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GB/T 25074-2025 English PDF

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GB/T 25074-2025: Solar-grade polycrystalline silicon
Status: Valid

GB/T 25074: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
GB/T 25074-2025English149 Add to Cart 3 days [Need to translate] Solar-grade polycrystalline silicon Valid GB/T 25074-2025
GB/T 25074-2017English80 Add to Cart 0--9 seconds. Auto-delivery Solar-grade polycrystalline silicon Valid GB/T 25074-2017
GB/T 25074-2010English239 Add to Cart 2 days [Need to translate] Solar-grade polycrystalline silicon Obsolete GB/T 25074-2010

PDF similar to GB/T 25074-2025


Standard similar to GB/T 25074-2025

GB/T 12963   GB/T 29055   GB/T 31854   GB/T 44334   GB/T 25076   

Basic data

Standard ID GB/T 25074-2025 (GB/T25074-2025)
Description (Translated English) Solar-grade polycrystalline silicon
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard H82
Classification of International Standard 29.045
Word Count Estimation 7,761
Date of Issue 2025-06-30
Date of Implementation 2026-01-01
Older Standard (superseded by this standard) GB/T 25074-2017
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 25074-2025: Solar-grade polycrystalline silicon

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ICS 29.045 CCSH82 National Standard of the People's Republic of China Replaces GB/T 25074-2017 Solar-grade silicon polycrystalline Released on June 30, 2025 Implementation on January 1, 2026 State Administration for Market Regulation The National Standardization Administration issued

Preface

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. This document replaces GB/T 25074-2017 Solar Grade Polysilicon. Compared with GB/T 25074-2017, except for the structural adjustment and In addition to the logical changes, the main technical changes are as follows. a) The scope of application has been changed (see Chapter 1, Chapter 1 of the.2017 edition); b) The technical specifications for donor, acceptor, carbon, base metal, and surface metal have been changed, and the technical requirements for oxygen concentration and minority carrier lifetime have been deleted. (See 5.1, 5.1 of the.2017 edition); c) Deleted the requirements for the mixed ratio of silicon and polycrystalline (see 5.2 of the.2017 edition); d) Added the test methods specified in GB/T 35306 and GB/T 37049, and deleted the sample preparation method specified in GB/T 4060 (See Chapter 6, Chapter 6 of the.2017 edition); e) Changed the relevant requirements for batching (see 7.2, 7.2 of the.2017 edition); f) The inspection items have been changed (see 7.3, 7.3 of the.2017 edition); g) Change “value” to “sampling” (see 7.4, 7.4 of the.2017 edition); h) The judgment of test results has been changed (see 7.5, 7.5 of the.2017 edition); i) Change “quality certificate” to “accompanying documents” (see 8.5, 8.5 of the.2017 edition). Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document was jointly issued by the National Technical Committee on Semiconductor Equipment and Materials Standardization (SAC/TC203) and the National Technical Committee on Semiconductor Equipment and Materials Standardization (SAC/TC203). It is jointly proposed and coordinated by the Materials Technical Committee of the Chemical Engineering Technical Committee (SAC/TC203/SC2). This document was drafted by. Luoyang Zhongsi High-Tech Co., Ltd., Nonferrous Metals Technology and Economic Research Institute Co., Ltd., Sichuan Yongxiang Co., Ltd. Co., Ltd., Xinte Energy Co., Ltd., Asia Silicon (Qinghai) Co., Ltd., Xinjiang Daquan New Energy Co., Ltd., Qinghai Yellow River Upper Reaches Hydropower Development Co., Ltd. New Energy Branch, Xinjiang East Hope New Energy Co., Ltd., Qinghai Nanbo New Energy Technology Co., Ltd. Technology Co., Ltd., Qinghai Lihao Qingneng Co., Ltd., Longi Green Energy Technology Co., Ltd., TCL Zhonghuan New Energy Technology Co., Ltd. Company, Jiangsu Zhongneng Silicon Technology Development Co., Ltd., Zhejiang University Ningbo Institute of Technology, Inner Mongolia Xingyang Technology Co., Ltd. The main drafters of this document are. Wan Ye, He Dongjiang, Yan Dazhou, Ning Xiaoxiao, Zhang Yuanyuan, Li Suqing, Guo Shuhu, Xu Shunbo, Yang Xiaodong, Zong Bing, Li Haojie, Qin Rong, Zhang Ke, Liang Bo, Ran Yi, Deng Hao, Zhang Xuenan, Wang Bin, Hu Dongli, Zhu Yulong, and Tao Gangyi. This document was first published in.2010, revised for the first time in.2017, and this is the second revision. Solar-grade silicon polycrystalline

1 Scope

This document specifies the grades and classifications, technical requirements, test methods, inspection rules, marking, packaging, transportation, storage, etc. of solar-grade silicon polycrystalline. Storage, accompanying documents and order forms, etc. This document applies to solar-grade silicon polycrystals (hereinafter referred to as silicon polycrystals) grown using chlorosilane and silane as raw materials.

2 Normative references

The contents of the following documents constitute the essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. GB/T 1550 Test method for conductivity type of extrinsic semiconductor materials GB/T 1551 Determination of resistivity of silicon single crystals - In-line four-probe method and DC two-probe method GB/T 1553 Determination of minority carrier lifetime in silicon and germanium - Photoconductivity decay method GB/T 1557 Infrared absorption measurement method for interstitial oxygen content in silicon crystals GB/T 1558 Infrared absorption test method for substitutional carbon content in silicon GB/T 4059 Test method for phosphorus in atmosphere zone melting of silicon polycrystalline GB/T 14264 Terminology of Semiconductor Materials GB/T 14844 Semiconductor material designation method GB/T 24574 Photoluminescence test method for III-V group impurities in silicon single crystals GB/T 24581 Determination of Group III and Group V impurities in silicon single crystals - Low temperature Fourier transform infrared spectroscopy GB/T 24582 Determination of metallic impurities on the surface of polycrystalline silicon - Acid leaching-inductively coupled plasma mass spectrometry GB/T 29057 Procedure for evaluating polycrystalline silicon rods by melt zone pulling and spectral analysis GB/T 29849 Inductively coupled plasma mass spectrometry method for determination of surface metal impurities in silicon materials for photovoltaic cells GB/T 31854 Inductively coupled plasma mass spectrometry method for determination of metallic impurities in silicon materials for photovoltaic cells GB/T 35306 Determination of carbon and oxygen content in silicon single crystals - Low temperature Fourier transform infrared spectroscopy GB/T 37049 Determination of base metal impurities in electronic grade polycrystalline silicon - Inductively coupled plasma mass spectrometry

3 Terms and Definitions

The terms and definitions defined in GB/T 14264 apply to this document.

4 Brands and classifications

4.1 Brand The grade of silicon polycrystalline is expressed in accordance with the provisions of GB/T 14844. 4.2 Classification Silicon polycrystalline is divided into block and rod according to its appearance, n-type and p-type according to its conductivity type, and 4 types according to its technical indicators.