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US$369.00 · In stock Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 21194-2007: Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment Status: Valid
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 21194-2007 | English | 369 |
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Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
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GB/T 21194-2007
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PDF similar to GB/T 21194-2007
Basic data | Standard ID | GB/T 21194-2007 (GB/T21194-2007) | | Description (Translated English) | Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | M31 | | Classification of International Standard | 03.120.99 | | Word Count Estimation | 14,175 | | Date of Issue | 2007-11-14 | | Date of Implementation | 2008-05-01 | | Adopted Standard | Telcordia GR-468-CORE-2004, NEQ | | Regulation (derived from) | China Announcement of Newly Approved National Standards No. 12 of 2007 (No. 112 overall) | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the communication equipment optoelectronic devices terminology, definitions, reliability assessment General requirements, test procedures and optoelectronic devices face the evaluation method. This standard applies to communications equipment optoelectronic devices, including laser diodes, light emitting diodes, photodiodes, avalanche photodiodes and their components. Other similar devices can be implemented by reference. |
GB/T 21194-2007: Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Generic reliability assurance requirements for optoelectronic devices used in telecommunications equipment
ICS 03.120.99
M31
National Standards of People's Republic of China
Communications equipment used in optoelectronic devices
General requirements for reliability
Posted 2007-11-14
2008-05-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Table of Contents
Preface Ⅰ
1 Scope 1
2 Normative references 1
3 acronyms, terminology and definitions
3.1 Abbreviations 1
3.2 Terms and Definitions 2
4 reliability assessment - General requirements 2
4.1 Evaluation Objective 2 optoelectronic devices
4.2 Evaluation of the sampling plan 2
5 assessment test procedures and optoelectronic devices 3
5.1 General requirements for test 3
5.2 Optical test parameters 4
5.3 Physical characteristics of test items 5
5.4 Mechanical Integrity Test item 5
5.5 6 accelerated aging test
5.6 Evaluation Method of an optoelectronic device 7
Foreword
The standard reference TelcordiaGR-468-CORE.2004 "communication equipment reliability optoelectronic devices General requirements" in the optoelectronic device
Member evaluation sampling program, photoelectric characteristic parameter tests, physical characteristics of the test, mechanical integrity testing and accelerated aging techniques to maintain a
Cause, different in other aspects and structure of the text.
The standard proposed by the People's Republic of China Ministry of Information Industry.
The standard by the China Communications Standards Association.
This standard was drafted. Wuhan Research Institute of Posts and Telecommunications.
Drafters of this standard. Zhao Xianming, Liu Jian, Luo Biao, Zheng Lin.
Communications equipment used in optoelectronic devices
General requirements for reliability
1 Scope
This standard specifies the general requirements for communications equipment optoelectronic devices terminology, definitions, assessment of reliability, test procedures and optoelectronic devices
Evaluation Method member.
This standard applies to communications equipment optoelectronic devices, including laser diodes, light emitting diodes, photodiodes, avalanche photodiodes
And their components. Other similar devices can be implemented by reference.
2 Normative references
The following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent
Amendments (not including errata content) or revisions do not apply to this standard. However, according to research encourages the parties to the agreement
Study whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard.
GB 8898-2001 Audio, video and similar electronic apparatus - Safety requirements
Production of electrostatic discharge control BelcoreTR-NWT-000870 Communication Equipment
MIL-STD-202G electronic device test method
MIL-STD-883F test methods for microelectronics
TelcordiaGR-63-CORE Network Equipment Building System Requirements. Physical protection
TelcordiaGR-78-CORE physical design communications products and equipment manufacturing and general requirements
TelcordiaGR-326-CORE single-mode fiber and fiber optic connectors generally require jumpers
3 acronyms, terms and definitions
The following abbreviations, terms and definitions apply to this standard.
3.1 Acronyms
ACC AutomaticCurrentControl automatic current control
APD AvalanchePhotodiode avalanche photodiode
Automatic Power Control APC AutomaticPowerControl
C Alowedfailures number of samples allowed to fail
CO CentralOffice central office environment
Activation energy Ea ActivationEnergy
ESD Electro-StaticDischarge electrostatic discharge
FIT FailureInTime per billion device-hours of number of failures
HBM HumanBodyModel mannequin
LTPD LotTolerancePercentDefective Batch allows percent nonconforming
O Objective Target
R Requirement Requirements
SS SampleSize specific LTPD Number of samples
TO TransistorOutline Transistor Outline
UNC Uncontroled uncontrolled environment
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