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GB/T 44075-2024: Nanotechnology - Determination of the uniformity of SERS solid substrate - Raman mapping analysis
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Nanotechnology - Determination of the uniformity of SERS solid substrate - Raman mapping analysis
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GB/T 44075-2024
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Basic data | Standard ID | GB/T 44075-2024 (GB/T44075-2024) | | Description (Translated English) | Nanotechnology - Determination of the uniformity of SERS solid substrate - Raman mapping analysis | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | A42 | | Word Count Estimation | 17,181 | | Date of Issue | 2024-05-28 | | Date of Implementation | 2024-12-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 44075-2024: Nanotechnology - Determination of the uniformity of SERS solid substrate - Raman mapping analysis
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 17.040.20
CCSA42
National Standards of People's Republic of China
Nanotechnology Surface Enhanced Raman Solid-State Substrate Uniformity
Measurement Raman imaging analysis
Raman mapping analysis
2024-12-01 implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Methodology Overview 2
5 Instruments and Equipment 2
6 Reagents and Materials 3
7 Testing Process 3
8 Test Report 5
Appendix A (Informative) Example of Raman imaging analysis method for surface enhanced Raman substrate uniformity measurement 6
Reference 11
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed by the Chinese Academy of Sciences.
This document is under the jurisdiction of the National Nanotechnology Standardization Technical Committee (SAC/TC279).
This document was drafted by. Suzhou Nanotech Co., Ltd., Suzhou Institute of Metrology and Testing, Suzhou University, and Suzhou Nanotechnology Co., Ltd. of the Chinese Academy of Sciences
With the Institute of Nano-Bionics, China Institute of Inspection and Quarantine, and Jiangsu Feiwotai Nano-Tech Co., Ltd.
The main drafters of this document are. Guo Qinghua, Zhu Jianrong, Yao Jianlin, Yuan Yaxian, Fang Dan, Jiang Jiang, Xi Guangcheng, Lu Di and Wang Zhen.
Introduction
Advantages. It can provide rich information about the structural characteristics and adsorption state of the sample within the trace concentration range.
It is mainly divided into metal nanosol and SERS solid phase substrate. Based on SERS solid phase substrate, it can be used for food safety, biomedicine and
Application testing is carried out in multiple directions such as public safety.
Establishing a scientific evaluation standard for SERS solid-phase substrates is the key to the application of SERS technology.
It is one of the basic quality indicators, which is used to describe the difference in SERS activity at different locations on the substrate.
The signal difference is large, which can easily lead to signal distortion of the measured sample, affecting the reproducibility and reliability of the test results.
The spectral imaging method is used to detect the uniformity of the SERS solid phase substrate, which is conducive to standardizing and improving the uniformity index of the SERS solid phase substrate, thereby improving
Reproducibility and reliability of SERS detection results.
Nanotechnology Surface Enhanced Raman Solid-State Substrate Uniformity
Measurement Raman imaging analysis
1 Scope
This document describes a method for measuring the uniformity of surface enhanced Raman solid-state substrates using Raman spectroscopy imaging analysis, including a method overview,
Instruments and equipment, reagents and materials, test process and test reports, etc.
This document is applicable to the uniformity measurement of SERS solid substrates.
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 30544.6 Nanotechnology Terminology Part 6.Characterization of Nanoobjects
GB/T 33252 Nanotechnology laser confocal micro-Raman spectrometer performance test
JJF1544 Raman spectrometer calibration specification
3 Terms and definitions
The terms and definitions defined in GB/T 30544.6 and GB/T 33252 and the following apply to this document.
3.1
Raman effect
Inelastic scattering caused by monochromatic light irradiating matter is characterized by a frequency shift of the light caused by elementary excitations such as rotation or vibration.
[Source. GB/T 30544.6-2016, 4.9]
3.2
Raman spectroscopy
A spectroscopic method that uses the Raman effect (3.1) to detect the energy levels of a sample.
[Source. GB/T 30544.6-2016, 4.10]
3.3
A spectroscopic method based on the adsorption of specific metal surfaces with nanometer-scale roughness under the irradiation of light of appropriate wavelength.
The phenomenon of enhanced Raman effect exhibited by certain molecules or nano-objects.
NOTE 1 Typical metals for which varying degrees of enhancement are observed include Au, Ag, Cu and Al.
NOTE 2 For enhancement to occur, the surface roughness is typically in the range of tens of nanometers.
[Source. GB/T 30544.6-2016, 4.11]
3.4
A spectrometer that uses laser as the excitation light source and combines Raman spectroscopy analysis technology with microscopy analysis technology.
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