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GBZ41275.22-2023 English PDF

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GBZ41275.22-2023: Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 22: Technical guidelines
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GB/Z 41275.22-2023English1249 Add to Cart 8 days [Need to translate] Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 22: Technical guidelines Valid GB/Z 41275.22-2023

PDF similar to GBZ41275.22-2023


Standard similar to GBZ41275.22-2023

GB/T 28878.10   GB/T 28878.9   GB/Z 41275.4   GB/Z 41275.23   GB/T 41275.2   

Basic data

Standard ID GB/Z 41275.22-2023 (GB/Z41275.22-2023)
Description (Translated English) Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 22: Technical guidelines
Sector / Industry National Standard
Classification of Chinese Standard V25
Classification of International Standard 49.025.01
Word Count Estimation 62,674
Date of Issue 2023-12-28
Date of Implementation 2024-07-01
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GBZ41275.22-2023: Process management for avionics - Aerospace and defence electronic systems containing lead-free solder - Part 22: Technical guidelines


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GB /Z 41275:22-2023: Avionics Process Management Aerospace and Defense Electronic Systems Containing Lead-Free Solder Part 22: Technical Guidelines ICS 49:025:01 CCSV25 National Standardization Guiding Technical Documents of the People's Republic of China Avionics Process Management Aerospace and defense electronic systems containing lead-free solders Part 22: Technical Guidelines containinglead-freesolder-Part 22:Technicalguidelines Published on 2023-12-28 2024-07-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration Committee

Table of contents

Preface V Introduction VI 1 Scope 1 2 Normative references 1 3 Terms, definitions and abbreviations 1 3:1 Terms and definitions 1 3:2 Abbreviations 6 4 Technical Path 7 5 General properties of lead-free solder 7 5:1 General 7 5:2 High temperature 8 5:3 Low temperature 8 5:4 Temperature cycling 8 5:5 Vibration/mechanical shock 9 6 System-level usage environment 10 6:1 General 10 6:2 Usage environment 10 6:3 Thermal environment of electronic/electrical equipment 10 6:4 Vibration and shock11 6:5 Humidity 11 6:6 Other environments: salt spray, mold, cooling air quality and fluid compatibility11 7 High performance electronic product testing11 8 Solder joint reliability11 8:1 General 11 8:2 Mixing of Solder Alloys and Platings 12 8:3 Lead-free terminals in Sn-Pb solder joints 13 8:4 Sn-Pb terminals in lead-free solder joints 15 8:5 Bismuth Effect15 8:6 Mixed alloy combination test 16 8:7 Establishment of lead-free solder and mixed metallurgical models 17 9 parts 20 9:1 Materials 20 9:2 Temperature evaluation 20 9:3 Notes 20 9:4 Plastic Encapsulated Microcircuit (PEM) Moisture Sensitivity Level (MSL) 20 9:5 Terminal plating 20 9:6 Assembly stress 21 9:7 Hot dip welding 21 10 Printed circuit board 22 10:1 General 22 10:2 Plated hole 22 10:3 Copper dissolution 22 10:4 Laminated materials 23 10:5 Surface coating 23 10:6 Lead-free PCB/PWB process verification 25 10:7 PCB/PWB design considerations for lead-free soldering applications 25 11 Printed Circuit Board (PCB)/Printed Wiring Board (PWB) Assembly 25 11:1 General 25 11:2 PCB/PWB Coupon Board 25 11:3 Welding inspection standards 25 11:4 Flux, Residues, Cleaning and Surface Insulation Resistance 25 12 Module Assembly 31 12:1 Connectors and sockets 31 12:2 Radiator/Module 31 12:3 Conformal coating 31 13 Wire/Cable Assembly32 13:1 Effect of temperature 32 13:2 Cable connector 32 13:3 Wire terminal 32 13:4 Splicing 32 13:5 Bushing 32 14 Rework/Fix 32 14:1 General 32 14:2 Part rework33 14:3 Base level repair 34 14:4 Hybrid solder rework temperature profile 34 14:5 Flux 35 14:6 Rework/Repair Cleaning Process 35 14:7 Inspection requirements 36 15 General product life test 36 15:1 Thermal cycle, vibration and shock testing 36 15:2 Other environments 36 16 Similarity analysis 36 16:1 General 36 16:2 Analysis Project 36 16:3 Test item 37 Appendix A (informative) Structural changes of this document compared with IEC /T S62647-22:201338 Appendix B (informative) Technical differences and reasons between this document and IEC /T S62647-22:2013 39 Appendix C (informative) Equipment usage environment definition 44 Reference 45

Foreword

This document complies with the provisions of GB/T 1:1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting: This document is Part 22 of GB/T (Z) 41275 "Aviation Electronics Process Management Aerospace and Defense Electronic Systems Containing Lead-Free Solder" point: GB/T (Z)41275 has released the following parts: ---Part 2: Reducing the harmful effects of tin; ---Part 3: System performance test methods containing lead-free solder and lead-free pins; ---Part 4: Ball Grid Array Ball Planting; ---Part 21: Transition Guide to Lead-Free Electronics; ---Part 22: Technical Guidelines; ---Part 23: Guidelines for rework/repair of lead-free and mixed electronic products: This document is modified to adopt IEC /T S62647-22:2013 "Aviation Electronics Process Management of Lead-free Solders for Aerospace and Defense Electronics Systems" "System Part 22: Technical Guidelines", the document type was adjusted from IEC 's technical specifications to my country's national standardization guiding technical documents: Compared with IEC /T S62647-22:2013, this document has many structural adjustments: Comparison of structure number changes in the two files See Appendix A for the table: Compared with IEC /T S62647-22:2013, there are many technical differences between this document and the outer margins of the clauses involved: Indicated with a single vertical line (︱): A list of these technical differences and their causes is provided in Appendix B: The following editorial changes have been made to this document: --- Correct the definition of the term 3:1:27 "repair"; ---Deleted the Fahrenheit temperature in the full text and retained the Celsius temperature; ---Replaced IEC /T S62647-23 with the informative reference GB /Z 41275:23 (see 14:1:1 and 14:3): Please note that some content in this document may be subject to patents: The publisher of this document assumes no responsibility for identifying patents: This document is proposed and coordinated by the National Avionics Process Management Standardization Technical Committee (SAC/TC427): This document was drafted by: Aviation Industry Corporation of China Leihua Electronic Technology Research Institute, China Aviation Integrated Technology Research Institute, China Aviation Industry Corporation Luoyang Electro-optical Equipment Research Institute of Air Industry Group Corporation, State-owned Wuhu Machinery Factory, Taiyuan Aviation Instrument Co:, Ltd:, Guangzhou Hanyuan Microelectronics Packaging MATERIALS LIMITED: The main drafters of this document: Zhao Bingqian, Zhang Xiaolei, Ren Haitao, Liu Zhanping, Wang Jie, Wang Jinquan, Sun Ke, Pang Jingyu, Lu Bing, Du Wenjie, Fan Xin, Liu Liangyong, Ren Ye, Duan Yusi, Li Wei, Ning Jiangtian:

Introduction

GB/T (Z) 41275 stipulates the management requirements and technical requirements for lead-free aerospace, national defense and high-performance electronic systems: It is planned to be Composed of 7 parts: ---Part 1: Preparation of lead-free control plan: The purpose is to provide for lead-free control of programming of aerospace, defense and high-performance electronic systems: plan goals and requirements: ---Part 2: Reducing the harmful effects of tin: The purpose is to regulate aerospace, defense and high-performance electronic systems to reduce the harmful effects of tin: The technical methods adopted for the impact: ---Part 3: System performance test methods containing lead-free solder and lead-free pins: The purpose is to regulate lead-free solder and lead-free tubing Performance test methods and test procedures for aerospace, defense, and high-performance electronic systems: ---Part 4: Ball Grid Array Ball Planting: The purpose is to regulate aerospace, defense and high-performance electrical products containing lead-free solder and lead-free leads: Requirements for subsystem replacement of ball grid array (BGA) component solder balls: ---Part 21: Transition Guide to Lead-Free Electronics: The purpose is to provide for aerospace and defense electronic system project management or system A guide for engineering management to manage the transition to lead-free electronics: ---Part 22: Technical Guidelines: The purpose is to provide for aerospace, defense and high-performance electronic systems to ensure continued performance, quality, Technical guidance for reliability, safety, airworthiness, configuration control, affordability, maintainability, and supportability: ---Part 23: Guidelines for rework/repair of lead-free and mixed electronic products: The purpose is to specify aerospace, defense and high performance electronics Technical guidelines for disassembly and replacement of parts (including components) during system rework/repair: Avionics Process Management Aerospace and defense electronic systems containing lead-free solders Part 22: Technical Guidelines

1 Scope

This document provides technical guidance for the transition to lead-free electronic products, mainly including technical paths, general performance of lead-free solder, system-level Operating environment, high-performance electronic product testing, solder joint reliability, components, printed circuit boards, printed circuit boards (PCB)/printed circuit boards (PWB) assembly, module assembly, wire/cable assembly, rework/repair, general product life test, similarity analysis, etc: This document is applicable to aerospace, defense and high-performance electronics applications and other high-performance and high-reliability industries for reference use:

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text: Among them, dated citations For documents, only the version corresponding to the date applies to this document; for undated referenced documents, the latest version (including all modification orders) applies in this document: GB/T 41275:2-2022 Avionics process management Aerospace and defense electronic systems containing lead-free solder Part 2: Reduction Harmful effects of less tin (IEC /T S62647-2:2012, MOD) GB/T 41275:3-2022 Avionics process management Aerospace and defense electronic systems containing lead-free solder Part 3: Including System performance test method for lead-free solders and lead-free pins (IEC TS62647-3:2014, MOD) IEC /T S62647-1:2012 Avionics process management Aerospace and defense electronic systems containing lead-free solders Part 1: None taininglead-freesolder-Part 1:Preparationforalead-freecontrolplan) GEIA-HB-0005-4 Guidelines for Reliability Assessment of Lead-Free Assemblies for Aerospace and High-Performance Electronics Applications (Guidelinesfor PracticesGuideline) 3 Terms, definitions and abbreviations 3:1 Terms and definitions The following terms and definitions apply to this document: 3:1:1 Alloy compositionaloycomposition The total composition of an alloy, defined by weight as a percentage: Note: For example, 63Sn-37Pb is equivalent to a mixture of 63% (by weight) tin and 37% (by weight) lead: