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Nanotechnologies - Test methods for measurement of electrical properties of carbon nanotubes
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GB/T 44076-2024
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Basic data Standard ID | GB/T 44076-2024 (GB/T44076-2024) | Description (Translated English) | Nanotechnologies - Test methods for measurement of electrical properties of carbon nanotubes | Sector / Industry | National Standard (Recommended) | Classification of Chinese Standard | A42 | Word Count Estimation | 19,125 | Date of Issue | 2024-05-28 | Date of Implementation | 2024-12-01 | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration |
GB/T 44076-2024: Nanotechnologies - Test methods for measurement of electrical properties of carbon nanotubes ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 07.030;17.220.20
CCSA42
National Standards of People's Republic of China
Nanotechnology Carbon Nanotube Electrical Properties Test Method
Released on 2024-05-28
2024-12-01 implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms, definitions and abbreviations 1
3.1 Terms and Definitions 1
3.2 Abbreviations 1
4 General electrical characteristics 2
4.1 Test Equipment 2
4.2 Detection system 2
4.3 Measurement technology 2
4.4 Reproducibility and reported sample size 5
4.5 Reproducibility of measurements 5
4.6 Application of Low Noise Technology 6
5 Nanotube properties 6
5.1 Overview 6
5.2 Single-walled nanotubes 7
5.3 Multi-walled nanotubes 7
6 Electrode 7
6.1 Overview 7
6.2 Materials 8
6.3 Electrode manufacturing method 8
6.4 Size 8
7 Device Characterization 8
7.1 Architecture Design 8
7.2 Processing and manufacturing methods 8
7.3 Guidelines for characterizing processes 8
8 Measurement Methods and Reports 9
8.1 Reporting requirements 9
8.2 Determination and reporting of conductivity and resistivity 9
8.3 Determination and reporting of carrier mobility and charge carrier density 10
8.4 Determination and Reporting of Nonlinear Behavior 11
8.5 Environmental Conditions Report 11
8.6 Other reportable parameters 12
Reference 13
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
This document is modified to adopt IEC 62624.2009 “Test methods for electrical properties of carbon nanotubes”.
This document has made the following structural adjustments compared to IEC 62624.2009.
--- Chapter 1 corresponds to 1.1 of IEC 62624.2009;
--- Added Chapter 2 normative references;
--- Chapter 3 corresponds to Chapter 2 of IEC 62624.2009;
--- Chapter 4 corresponds to 1.3 of IEC 62624.2009, of which 4.5.3 corresponds to 1.3.5.2 and 1.3.5.3 of IEC 62624.2009;
--- Chapter 5 corresponds to Chapter 3 of IEC 62624.2009;
--- Chapter 6 corresponds to Chapter 4 of IEC 62624.2009;
--- Chapter 7 corresponds to 5.1, 5.2 and 5.3.1 of IEC 62624.2009;
--- Chapter 8 corresponds to 5.3.2 and 5.4 of IEC 62624.2009, and 8.5 corresponds to 5.3.2.5 and 5.4 of IEC 62624.2009;
--- References correspond to Appendix A in IEC 62624.2009.
The technical differences between this document and IEC 62624.2009 and their reasons are as follows.
--- Deleted the "Purpose" in 1.2 of IEC 62624.2009 to comply with the provisions of GB/T 1.1-2020;
--- Change the second sentence of the introduction in 2.1 of IEC 62624.2009 to a note (see 3.1) to comply with GB/T 1.1-2020
Provisions;
--- Changed the definition of "carbon nanotube" (see 3.1.1) to use the latest definition;
--- The terms "excitation end", "excitation voltage", "ground platform", "Kelvin measurement", "multi-walled carbon nanotubes", "measurement end", "single-walled carbon
nanotubes” or “transfer properties”, as these terms are not used or are used only once in this document;
--- The abbreviation "NIST" has been deleted because it is not used in this document;
--- Added the abbreviations "EMI" and "RFI" because these two abbreviations are used in 4.6 of this document (see 3.2);
--- Change "100aA (10-16A)" to "1fA (10-15A)" to conform to the logic of the previous statement (see 4.1);
--- Deleted "National Institute of Standards and Technology (NIST)" to increase operability and improve the applicability of this document (see 4.1);
--- Change “< ” to “≤” to increase operability and improve the applicability of this document (see 4.3.2).
The following editorial changes were made to this document.
--- In order to coordinate with the existing standards, the name of the standard is changed to "Test Method for Electrical Characteristics of Nanotechnology Carbon Nanotubes";
--- Added article titles (see 4.3.1.1, 4.5.1, 5.1 and 6.1);
--- Deleted the informative Appendix B. Appendix B in IEC 62624.2009 is not applicable to this document.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed by the Chinese Academy of Sciences.
This document is under the jurisdiction of the National Nanotechnology Standardization Technical Committee (SAC/TC279).
This document was drafted by. Shenzhen Defang Nanotechnology Co., Ltd., National Center for Nanoscience and Technology, Shenzhen Feimo Technology Co., Ltd.
Shenzhen University, Institute of Microelectronics, Chinese Academy of Sciences, Shenzhen Defang Innovation
Energy Technology Co., Ltd., Foshan Qiaoluan Technology Co., Ltd., Shenzhen Enwan Technology Co., Ltd., and China University of Metrology.
The main drafters of this document are. Kong Lingyong, Wang Yuanhang, Gao Jie, Sun Yan, Huang Shaozhen, Song Zhitang, Zhai Yongbiao, Xia Yang, Chen Xiaogang, Qiu Zhiping,
Jin Qingqing, Pei Xianyinan, Chen Xinyi, Li Xinda, Liu Huanming, Che Xiaodong, Xiao Jian, He Meng, Zhang Shuqin, Zhong Likun.
Introduction
The purpose of this document is to provide recommended methods and reporting requirements for the characterization of electrical properties of carbon nanotubes (CNTs).
If the operation is not done properly, large measurement errors will be introduced. This document describes the common sources of measurement errors, especially in the measurement of electrical properties of carbon nanotubes.
The high impedance test commonly used in the measurement is introduced, and the recommended operation method is given to reduce the impact caused by different measurement methods.
Development of these methods will help to establish a recommended report that can be used from research to manufacturing.
In order to standardize the analytical report data, this document also provides reporting requirements, including descriptions of environmental conditions and sample size, so that researchers can
These reporting requirements also support the reproducibility of results so that new findings can be more effectively confirmed.
This document aims to promote the development of carbon nanotube technology from the laboratory to industry. Standardized characterization methods and reporting requirements provide information
It provides a means for efficiency comparison and lays the foundation for production and manufacturing.
Nanotechnology Carbon Nanotube Electrical Properties Test Method
1 Scope
This document describes the test methods for the electrical properties of carbon nanotubes.
This document is applicable to the measurement of electrical properties of carbon nanotubes prepared by different process routes.
2 Normative references
This document has no normative references.
3 Terms, definitions and abbreviations
3.1 Terms and Definitions
The following terms and definitions apply to this document.
Note. For terms not defined in this clause, refer to IEEE100.
3.1.1
Carbon nanotube
Nanotubes made of carbon atoms.
Note. It is usually composed of a curled carbon monolayer, including single-walled carbon nanotubes, double-walled carbon nanotubes and multi-walled carbon nanotubes.
[Source. GB/T 30544.3-2015, 4.3]
3.1.2
Chirality
The property of a molecule that its structure cannot be superimposed on its mirror image.
3.1.3
Device under test
A sample that is connected to an instrument for evaluating a specific physical property, such as resistance or IV characteristics.
3.1.4
The real or artificial atmospheric conditions immediately surrounding the device under test.
Note. The measurements should be made as close to the device under test as possible and in a manner that minimizes the impact on the test environment.
3.2 Abbreviations
The following abbreviations apply to this document.
AC. alternating current
CNT. Carbon nanotube
DC. Direct current
DUT. Device under test
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