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GB/T 5095.2506-2020 English PDF

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GB/T 5095.2506-2020: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-6: Test 25f: Eye pattern and jitter
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GB/T 5095.2506-2020English264 Add to Cart 3 days [Need to translate] Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-6: Test 25f: Eye pattern and jitter Valid GB/T 5095.2506-2020

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Basic data

Standard ID GB/T 5095.2506-2020 (GB/T5095.2506-2020)
Description (Translated English) Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-6: Test 25f: Eye pattern and jitter
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L23
Classification of International Standard 31.220.10
Word Count Estimation 14,163
Date of Issue 2020-04-28
Date of Implementation 2020-11-01
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 5095.2506-2020: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-6: Test 25f: Eye pattern and jitter


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 25-6. Test 25f. Eye pattern and jitter ICS 31.220.10 L23 National Standards of People's Republic of China Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-6. Test 25f. Eye Diagrams and Jitter (IEC 60512-25-6..2004, Connectors for electronic equipment-Testsand 2020-04-28 release 2020-11-01 implementation State Administration of Market Supervision and Administration Issued by the National Standardization Management Committee

Contents

Foreword I 1 General 1 1.1 Scope and Purpose 1 1.2 Terms and definitions 1 2 Test facility 1 2.1 Device 1 2.2 Device 1 3 Test sample 2 3.1 Description 2 4 Test procedure 2 4.1 General 2 4.2 Eye Diagram 2 4.3 Jitter 3 5 Detailed rules required by relevant standards 3 6 Test record file 4 Appendix A (Normative Appendix) Schematic diagram of the sample terminal 5 Appendix B (Informative) Interpretation of Eye Diagrams --- Practical Guide 7

Foreword

GB/T 5095 "Basic Test Regulations and Measurement Methods of Electromechanical Components for Electronic Equipment" is divided into several parts according to the test methods. Part 25 of GB/T 5095 is the signal integrity test. The parts that have been released or are planned to be released are as follows. --- Part 25-1. Test 25a. Crosstalk ratio; --- Part 25-2. Test 25b. attenuation (insertion loss); --- Part 25-3. Test 25c. Decay of rise time; --- Part 25-4. Test 25d. Transmission delay; --- Part 25-5. Test 25e. Return loss; --- Part 25-6. Test 25f. Eye diagram and jitter; --- Part 25-7. Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR); --- Part 25-9. Signal integrity test Test 25i. Alien crosstalk. This part is part 25-6 of GB/T 5095. This section was drafted in accordance with the rules given in GB/T 1.1-2009. The translation method used in this part is equivalent to the use of IEC 60512-25-6..2004 "Connector Test and Measurement for Electronic Equipment Part 25-6 Points. Test 25f. Eye Diagram and Jitter. " The following editorial changes have been made in this section. --- The standard name was changed from "Testing and Measurement of Connectors for Electronic Equipment Part 25-6. Test 25f. Eye Diagram and Jitter" to "Basic test procedures and measurement methods of electromechanical components for electronic equipment Part 25-6. Test 25f. Eye diagram and jitter". Please note that some content of this document may involve patents. The issuer of this document does not assume responsibility for identifying these patents. This part is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This part is under the jurisdiction of the National Technical Committee for Standardization of Electromechanical Components for Electronic Equipment (SAC/TC166). This section was drafted by. Sichuan Huafeng Enterprise Group Co., Ltd., China Electronics Standardization Institute. The main drafters of this section. Pang Bin, Zhu Ming, Xiao Miao, Liu Jun, Wang Qilong. Electromechanical components for electronic equipment Basic test procedures and measurement methods Part 25-6. Test 25f. Eye Diagrams and Jitter

1 General

1.1 Scope and purpose This part of GB/T 5095 is applicable to electrical connectors, cable assemblies or interconnecting systems within the scope of IEC TC48. This section describes methods for measuring eye diagram response and jitter in the time domain. 1.2 Terms and definitions The following terms and definitions apply to this document. 1.2.1 Eyepattern The oscilloscope display of synchronous pseudo-random digital data (signal amplitude-time) indicates the superposition of the cumulative output waveform. 1.2.2 Jitter The difference between the first and last time when a signal crosses a specified reference voltage level. 1.2.3 Bit period The time interval between consecutive identical edges of a clock signal (rising to rising or falling to falling). This is the reciprocal of the clock frequency. 1.2.4 Skew The difference in propagation delay between the two signal channels. 1.2.5 Measurement system risetime Rise time measured by a device with no sample in place and filtering (or normalization). Usually, 10% ~ 90% electricity is measured Flat rise time.

2 Test facility

2.1 Equipment 2.1.1 High-speed pattern generator with clock output, capable of generating specified rise and fall times and data pattern signals. 2.1.2 Signal analyzer with external clock input and infinite afterglow display. Usually a digital sampling oscilloscope with a sampling head (DSO). Digital sampling oscilloscope with template function is preferred. Note. To ensure that the maximum input rating allowed by the oscilloscope input port is not exceeded, to prevent costly losses and to ensure reliable measurements. Even though The signal offset may also produce an unstable eye diagram response within the scope of the oscilloscope's maximum allowable signal level. 2.2 Device 2.2.1 The test device should be equipped with suitable signal and grounding modes. If required, suitable adjacent signal line terminals should also be prepared. sample

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