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Process management for avionics - Atmospheric radiation effects - Part 9: Single event effect fault rate calculation methods and procedures for avionic equipment
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GB/T 41270.9-2022
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Basic data | Standard ID | GB/T 41270.9-2022 (GB/T41270.9-2022) | | Description (Translated English) | Process management for avionics - Atmospheric radiation effects - Part 9: Single event effect fault rate calculation methods and procedures for avionic equipment | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | V25 | | Word Count Estimation | 26,210 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration |
GB/T 41270.9-2022: Process management for avionics - Atmospheric radiation effects - Part 9: Single event effect fault rate calculation methods and procedures for avionic equipment ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Process management for avionics - Atmospheric radiation effects - Part 9.Single event effect fault rate calculation methods and procedures for avionic equipment
ICS 49.020
CCSV25
National Standards of People's Republic of China
Avionics Process Management Atmospheric Radiation Effects
Part 9.Avionics Single Event Effects
Failure rate calculation program and method
Published on 2022-03-09
2022-10-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration
directory
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Abbreviations 1
5 Calculation method 2
5.1 General calculation method 2
5.2 Calculation method of total failure rate 2
5.3 Soft failure rate calculation method 2
5.4 Calculation method of hard failure rate 3
6 Calculation program 4
6.1 Calculation flow chart 4
6.2 Input 5
6.3 Calculation step 5
6.4 Output 6
Appendix A (Informative) Calculation Case 7
Appendix B (Informative) List of Sensitive Devices 11
Appendix C (Informative) Calculation Method of Atmospheric Neutron Radiation Stress 13
Appendix D (Informative) Typical Single Event Effect Cross Section Data 19
Reference 20
foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for Standardization Work Part 1.Structure and Drafting Rules of Standardization Documents"
drafted.
This document is part 9 of GB/T 41270 "Avionics Process Management of Atmospheric Radiation Effects". GB/T 41270 has been released
the following parts.
--- Part 7.Process management of single event effects analysis in avionics product design;
--- Part 9.Avionics equipment single event effect failure rate calculation procedures and methods.
This document is proposed and managed by the National Avionics Process Management Standardization Technical Committee (SAC/TC427).
This document is drafted by. China Aviation Comprehensive Technology Research Institute, Beijing Shengtaoping Experimental Engineering Technology Research Institute Co., Ltd., China
Aviation Industry Corporation Xi'an Aircraft Design Institute.
The main drafters of this document. Wang Qunyong, Shao Wentao, Chen Dongmei, Yang Hui, Bai Hua, Shi Fajian, Yan Shuanhang, Liang Li, Yan Panfeng, Wang Xiaowei.
Introduction
0.1 Goals
This document has been developed for the needs of the analysis and calculation of single event effect failure rates for avionics electronic products.
0.2 Technical overview
Avionics equipment working in the atmosphere, its key devices will produce a variety of single-event effects under the radiation of atmospheric neutrons, which are transmitted to the atmosphere.
Avionics, which can produce single event effect soft and/or hard faults, can affect the safety of the aircraft. Considering that only device-level SEE
Only the failure rate participates in the safety analysis process at the system level and the aircraft level. Therefore, it is necessary to provide equipment-level information in the process of aircraft safety assessment.
The SEE failure rate and its calculation method and program provide basic data for the safety analysis of avionics equipment.
GB/T 34955-2017 "Guidelines for Single Event Effects Tests of Atmospheric Radiation Affecting Avionics Systems" and GB/T 34956-2017
"Guidelines for the Design of Single Event Effect Protection for Avionics Influenced by Atmospheric Radiation" together constitute the design of single event effects for avionics products
Basic technical standards with analysis.
GB/T 41270 specifies methods and procedures for the analysis, testing and evaluation of atmospheric neutron single event effects, and is intended to consist of two parts.
--- Part 7.Process management of single event effects analysis in avionics product design. The purpose is to specify avionics product design
Methods and procedures for single event effect analysis of electronic components.
--- Part 9.Avionics equipment single event effect failure rate calculation procedures and methods. The purpose is to specify the avionics list
Particle effect failure rate general, total failure rate, soft failure rate, hard failure rate calculation method and calculation program.
0.3 Description of relevant patents
The issuing body of this document draws attention to claims that compliance with this document may relate to single event effect failure rates, atmospheric neutron radiation stress,
Use of patents related to device sensitive cross-section and derating factor.
The issuing authority of this document has no position on the authenticity, validity and scope of this patent.
The patent holder has undertaken to the issuing body of this document that he is willing to agree with any applicant, on reasonable and non-discriminatory terms and conditions, to
Negotiate patent licensing. This patent holder's statement is on file with the issuing agency of this document.
The patentees listed in Table 1 hold the patents covered by this document.
Table 1 Information about the patentee holding the patents involved in this document
Patent holder address
Beijing Shengtaoping Experimental Engineering Technology Research Institute Co., Ltd. Room 708, China Weapons Building, No. 69 Zizhuyuan Road, Haidian District, Beijing
Please note that in addition to the patents mentioned above, some content of this document may still involve patents. The issuing agency of this document does not undertake to identify the patent
responsibility.
Avionics Process Management Atmospheric Radiation Effects
Part 9.Avionics Single Event Effects
Failure rate calculation program and method
1 Scope
This document gives the general calculation method of single event effect failure rate of avionics equipment, the calculation method of total failure rate and the calculation method of soft failure rate.
method, hard failure rate calculation method and calculation program.
This document applies to the development, testing and maintenance of avionics equipment working in altitudes below 35km.
2 Normative references
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, dated citations
documents, only the version corresponding to that date applies to this document; for undated references, the latest edition (including all amendments) applies to
this document.
GB/T 34955-2017 Guidelines for Single Event Effects Tests of Atmospheric Radiation Affecting Avionics Systems
GB/T 34956-2017 Design guidelines for single event effect protection of avionics equipment affected by atmospheric radiation
3 Terms and Definitions
The terms and definitions defined in GB/T 34956-2017 and the following terms and definitions apply to this document.
3.1
The neutron fluence rate in the atmospheric radiation environment exposed to avionics during a flight mission.
Note. The unit of atmospheric neutron radiation stress is per square centimeter hour [/(cm2·h)].
3.2
The number of single event effect failures of avionics equipment caused by atmospheric neutron radiation per unit time under the power-on working state.
Note. The unit of single event effect failure rate is times per hour (times/h).
4 Abbreviations
The following abbreviations apply to this document.
ADC. analog-to-digital converter
AD/DA. analog-to-digital/digital-to-analog conversion (analog-to-digital/digital-to-analogconvert)
CCD. charge-coupled device (charge-coupleddevice)
DAC. digital-to-analog converter
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