US$239.00 · In stock Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 5594.4-2015: Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value Status: Valid GB/T 5594.4: Evolution and historical versions
Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
GB/T 5594.4-2015 | English | 239 |
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Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value
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GB/T 5594.4-2015
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GB/T 5594.4-1985 | English | 199 |
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Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value
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GB/T 5594.4-1985
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Basic data Standard ID | GB/T 5594.4-2015 (GB/T5594.4-2015) | Description (Translated English) | Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value | Sector / Industry | National Standard (Recommended) | Classification of Chinese Standard | L90 | Classification of International Standard | 31-030 | Word Count Estimation | 11,166 | Date of Issue | 2015-05-15 | Date of Implementation | 2016-01-01 | Older Standard (superseded by this standard) | GB/T 5594.4-1985 | Regulation (derived from) | National Standard Announcement 2015 No. 15 | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China |
GB/T 5594.4-2015: Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test methods for properties of structure ceramic used in electronic component and device - Part 4. Test method for permittivity and dielectric loss angle tangent value
ICS 31-030
L90
National Standards of People's Republic of China
Replace GB/T 5594.4-1985
Electronic components structural ceramic materials
Performance test method
Part 4. dielectric constant and dielectric loss angle
Tangent test method
componentanddevice-Part 4. Testmethodforpermittivityand
2015-05-15 release.2016-01-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Management Committee released
Foreword
GB/T 5594 "electronic components structural ceramic material performance test method" is divided into the following parts.
- Air tightness test method (GB/T 5594.1);
- Young 's elastic modulus Poisson' s ratio test method (GB/T 5594.2);
Part 3. Test method for average linear expansion coefficient (GB/T 5594.3);
Part 4. Test method for dielectric constant and dielectric loss tangent (GB/T 5594.4);
- Volume resistivity test method (GB/T 5594.5);
Part 6. Chemical stability test methods (GB/T 5594.6);
- Part 7. Determination of liquid permeability (GB/T 5594.7);
Part 8. Microstructure determination method (GB/T 5594.8);
Test method for electrical breakdown strength (GB/T 5594.9).
This part is part 4 of GB/T 5594.
This part is drafted in accordance with the rules given in GB/T 1.1-2009.
This part of the replacement GB/T 5594.4-1985 "Electronic components Structural ceramic material performance test method Dielectric constant and dielectric loss
Angle tangent test method ".
This part compared with GB/T 5594.4-1985, the following changes are mainly.
--- Standard name changed to. "Electronic components Structural ceramic material performance test method Part 4. Dielectric constant and dielectric loss angle
Tangent test method ";
--- increased the 4.1 dielectric constant test and calculation;
--- Remove the original standard test fixture type diagram. a. Tip electrode; b. Tip to the plate-shaped electrode.
Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents.
This part is made by the Ministry of Industry and Information Technology of the People's Republic of China.
This part is headed by China Electronic Technology Standardization Research Institute.
This part of the drafting unit. China Electronics Technology Group Corporation Twelfth Institute, China Electronic Technology Standardization Institute, Beijing Qixingfei
Line Electronics Co., Ltd.
This part of the main drafters. Zeng Guisheng, Li Xiaoying, Xue Xiaomei.
This part of the previous version of the standard to replace the release of the situation.
--- GB/T 5594.4-1985.
Electronic components structural ceramic materials
Performance test method
Part 4. dielectric constant and dielectric loss angle
Tangent test method
1 Scope
This part of GB/T 5594 specifies the use of electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates
Test method for dielectric constant and dielectric loss tangent of ceramic materials.
This part applies to electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates.
The rate of 1MHz, the temperature from room temperature to 500 ℃ under the conditions of dielectric constant and dielectric loss tangent test.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
Electronic components - Structural ceramic materials GB/T 5593-2015
Terminology of electronic ceramics - Terminology GB/T 9530-1988
3 terms and definitions
GB/T 9530-1988 Definitions and the following terms and definitions apply to this document.
3.1
Permittivity
One of the main parameters of the dielectric properties of the reaction dielectric, the capacitance of the capacitor consisting of the dielectric and the same geometric size of the vacuum capacitor
The ratio of the capacitance is called the dielectric constant ε (dimensionless).
3.2
Dielectric loss tangent value dielectriclossangletangentvalue
tanδ
The ratio of active power to reactive power under the action of alternating electric field is a dimensionless physical quantity that characterizes the dielectric loss.
4 test principle
4.1 Meaning of dielectric loss
The dielectric loss of the ceramic material represents a property of the energy loss when the AC field is passed through the material. Can also be said to accept the material
AC power field, due to polarization or absorption of the phenomenon of the production process, resulting in a loss of power. It has two basic properties, namely, dielectric
Constant ε and dielectric loss tangent tanδ.
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