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GB/T 33929-2017: Test methods of the performance for MEMS high g accelerometer
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 33929-2017 | English | 279 |
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Test methods of the performance for MEMS high g accelerometer
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GB/T 33929-2017
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Basic data | Standard ID | GB/T 33929-2017 (GB/T33929-2017) | | Description (Translated English) | Test methods of the performance for MEMS high g accelerometer | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L55 | | Classification of International Standard | 31.200 | | Word Count Estimation | 14,120 | | Date of Issue | 2017-07-12 | | Date of Implementation | 2018-02-01 | | Quoted Standard | GB/T 2421.1; GB/T 7665; GB/T 26111; JJF 1156 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the terms and definitions of electrical and basic properties of MEMS high g-value accelerometers, test conditions, general regulations, test items and methods. This standard is applicable to the performance test of MEMS high g value accelerometer (hereinafter referred to as acceleration sensor) in the range of 1X10 ^ (4) g ~ 2X10 ^ (5) g. | GB/T 33929-2017: Test methods of the performance for MEMS high g accelerometer---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test methods of the performance for MEMS high g accelerometer
ICS 31.200
L55
National Standards of People's Republic of China
MEMS high g acceleration sensor performance test
method
2017-07-12 Posted
2018-02-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
China National Standardization Administration released
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard by the National Microelectromechanical Technology Standardization Technical Committee (SAC/TC336) and focal point.
This standard was drafted. North Central University, China Machine Productivity Promotion Center.
The main drafters of this standard. Shi Yunbo, Cheng Hongbing, Tang Jun, Li Haibin, Ma Zongmin, Zhu Yue.
MEMS high g acceleration sensor performance test
method
1 Scope
This standard specifies the MEMS g-value acceleration sensor electrical properties and basic properties of the terms and definitions, test conditions, test
General Provisions, Test Items and Methods.
This standard applies to the range of 1 × 104g ~ 2 × 105g MEMS high g-value acceleration sensor (hereinafter referred to as acceleration
Sensor) performance test.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version applies to this article
Pieces. For undated references, the latest edition (including all amendments) applies to this document.
GB/T 2421.1 Electrical and Electronic Products Environmental Testing Overview and Guidelines
GB/T 7665 General Terms for Sensors
GB/T 26111 Microelectromechanical System (MEMS) technology terminology
Vibration impact measurement terms and definitions
3 Terms and definitions
GB/T 7665, GB/T 26111 and JJF1156 define the following terms and definitions apply to this document.
3.1
Hopkinson Rod Hopkinsonrod
An impact device that uses impact waves to propagate in an elongated rod with elastic waves.
4 test conditions
4.1 Environmental conditions
4.1.1 Standard atmospheric conditions
Unless otherwise specified in the detail specification, all tests shall be performed under the standard atmospheric conditions of the test specified in GB/T 2421.1.
4.1.2 Electromagnetic conditions
Except as otherwise provided in the product technical conditions, the test site shall have no other external electromagnetic fields except the earth magnetic field.
4.1.3 Vibration conditions
Unless otherwise specified in the product technical conditions, the test site test station should be no mechanical vibration.
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