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GB/T 28872-2012: Testing method of magnetic lightly-striking mode atomic force microscope for nano-topography of living cells
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 28872-2012 | English | 189 |
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Testing method of magnetic lightly-striking mode atomic force microscope for nano-topography of living cells
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GB/T 28872-2012
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Basic data | Standard ID | GB/T 28872-2012 (GB/T28872-2012) | | Description (Translated English) | Testing method of magnetic lightly-striking mode atomic force microscope for nano-topography of living cells | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | A60 | | Classification of International Standard | 17.180 | | Word Count Estimation | 8,813 | | Quoted Standard | GB/T 21636-2008 | | Regulation (derived from) | National Standards Bulletin 2012 No. 28 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the magnetically driven tapping mode atomic force microscopy of living cells sample techniques and norms. This standard applies to the use of magnetically driven tapping mode atomic force microscopy of living cells morphology and p | GB/T 28872-2012: Testing method of magnetic lightly-striking mode atomic force microscope for nano-topography of living cells
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Testing method of magnetic lightly-striking mode atomic force microscope for nanotopography of living cells
ICS 17.180
A60
National Standards of People's Republic of China
Samples prepared live cell structure of the magnetic actuator tapping mode
Atomic force microscopy detection methods
Issued on. 2012-11-05
2013-02-15 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
Please note that some of the content of this document may involve patents. Release mechanism of the present document does not assume responsibility for the identification of these patents.
This standard was proposed by the Chinese Academy of Sciences.
This standard by the National Standardization Technical Committee of nano technology (SAC/TC279) centralized.
This standard is drafted by. National Center for Nanoscience.
It participated in the drafting of this standard. Institute of Electrical Engineering, Second Military Medical University.
The main drafters of this standard. Han Dong, Han, Sun Quanmei, Chen Peipei, Fengjian Tao, Chen, Yin Bohua, the early Ming Zhang, Lin Yunsheng, Yong Ji.
Samples prepared live cell structure of the magnetic actuator tapping mode
Atomic force microscopy detection methods
1 Scope
This standard specifies the technical specifications and magnetic drive tapping mode atomic force microscopy live cell samples.
This standard applies to the use of magnetically driven tapping mode atomic force microscopy morphology and physical properties of the detection of living cells.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 21636-2008 micro beam analysis electron probe microanalysis (EPMA) term
3 Terms and Definitions
GB/T 21636-2008 define the following terms and definitions apply to this document.
3.1
Live cell samples livingcels
In vitro culture or acute isolated cells.
3.2
Magnetic actuator tapping mode AFM magneticlightly-strikingmodeatomicforcemicroscope
Use the back of an alternating magnetic field driven cantilever probe coated with magnetic film morphology and physical properties of the samples were detected tapping mode atomic force
Micromirrors.
3.3
Magnetic cantilever magneticcantilever
The back of the cantilever coated with magnetic film.
3.4
Amplitude attenuation magnitudeofamplitudedamping
The ratio of the amplitude of the cantilever work and freedom amplitude.
4 Fundamentals
Atomic force microscopy (atomicforcemicroscope, AFM) using extremely sensitive to the weak force with the cantilever tip in the sample
Scan the surface to obtain a product image. During scanning, the interaction force at the top of the tip and the sample surface of the outermost layer of atoms between the atoms
Of the micro cantilever is deformed or changed constantly in motion, so the laser beam reflected by the smooth back of the cantilever onto a photodetector
Position is constantly changing. AFM cantilever is detected by a photodetector state to obtain a sample morphology and forces, etc.
information.
AFM tapping mode magnetic drive is suitable for soft surface, biological samples and other non-destructive imaging, which uses a cross
Varying magnetic field driving the back of the film is coated with a magnetic cantilever probes to a specific amplitude-frequency vibration, while the PZT scanner
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