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GB/T 5594.4-2015 English PDF

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GB/T 5594.4-2015: Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value
Status: Valid

GB/T 5594.4: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
GB/T 5594.4-2015English239 Add to Cart 3 days [Need to translate] Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value Valid GB/T 5594.4-2015
GB/T 5594.4-1985English199 Add to Cart 2 days [Need to translate] Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value Obsolete GB/T 5594.4-1985

PDF similar to GB/T 5594.4-2015


Standard similar to GB/T 5594.4-2015

GB/T 5838.43   GB/T 5838.45   GB/T 5593   GB/T 5594.7   GB/T 5594.8   GB/T 5594.6   

Basic data

Standard ID GB/T 5594.4-2015 (GB/T5594.4-2015)
Description (Translated English) Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L90
Classification of International Standard 31-030
Word Count Estimation 11,166
Date of Issue 2015-05-15
Date of Implementation 2016-01-01
Older Standard (superseded by this standard) GB/T 5594.4-1985
Regulation (derived from) National Standard Announcement 2015 No. 15
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China

GB/T 5594.4-2015: Test methods for properties of structure ceramic used in electronic component and device -- Part 4: Test method for permittivity and dielectric loss angle tangent value


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Test methods for properties of structure ceramic used in electronic component and device - Part 4. Test method for permittivity and dielectric loss angle tangent value ICS 31-030 L90 National Standards of People's Republic of China Replace GB/T 5594.4-1985 Electronic components structural ceramic materials Performance test method Part 4. dielectric constant and dielectric loss angle Tangent test method componentanddevice-Part 4. Testmethodforpermittivityand 2015-05-15 release.2016-01-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released

Foreword

GB/T 5594 "electronic components structural ceramic material performance test method" is divided into the following parts. - Air tightness test method (GB/T 5594.1); - Young 's elastic modulus Poisson' s ratio test method (GB/T 5594.2); Part 3. Test method for average linear expansion coefficient (GB/T 5594.3); Part 4. Test method for dielectric constant and dielectric loss tangent (GB/T 5594.4); - Volume resistivity test method (GB/T 5594.5); Part 6. Chemical stability test methods (GB/T 5594.6); - Part 7. Determination of liquid permeability (GB/T 5594.7); Part 8. Microstructure determination method (GB/T 5594.8); Test method for electrical breakdown strength (GB/T 5594.9). This part is part 4 of GB/T 5594. This part is drafted in accordance with the rules given in GB/T 1.1-2009. This part of the replacement GB/T 5594.4-1985 "Electronic components Structural ceramic material performance test method Dielectric constant and dielectric loss Angle tangent test method ". This part compared with GB/T 5594.4-1985, the following changes are mainly. --- Standard name changed to. "Electronic components Structural ceramic material performance test method Part 4. Dielectric constant and dielectric loss angle Tangent test method "; --- increased the 4.1 dielectric constant test and calculation; --- Remove the original standard test fixture type diagram. a. Tip electrode; b. Tip to the plate-shaped electrode. Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents. This part is made by the Ministry of Industry and Information Technology of the People's Republic of China. This part is headed by China Electronic Technology Standardization Research Institute. This part of the drafting unit. China Electronics Technology Group Corporation Twelfth Institute, China Electronic Technology Standardization Institute, Beijing Qixingfei Line Electronics Co., Ltd. This part of the main drafters. Zeng Guisheng, Li Xiaoying, Xue Xiaomei. This part of the previous version of the standard to replace the release of the situation. --- GB/T 5594.4-1985. Electronic components structural ceramic materials Performance test method Part 4. dielectric constant and dielectric loss angle Tangent test method

1 Scope

This part of GB/T 5594 specifies the use of electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates Test method for dielectric constant and dielectric loss tangent of ceramic materials. This part applies to electronic components such as device parts, vacuum electronic devices, resistive substrates, semiconductors and integrated circuit substrates. The rate of 1MHz, the temperature from room temperature to 500 ℃ under the conditions of dielectric constant and dielectric loss tangent test.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. Electronic components - Structural ceramic materials GB/T 5593-2015 Terminology of electronic ceramics - Terminology GB/T 9530-1988

3 terms and definitions

GB/T 9530-1988 Definitions and the following terms and definitions apply to this document. 3.1 Permittivity One of the main parameters of the dielectric properties of the reaction dielectric, the capacitance of the capacitor consisting of the dielectric and the same geometric size of the vacuum capacitor The ratio of the capacitance is called the dielectric constant ε (dimensionless). 3.2 Dielectric loss tangent value dielectriclossangletangentvalue tanδ The ratio of active power to reactive power under the action of alternating electric field is a dimensionless physical quantity that characterizes the dielectric loss.

4 test principle

4.1 Meaning of dielectric loss The dielectric loss of the ceramic material represents a property of the energy loss when the AC field is passed through the material. Can also be said to accept the material AC power field, due to polarization or absorption of the phenomenon of the production process, resulting in a loss of power. It has two basic properties, namely, dielectric Constant ε and dielectric loss tangent tanδ.

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