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GB/T 18735-2014

Chinese Standard: 'GB/T 18735-2014'
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GB/T 18735-2014English219 Add to Cart Days<=3 Microbeam analysis -- General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS) Valid GB/T 18735-2014
GB/T 18735-2014Chinese18 Add to Cart <=1-day [PDF from Chinese Authority, or Standard Committee, or Publishing House]

   

BASIC DATA
Standard ID GB/T 18735-2014 (GB/T18735-2014)
Description (Translated English) Microbeam analysis. General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard G04
Classification of International Standard 71.040.50
Word Count Estimation 11,182
Date of Issue 2014/7/24
Date of Implementation 2015/3/1
Older Standard (superseded by this standard) GB/T 18735-2002
Quoted Standard GB/T 4930-2008; GB/T 21636-2008
Drafting Organization Wuhan University of Technology
Administrative Organization National Standardization Technical Committee microbeam analysis
Regulation (derived from) National Standards Bulletin No. 19, 2014
Proposing organization National Microbeam Analysis Standardization Technical Committee (SAC/TC 38)
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the analysis of electron microscopy (AEM/EDS) that is equipped with a transmission electron microscope or scanning electron microscope equipped with an X-ray attachment spectroscopy (EDS), measuring the scale factor of the nano-thi

GB/T 18735-2014
Microbeam analysis. General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)
ICS 71.040.50
G04
National Standards of People's Republic of China
Replacing GB/T 18735-2002
Microbeam analysis analysis electron microscope (AEM/EDS)
Nano-thin standard general specification
referencematerialsforanalyticaltransmissionelectronmicroscope (AEM/EDS)
Issued on. 2014-07-24
2015-03-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Table of Contents
Preface Ⅰ
Introduction Ⅱ
1 Scope 1
2 Normative references 1
3 Terms and definitions
4 thin standard technical requirements 2
Detection Study Material 3 5
5.1 detection equipment 3
5.2 sample stage 3
5.3 measurement conditions and method 3
5.4 Standard discrimination based on thin 4
6 Standard Classification 4
6.1 Determination of the chemical composition of thin Sample 4
6.2 Thin standard level determined 4
7 Packaging and storage 4
7.1 Standard Package 4
7.2 Transport 4
7.3 safekeeping 5
7.4 Validity of the standard 5
Reference 6
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
This standard replaces GB/T 18735-2002 "Analysis of electron microscopy (AEM/EDS) nano-thin standard universal norms."
This standard compared with GB/T 18735-2002 main changes are as follows.
--- English name changed to. "micro-beam analysis analysis electron microscope (AEM/EDS) nano-thin standard universal norms" and "Microbeam
ananlysis-Generalguideforthespecificationofnanometerthinreferencematerialsforana-
lyticaltransmissionelectronmicroscope (AEM/EDS) ";
--- Modify the contents of the scope of application (see Chapter 1);
--- Update and increase the reference standard (see Chapter 2);
--- Additions and modifications to the terms and definitions, formulas and principles in the following terms be expressed in the comments (see Chapter 3);
--- The "standard" to "thin standard" (see Chapter 4, Chapter 5);
--- Chemical modification of the thin standard value and the number of thin standard requirements (see 4.1, 4.2);
--- Increased computing illustration description and comments on the standard thin thickness requirements (see 4.3);
--- Increased explanatory comment on thin standard stability requirements (see 4.4);
--- The "carbon support network" to "ultra-thin carbon support network" (see 4.5);
--- Added "instrumentation" and "sample stage" sub-title (see 5.1, 5.2);
--- The "sample" to "research material" (see 5.1,5.2,5.3.4);
--- Adds several commonly used typical operating voltage value analysis (see 5.3.1);
--- Modify the sample and measuring the number of elements in X-ray intensity measured statistical measurement requirements (see 5.3.3,5.3.5 and 5.3.8);
--- Increasing the scale factor when measuring the reference element explanatory note (see 5.3.6);
--- Modifications and additions expanded uncertainty and uncertainty scale factor KA-B and the corresponding comments (see 5.3.8 and 5.3.9);
--- Revised standard thin discriminating basis (see 5.4);
--- Increasing the standard classification (see Chapter 6);
--- Contribute to increased understanding of the standards required by reference.
The standard micro-beam analysis by the National Standardization Technical Committee (SAC/TC38) and focal points.
This standard was drafted. Wuhan University of Technology.
The main drafters of this standard. Sun Zhenya.
This standard was first released in December 2002, this is the first revision.
introduction
The criteria specified in this standard, mainly for electron microscope analysis, X-ray spectrometer that is equipped with a transmission electron microscope attachment
(AEM/EDS) method that is based on the ratio of Cliff-Lorimer method, can ignore the effect of X-ray absorbing substrate samples were inorganic thin samples
When quantitative elemental analysis, measurement scale factor KA-B nano-thin general principles common specification and test method standard samples required. To further
Develop quantitative analysis of standard AEM foundation.
The standards for the conduct quantitative elemental particles and micro electron microscope analysis of the sample analyzed, in particular to adapt to the rapid development of nano-materials
Component quantitative analysis and high acceleration voltage transmission electron microscope analysis of the development, the establishment of quantitative analysis method based on the comparison of standard samples, quantitative increase
Analytical accuracy has a positive role in guiding.
Microbeam analysis analysis electron microscope (AEM/EDS)
Nano-thin standard general specification
1 Scope
This standard specifies the analysis of electron microscopy (AEM/EDS) that is equipped with a transmission electron microscope or scanning electron microscope equipped with X-ray energy attachments
Spectroscopy (EDS), measuring the scale factor KA-B nano-thin standard technical requirements, test conditions and measurement methods.
This standard applies to the use of electron microscopy analysis (AEM/EDS) micro-area element of the inorganic thin samples of quantitative analysis. This standard does not include
Machines and biological standards.
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 4930-2008 micro-beam electron microprobe analysis standard sample analysis the technical conditions Guidelines (ISO 14595.2003, IDT)
GB/T 21636-2008 micro beam analysis electron probe microanalysis (EPMA) Terminology (ISO 23833.2006, IDT)
3 Terms and Definitions
GB/T 21636-2008 define the following terms and definitions apply to this document.
3.1
Analysis of electron microscopy analyticaltransmissionelectronmicroscope
Means is equipped with X-ray energy dispersive spectroscopy (EDS) transmission electron microscope or a transmission electron microscope equipped with a scanning attachment can be performed simultaneously on Micro
Elemental analysis.
3.2
Critical thickness criticalthickness
TS
Under certain acceleration voltage absorption effect of the X-ray region of the sample analysis can be ignored and do not need the maximum absorption correction when
thickness.
Note. TS available critical thickness formula (1).
TS = 1 (5ρ | μB-μA | cscα) (1)
Where.
ρ --- density of the sample;
ΜA --- A characteristic element of the X-rays in the sample mass absorption coefficient;
Characterized μB --- element B X-rays in the sample mass absorption coefficient;
α --- X-ray spectrometer associated X-ray detection angle.
3.3
Scaling factor ratiofactor
KA-B
At a certain voltage, the known composition and thickness less than or equal to the critical thickness of thin samples, from the same micro-elements measured simultaneously
Related standard: GB/T 38531-2020    GB/T 38532-2020
Related PDF sample: GB/Z 20288-2006    GB/T 16483-2008