper and lower mandrels (2)
4.3 Resolution (2)
4.4 indication error (2)
4.5 indication stability (3)
4.6 bracket rigidity (3)
5 Calibration conditions (3)
5.1 Environmental conditions (3)
5.2 Calibration items and calibration equipment (3)
6 Calibration method (3)
6.1 The quality of the micro-head and the relative position of each part (4)
6.2 Coaxiality of the upper and lower mandrels (4)
6.3 Resolution (4)
6.4 indication error (4)
6.5 indication stability (7)
6.6 bracket rigidity (7)
7 Calibration result expression (7)
8 re-study interval (7)
Appendix A Measurement uncertainty of the indication error of the extensometer calibrator (8)
Appendix B Special Table for Calibrating the Extensometer Calibrator (13)
Appendix C Contents of the Calibration Certificate (14)
Extensometer Calibrator Calibration Specifications
1 Scope
This specification applies to the calibration of the metering characteristics of the extensometer-specific calibration device (hereinafter referred to as the calibrator).
2 Citations
JJF 1001-1998 General measurement terms and definitions
JJF 1059-1999 Measurement Uncertainty Evaluation and Representation
ISO 9513.1999 Calibration of extensometers for uniaxial testing of metallic materials
JB/T 10033-1999 micrometer
Use of this specification should be done with the current valid version of the above cited documents.
3 Overview
The calibrator is an instrument used to give a standard displacement to a calibrated extensometer. It consists of a rigid bracket and two coaxial
A mandrel or fixture for the card extensometer, a micrometer device capable of accurately measuring the amount of axial displacement along the mandrel
to make. The calibrator is divided into Class A and Class B according to the form of micrometer. The structure diagram is shown in Figure 1 and Figure 2.
Figure 1 Class A calibrator Figure 2 Class B calibrator
Class A calibrators are generally displaced by the micrometer head of the helical substructure, using a micrometer mounted on the calibrator bracket
The table (comparator, micrometer or interferometer light pipe, etc.) is measured with a gauge block. Class B calibrators generally use the same micrometer
Time to achieve displacement and measurement.
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